Closedform And Explicit Analytical Model For Crosstalk In Cmos Photodiodes

• doi: 10.1109/TED.2013.2276748
• title: Closed-Form and Explicit Analytical Model for Crosstalk in CMOS Photodiodes
• publisher: IEEE
• isbn:
• issn: 1557-9646
• rank: 1941
• access_type: LOCKED
• content_type: Journals
• abstract: A closed-form and explicit 2-D analytical model for crosstalk(CTK) effects in p-n+ CMOS photodiodes for pixel design optimization has been developed in this paper. This model complements and extends a previous development describing the photocurrent because of the active area illumination along with the lateral depletion region and lateral components owing to the diffused photocarriers from the surroundings of the junction. The model has very few fitting parameters because it is physically based. Similarly, it can be of great use for CMOS image sensors designers, especially to fulfill high resolution and small area requirements by pixel size reduction. The model was validated extensively through device simulations with ATLAS and experimental data, and describes the CTK dependencies on light conditions and physical, geometrical, and process parameters.
• article_number: 6583327
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6583327
• html_url: https://ieeexplore.ieee.org/document/6583327/
• abstract_url: https://ieeexplore.ieee.org/document/6583327/
• publication_title: IEEE Transactions on Electron Devices
• conference_location:
• conference_dates:
• publication_number: 16
• is_number: 6605590
• publication_year: 2013
• publication_date: Oct. 2013
• start_page: 3459
• end_page: 3464
• citing_paper_count: 8
• citing_patent_count: 0
• download_count: 348
• insert_date: 20130821
• index_terms:
  • ieee_terms:
    • Lighting
    • Analytical models
    • Fabrication
    • Semiconductor device modeling
    • Junctions
    • Arrays
    • Photoconductivity
  • author_terms:
    • Crosstalk(CTK)
    • modeling
    • photodiodes(PDs)
    • simulation
  • dynamic_index_terms:
    • Process Parameters
    • Fitting Parameters
    • Photocurrent
    • Image Sensor
    • Camera Sensor
    • Depletion Region
    • Space Charge Region
    • Depletion Layer
    • Depletion Zone
    • Device Simulation
    • Lateral Component
    • Objective Lens
    • Objective Lenses
    • Microscope Objective
    • Fabrication Process
    • Standard Process
    • Top Surface
    • Sidewall
    • Side Walls
    • Boundary Region
    • Printed Circuit Board
    • Optical Components
    • Edge Region
    • Linear Differential Equations
    • Linear Ordinary Differential Equations
    • Diagonal Direction
    • Uniform Illumination
    • Center Of The Array
• authors:
  • Author Name: Beatriz Blanco-Filgueira
    Affiliation: Centro de Investigaci ón en Tecnologías de la Información, University of Santiago de Compostela, Santiago de Compostela, Spain
    Author URL: https://ieeexplore.ieee.org/author/38276622300
    ID: 38276622300
    Order: 1
    Author Affiliations:
    • Centro de Investigaci ón en Tecnologías de la Información, University of Santiago de Compostela, Santiago de Compostela, Spain
  • Author Name: Paula López
    Affiliation: Centro de Investigaci ón en Tecnologías de la Información, University of Santiago de Compostela, Santiago de Compostela, Spain
    Author URL: https://ieeexplore.ieee.org/author/37300632800
    ID: 37300632800
    Order: 2
    Author Affiliations:
    • Centro de Investigaci ón en Tecnologías de la Información, University of Santiago de Compostela, Santiago de Compostela, Spain
  • Author Name: Juan Bautista Roldán
    Affiliation: Department of Electronics and Computer Technology, University of Granada, Granada, Spain
    Author URL: https://ieeexplore.ieee.org/author/37268186700
    ID: 37268186700
    Order: 3
    Author Affiliations:
    • Department of Electronics and Computer Technology, University of Granada, Granada, Spain

Image Sensor

• sensor_type: CMOS
• resolution: not specified
• dynamic_range: not specified
• pixel_size: not specified
• dark_current: not specified

Optical Data

• focal_length: not specified
• aperture: not specified
• field_of_view: not specified
• distortion: not specified

Performance Metrics

Applications & Benefits

• cell_imaging: enabling digital imaging in various applications including smartphones, medical devices, and automotive systems
• benefits: not specified

Supporting Organizations

• supported_by: Spanish Government, Xunta de Galicia, Junta de Andalucía, AE CITIUS

Manuscript Details

• publication_date: Oct. 2013

Relevancy Score

• score: 10
• missing_fields:
  • resolution
  • dynamic_range
  • pixel_size
  • dark_current
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed
  • power_consumption
  • noise

Processed JSON Filename

request_35f25ad6-33cd-42f7-92db-1f7a1fec97ad-closedform_and_explicit_analytical_model_for_crosstalk_in_cmos_photodiodes.json