Characterization Of Quanta Image Sensor Pumpgate Jots With Deep Subelectron Read Noise

• doi: 10.1109/JEDS.2015.2480767
• title: Characterization of Quanta Image Sensor Pump-Gate Jots With Deep Sub-Electron Read Noise
• publisher: IEEE
• isbn:
• issn: 2168-6734
• rank: 1920
• access_type: OPEN_ACCESS
• content_type: Journals
• abstract: Characterization of quanta image sensor pixels with deep sub-electron read noise is reported. Pixels with conversion gain of $423\mu \text{V}$ /e- and read noise as low as 0.22e- r.m.s. were measured. Dark current is 0.1e-/s at room temperature, and lag less than 0.1e-. This is one of the first works reporting detailed characterization of image sensor pixels with mean signals from sub-electron (0.25e-) to a few electrons level. Such pixels in a nearly-conventional CMOS image sensor process will allow realization of photon-counting image sensors for a variety of applications.
• article_number: 7273747
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7273747
• html_url: https://ieeexplore.ieee.org/document/7273747/
• abstract_url: https://ieeexplore.ieee.org/document/7273747/
• publication_title: IEEE Journal of the Electron Devices Society
• conference_location:
• conference_dates:
• publication_number: 6245494
• is_number: 7305857
• publication_year: 2015
• publication_date: Nov. 2015
• start_page: 472
• end_page: 480
• citing_paper_count: 51
• citing_patent_count: 0
• download_count: 2937
• insert_date: 20150922
• index_terms:
  • ieee_terms:
    • Noise
    • CMOS image sensors
    • Bit error rate
    • Histograms
    • Dark current
  • author_terms:
    • CMOS Image Sensor
    • Quanta Image Sensor
    • Jot Device
    • Photon Counting
    • High Conversion Gain
    • Low Read Noise
    • Low Dark Current
    • CMOS image sensor
    • quanta image sensor
    • jot device
    • photon counting
    • high conversion gain
    • low read noise
    • low dark current
  • dynamic_index_terms:
    • Image Sensor
    • Camera Sensor
    • Quanta Image Sensor
    • Mean Signal
    • Dark Current
    • Conversion Gain
    • Deep Reading
    • Histogram
    • Current Source
    • Current Regulations
    • Quantum Efficiency
    • Low Noise
    • Bit Error Rate
    • Bit Error Ratio
    • Residual Signal
    • Voltage Levels
    • Bit Error
    • Bias Current
    • Fluctuations In The Number
    • Gain Variation
    • Gate Capacitance
    • Dark Signal
    • Test Chip
    • Single-photon Avalanche Diode
    • Readout Electronics
    • Total Error Rate
    • Low Dark Current
• authors:
  • Author Name: Jiaju Ma
    Affiliation: Thayer School of Engineering, Dartmouth College, Hanover, NH, USA
    Author URL: https://ieeexplore.ieee.org/author/37085509302
    ID: 37085509302
    Order: 1
    Author Affiliations:
    • Thayer School of Engineering, Dartmouth College, Hanover, NH, USA
  • Author Name: Dakota Starkey
    Affiliation: Thayer School of Engineering, Dartmouth College, Hanover, NH, USA
    Author URL: https://ieeexplore.ieee.org/author/37085647669
    ID: 37085647669
    Order: 2
    Author Affiliations:
    • Thayer School of Engineering, Dartmouth College, Hanover, NH, USA
  • Author Name: Arun Rao
    Affiliation: Thayer School of Engineering, Dartmouth College, Hanover, NH, USA
    Author URL: https://ieeexplore.ieee.org/author/37085638158
    ID: 37085638158
    Order: 3
    Author Affiliations:
    • Thayer School of Engineering, Dartmouth College, Hanover, NH, USA
  • Author Name: Kofi Odame
    Affiliation: Thayer School of Engineering, Dartmouth College, Hanover, NH, USA
    Author URL: https://ieeexplore.ieee.org/author/37078955600
    ID: 37078955600
    Order: 4
    Author Affiliations:
    • Thayer School of Engineering, Dartmouth College, Hanover, NH, USA
  • Author Name: Eric R. Fossum
    Affiliation: Thayer School of Engineering, Dartmouth College, Hanover, NH, USA
    Author URL: https://ieeexplore.ieee.org/author/37326789400
    ID: 37326789400
    Order: 5
    Author Affiliations:
    • Thayer School of Engineering, Dartmouth College, Hanover, NH, USA

Image Sensor

• sensor_type: CMOS
• resolution: largely not specified but uses small pixels, with a pixel pitch of 1.4 µm mentioned.
• dynamic_range: not explicitly mentioned
• pixel_size: 1.4 µm
• dark_current: 0.1e-/s at room temperature, increased to 1.29e-/s or 10.5pA/cm² at 60°C for PG jots.

Optical Data

• focal_length: not available
• aperture: not available
• field_of_view: not available
• distortion: not available

Performance Metrics

• signal_to_noise_ratio: 0.22e- RMS
• noise: ranges from 0.22e- to 0.50e- RMS.

Applications & Benefits

• cell_imaging: Applications in low light imaging, scientific imaging, high dynamic range applications, potentially consumer photography, and replacement of electron-multiplying CCDs.
• benefits: Enables photon-counting imaging due to low read noise, enhances resolution and performance.

Supporting Organizations

• supported_by: Rambus Inc.

Manuscript Details

• publication_date: Nov. 2015

Relevancy Score

• score: 9
• missing_fields:
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • sensitivity
  • shutter_speed
  • power_consumption

Processed JSON Filename

request_21686df4-4ce5-49f7-b5f1-653d28400621-characterization_of_quanta_image_sensor_pumpgate_jots_with_deep_subelectron_read_noise.json