Challenges In Cmos Imager Design

• doi: 10.1109/ICECS.2004.1399661
• title: Challenges in CMOS imager design
• publisher: IEEE
• isbn: 0-7803-8715-5
• issn:
• partnum: 04EX941
• rank: 1904
• access_type: LOCKED
• content_type: Conferences
• abstract: Summary form only given. In the last decade, active pixel sensors (APS), which are fabricated in a commonly used CMOS process, enabled the design of image sensors with integrated "intelligence". Current state of the art CMOS imagers allow integration of all functions required for timing, exposure control, color processing, image enhancement, image compression and ADC on the same die. Moreover, systems with wide dynamic range, motion detection and non-standard readout can be designed. CMOS imagers also offer significant advantages in terms of low-power, low-voltage and monolithic integration, rivaling traditional charge coupled devices (CCD). This paper covers state of the art CMOS imager systems and design challenges with the advanced CMOS technologies available. Specifically, ways to improve power consumption in such "smart" sensors, required to cope with the current demand for portable systems are reviewed. In addition, pixel optimization is revisited as more advanced processes are used and pixel pitch is reduced.
• article_number: 1399661
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1399661
• html_url: https://ieeexplore.ieee.org/document/1399661/
• abstract_url: https://ieeexplore.ieee.org/document/1399661/
• publication_title: Proceedings of the 2004 11th IEEE International Conference on Electronics, Circuits and Systems, 2004. ICECS 2004.
• conference_location: Tel Aviv, Israel
• conference_dates: 15-15 Dec. 2004
• publication_number: 9627
• is_number: 30421
• publication_year: 2004
• publication_date: 15-15 Dec. 2004
• start_page: 240
• end_page:
• citing_paper_count: 0
• citing_patent_count: 0
• download_count: 461
• insert_date: 20050314
• index_terms:
  • ieee_terms:
    • CMOS image sensors
    • Intelligent sensors
    • CMOS process
    • CMOS technology
    • Pixel
    • Process design
    • Image sensors
    • Timing
    • Process control
    • Color
  • dynamic_index_terms:
    • CCD Camera
    • Charge-coupled Device
    • Advanced Processes
    • Promotion Process
    • Motion Detection
    • Motion Sensors
    • Image Enhancement
    • Sensor Design
    • Image Compression
    • CMOS Process
    • Smart Sensors
    • Pixel Pitch
    • Color Processing
    • Sensor Pixel
    • Art Design
• isbn_formats:
  • format: Print ISBN, value: 0-7803-8715-5, isbnType: Historical
• authors:
  • Author Name: O. Yadid-Pecht
    Affiliation: University of Calgary, AB, Canada
    Author URL: https://ieeexplore.ieee.org/author/38298354100
    ID: 38298354100
    Order: 1
    Author Affiliations:
    • University of Calgary, AB, Canada
    • VLSI System Center, Ben-Gurion University of the Negev, Beersheba, Israel

Image Sensor

• sensor_type: CMOS
• resolution: not specified
• dynamic_range: not specified
• pixel_size: not specified
• dark_current: not specified

Optical Data

• focal_length: not specified
• aperture: not specified
• field_of_view: not specified
• distortion: not specified

Performance Metrics

Applications & Benefits

• cell_imaging: not specified
• benefits: not specified

Supporting Organizations

• supported_by: not specified

Manuscript Details

• publication_date: 15-15 Dec. 2004

Relevancy Score

• score: 9
• missing_fields:
  • resolution
  • dynamic_range
  • pixel_size
  • dark_current
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed
  • power_consumption
  • noise
  • cell_imaging
  • benefits
  • supported_by

Processed JSON Filename

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