Capacitivesensing Circuit Technique For Image Quality Improvement On Fingerprint Sensor Lsis

• doi: 10.1109/JSSC.2010.2042525
• title: Capacitive-Sensing Circuit Technique for Image Quality Improvement on Fingerprint Sensor LSIs
• publisher: IEEE
• isbn:
• issn: 1558-173X
• rank: 1897
• access_type: LOCKED
• content_type: Journals
• abstract: This paper describes a new capacitive-sensing circuit technique that improves the quality of images captured with capacitive fingerprint sensor LSIs. The quality of the captured image depends on the surface condition of the finger. When the finger is dry, the electrical resistance of the finger surface is high. The finger surface resistance induces a voltage drop in the electrical potential of the finger surface (which should be grounded), which leads to poor image quality. To capture clear images even when the finger is dry, the circuit technique improves the image quality using the series resistance caused at the finger surface. The potential of the finger surface is controlled by an enhancement plate and a voltage control circuit. A test chip implementing this technique was fabricated on a 0.5 ¿m CMOS process and a sensor process. The chip captures a clear fingerprint image of a dry finger, confirming the effectiveness of the circuit technique for capturing clear fingerprint images independent of the finger surface condition with the capacitive fingerprint sensor LSIs.
• article_number: 5453303
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5453303
• html_url: https://ieeexplore.ieee.org/document/5453303/
• abstract_url: https://ieeexplore.ieee.org/document/5453303/
• publication_title: IEEE Journal of Solid-State Circuits
• conference_location:
• conference_dates:
• publication_number: 4
• is_number: 5453291
• publication_year: 2010
• publication_date: May 2010
• start_page: 1080
• end_page: 1087
• citing_paper_count: 34
• citing_patent_count: 2
• download_count: 2142
• insert_date: 20100422
• index_terms:
  • ieee_terms:
    • Circuits
    • Image quality
    • Fingerprint recognition
    • Capacitive sensors
    • Image sensors
    • Fingers
    • Surface resistance
    • Electric resistance
    • Voltage control
    • Image matching
  • author_terms:
    • Fingerprint sensor LSI
    • capacitive-sensing
    • image quality
    • dry finger
    • surface resistance
  • dynamic_index_terms:
    • Image Quality
    • Improve Image Quality
    • Capacitive Sensor
    • Circuit Techniques
    • Fingerprint Sensors
    • Surface Potential
    • Surface States
    • Surface Conditions
    • Voltage Drop
    • Potential Drop
    • IR Drop
    • Series Resistance
    • Clear Image
    • Sheet Resistance
    • Surface Resistance
    • Image Capture
    • CMOS Process
    • Test Chip
    • Waveform
    • Grayscale
    • Greyscale
    • Gray Level
    • Effective Technique
    • Current Source
    • Current Regulations
    • Equivalent Circuit
    • Biometric
    • Time-to-digital Converter
    • Plate Area
    • Sense Amplifier
    • Parasitic Capacitance
    • Sensor Surface
    • Outer Skin
    • Effective Capacity
    • Effective Capacitance
    • Inverter
    • Thumbprint
    • Fingerprint Identification
    • Supply Voltage
• authors:
  • Author Name: Toshishige Shimamura
    Affiliation: NTT Microsystem Integration Laboratories, Atsugi, Kanagawa, Japan
    Author URL: https://ieeexplore.ieee.org/author/37287888200
    ID: 37287888200
    Order: 1
    Author Affiliations:
    • NTT Microsystem Integration Laboratories, Atsugi, Kanagawa, Japan
  • Author Name: Hiroki Morimura
    Affiliation: NTT Microsystem Integration Laboratories, Atsugi, Kanagawa, Japan
    Author URL: https://ieeexplore.ieee.org/author/37265815200
    ID: 37265815200
    Order: 2
    Author Affiliations:
    • NTT Microsystem Integration Laboratories, Atsugi, Kanagawa, Japan
  • Author Name: Satoshi Shigematsu
    Affiliation: NTT Microsystem Integration Laboratories, Atsugi, Kanagawa, Japan
    Author URL: https://ieeexplore.ieee.org/author/37265813400
    ID: 37265813400
    Order: 3
    Author Affiliations:
    • NTT Microsystem Integration Laboratories, Atsugi, Kanagawa, Japan
  • Author Name: Mamoru Nakanishi
    Affiliation: NTT Microsystem Integration Laboratories, Atsugi, Kanagawa, Japan
    Author URL: https://ieeexplore.ieee.org/author/37286009600
    ID: 37286009600
    Order: 4
    Author Affiliations:
    • NTT Microsystem Integration Laboratories, Atsugi, Kanagawa, Japan
  • Author Name: Katsuyuki Machida
    Affiliation: NTT Advanced Technology Corporation, Atsugi, Kanagawa, Japan
    Author URL: https://ieeexplore.ieee.org/author/37265816000
    ID: 37265816000
    Order: 5
    Author Affiliations:
    • NTT Advanced Technology Corporation, Atsugi, Kanagawa, Japan

Image Sensor

• sensor_type: CMOS
• resolution: not specified
• dynamic_range: not specified
• pixel_size: 50 µm
• dark_current: not specified

Optical Data

• focal_length: not specified
• aperture: not specified
• field_of_view: not specified
• distortion: not specified

Performance Metrics

• power_consumption: 25 mW

Applications & Benefits

• cell_imaging: used in biometrics for fingerprint identification and other authentication systems
• benefits: improves image quality under varied finger surface conditions, especially for dry fingers

Supporting Organizations

• supported_by: NTT Microsystem Integration Laboratories, NTT Advanced Technology Corporation

Manuscript Details

• publication_date: May 2010

Relevancy Score

• score: 8
• missing_fields:
  • dynamic_range
  • quantum_efficiency
  • readout_speed
  • noise_sources
  • analog-to-digital_conversion_techniques
  • fill_factor

Processed JSON Filename

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