Calibration Of Imaging Sensor And Fiber Optic Tapercaused Distortion In An Xray Intensified Cmos Camera

• doi: 10.1109/ACCESS.2019.2960259
• title: Calibration of Imaging Sensor and Fiber Optic Taper-Caused Distortion in an X-Ray Intensified CMOS Camera
• publisher: IEEE
• isbn:
• issn: 2169-3536
• rank: 1887
• access_type: CCBY - IEEE is not the copyright holder of this material. Please follow the instructions via https://creativecommons.org/licenses/by/4.0/ to obtain full-text articles and stipulations in the API documentation.
• content_type: Journals
• abstract: An integrated calibration method of the imaging sensor and the fiber optic taper-caused distortion in an intensified Complementary Metal-Oxide-Semiconductor (CMOS) camera for the X-ray capture application is proposed. Generally, four kinds of distortions need to be corrected in this system: the column noise, the inconsistent pixel intensity response of whole frame, the nonlinear intensity response of each pixel, and the geometry distortion of whole frame. To conquer these problems, first, the column noise is estimated and subtracted from the captured image. The multiple measurement data processing method and the strip noise estimation technique are used. Second, a kind of two-step correction technique of the pixel intensity response is proposed to solve middle two distortion problems. The first step builds the ideal intensity response line for all pixels in image; and the second step estimates and compensates the correction error for each pixel by a polynomial function. Third a polynomial fitting method is also utilized to correct the geometry distortion. The RANdom SAmple Consensus (RANSC) computation mechanism is used to improve the calibration precision further. The optic indices of fiber optic taper and camera are considered to assist the selection of key parameters of these calibration method above. Many experiment results have proved the correctness and effectiveness of proposed method.
• article_number: 8935227
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8935227
• html_url: https://ieeexplore.ieee.org/document/8935227/
• abstract_url: https://ieeexplore.ieee.org/document/8935227/
• publication_title: IEEE Access
• conference_location:
• conference_dates:
• publication_number: 6287639
• is_number: 8600701
• publication_year: 2019
• publication_date: 2019
• start_page: 185393
• end_page: 185407
• citing_paper_count: 5
• citing_patent_count: 0
• download_count: 722
• insert_date: 20191217
• index_terms:
  • ieee_terms:
    • Optical distortion
    • Optical fibers
    • Optical imaging
    • Optical fiber sensors
    • Calibration
  • author_terms:
    • Distortion correction
    • X-ray image sensor
    • CMOS
    • fiber optic taper
    • RANSAC
  • dynamic_index_terms:
    • Optical Fiber
    • Fiber-optic
    • Optical Fibre
    • Image Sensor
    • Camera Sensor
    • Results Of Experiments
    • Image Pixels
    • Pixel Intensity
    • Intensity Of Response
    • Polynomial Regression
    • Polynomial Fitting
    • Nonlinear Response
    • Calibration Method
    • Calibration Methods
    • Precise Calibration
    • Calibration Precision
    • Pixel Error
    • Error Of Each Pixel
    • Distortion Problem
    • Distortion Of Geometry
    • Exposure Time
    • Final Results
    • Manufacturing Process
    • Series Of Images
    • Serial Imaging
    • Evaluation Index
    • Evaluation Indices
    • Index Rate
    • Linear Response
    • Kinds Of Components
    • Ideal Point
    • Image Capture
    • Output Response
    • Inliers
    • Correct Results
    • Correct Outcome
    • Error Compensation
    • Dark-field
    • Dark-field Microscopy
    • Calibration Technique
    • Stochastic Noise
• authors:
  • Author Name: Haoting Liu
    Affiliation: Beijing Engineering Research Center of Industrial Spectrum Imaging, School of Automation and Electrical Engineering, University of Science and Technology Beijing, Beijing, China
    Author URL: https://ieeexplore.ieee.org/author/37086801745
    ID: 37086801745
    Order: 1
    Author Affiliations:
    • Beijing Engineering Research Center of Industrial Spectrum Imaging, School of Automation and Electrical Engineering, University of Science and Technology Beijing, Beijing, China
  • Author Name: Shaohua Yang
    Affiliation: Northwest Institute of Nuclear Technology, Xi’an, China
    Author URL: https://ieeexplore.ieee.org/author/37898679000
    ID: 37898679000
    Order: 2
    Author Affiliations:
    • Northwest Institute of Nuclear Technology, Xi’an, China
  • Author Name: Chang Guo
    Affiliation: Beijing Engineering Research Center of Industrial Spectrum Imaging, School of Automation and Electrical Engineering, University of Science and Technology Beijing, Beijing, China
    Author URL: https://ieeexplore.ieee.org/author/37086864116
    ID: 37086864116
    Order: 3
    Author Affiliations:
    • Beijing Engineering Research Center of Industrial Spectrum Imaging, School of Automation and Electrical Engineering, University of Science and Technology Beijing, Beijing, China
  • Author Name: Jiacheng Li
    Affiliation: Beijing Engineering Research Center of Industrial Spectrum Imaging, School of Automation and Electrical Engineering, University of Science and Technology Beijing, Beijing, China
    Author URL: https://ieeexplore.ieee.org/author/37087227658
    ID: 37087227658
    Order: 4
    Author Affiliations:
    • Beijing Engineering Research Center of Industrial Spectrum Imaging, School of Automation and Electrical Engineering, University of Science and Technology Beijing, Beijing, China
  • Author Name: Ming Yan
    Affiliation: Northwest Institute of Nuclear Technology, Xi’an, China
    Author URL: https://ieeexplore.ieee.org/author/37086960055
    ID: 37086960055
    Order: 5
    Author Affiliations:
    • Northwest Institute of Nuclear Technology, Xi’an, China
  • Author Name: Jinhui Lan
    Affiliation: Beijing Engineering Research Center of Industrial Spectrum Imaging, School of Automation and Electrical Engineering, University of Science and Technology Beijing, Beijing, China
    Author URL: https://ieeexplore.ieee.org/author/37267228800
    ID: 37267228800
    Order: 6
    Author Affiliations:
    • Beijing Engineering Research Center of Industrial Spectrum Imaging, School of Automation and Electrical Engineering, University of Science and Technology Beijing, Beijing, China

Image Sensor

• sensor_type: CMOS
• resolution: 1280x1024
• dynamic_range: 4096
• pixel_size: unknown
• dark_current: unknown

Optical Data

• focal_length: unknown
• aperture: unknown
• field_of_view: unknown
• distortion: unknown

Performance Metrics

• frame_rate: unknown
• signal_to_noise_ratio: unknown
• sensitivity: unknown
• shutter_speed: unknown
• power_consumption: unknown
• noise: unknown

Applications & Benefits

• cell_imaging: Enabled digital imaging in application areas such as medical devices.
• benefits: High performance in designing and manufacturing processes.

Supporting Organizations

• supported_by: State Key Laboratory of Intense Pulsed Radiation Simulation and Effect, National Natural Science Foundation of China, University of Science and Technology Beijing

Manuscript Details

• publication_date: 2019

Relevancy Score

• score: 9
• missing_fields:
  • pixel size
  • fill factor
  • quantum efficiency
  • readout speed
  • analog-to-digital conversion techniques

Processed JSON Filename

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