Backsideillumination 14Mpixel Qvga Timeofflight Cmos Imager

• doi: 10.1109/NEWCAS.2012.6329022
• title: Backside-illumination 14µm-pixel QVGA time-of-flight CMOS imager
• publisher: IEEE
• isbn: 978-1-4673-0858-8
• issn:
• partnum: 12EX6116
• rank: 1707
• access_type: LOCKED
• content_type: Conferences
• abstract: This paper presents a BSI(backside-illumination) 14µm-pixel QVGA CMOS image sensor SOC(System On a Chip) measuring TOF(Time-Of-Flight) by 20MHz-intensity modulation of 850nm-wavelength light. The 34% of overall QE(Quantum Efficiency) at 850nm-wavelength is acquired by BSI structure and optimized micro-lens. The DE(Depth Error) less than 1.5% within 6m is achieved with imaging lens of f/1.2 and LED array of which the optical intensity is 0.6W/m2 at 1m-distance. Additionally, the depth linearity is measured as that the coefficient of determination is equal to 0.9999. In order to operate under background light illumination on a scene, dual CG(Conversion Gain) scheme is implemented in each pixel.
• article_number: 6329022
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6329022
• html_url: https://ieeexplore.ieee.org/document/6329022/
• abstract_url: https://ieeexplore.ieee.org/document/6329022/
• publication_title: 10th IEEE International NEWCAS Conference
• conference_location: Montreal, QC, Canada
• conference_dates: 17-20 June 2012
• publication_number: 6324002
• is_number: 6328940
• publication_year: 2012
• publication_date: 17-20 June 2012
• start_page: 325
• end_page: 328
• citing_paper_count: 4
• citing_patent_count: 0
• download_count: 584
• insert_date: 20121011
• index_terms:
  • ieee_terms:
    • Optical imaging
    • Optical sensors
    • Optical reflection
    • Semiconductor device measurement
    • Demodulation
    • Optical modulation
    • Optical transmitters
  • dynamic_index_terms:
    • Quantum Efficiency
    • Image Sensor
    • Camera Sensor
    • Background Light
    • System-on-chip
    • Imaging Lens
    • Imaging Lenses
    • Microlenses
    • Micro Lens
    • LED Array
    • Conversion Gain
    • Depth Error
    • Spatial Resolution
    • Light Source
    • Phase Difference
    • Light Detection And Ranging
    • Lidar
    • Optical Power
    • Lens Power
    • Refractive Power
    • Optical Signal
    • Depth Images
    • Intensity Modulation
    • Mode Volume
    • Shot Noise
    • Poisson Noise
    • Phase-locked Loop
    • Transverse Resolution
    • Time-of-flight Sensors
    • Time Of Flight Camera
• isbn_formats:
  • format: Online ISBN, value: 978-1-4673-0858-8, isbnType: New-2005
  • format: Print ISBN, value: 978-1-4673-0857-1, isbnType: New-2005
  • format: Electronic ISBN, value: 978-1-4673-0859-5, isbnType: New-2005
• authors:
  • Author Name: Min Seok Oh
    Affiliation: System LSI, Samsung Electronics, Kiheung, South Korea
    Author URL: https://ieeexplore.ieee.org/author/37089388889
    ID: 37089388889
    Order: 1
    Author Affiliations:
    • System LSI, Samsung Electronics, Kiheung, South Korea
  • Author Name: Hae Kyung Kong
    Affiliation: System LSI, Samsung Electronics, Kiheung, South Korea
    Author URL: https://ieeexplore.ieee.org/author/37088694876
    ID: 37088694876
    Order: 2
    Author Affiliations:
    • System LSI, Samsung Electronics, Kiheung, South Korea
  • Author Name: Han Soo Lee
    Affiliation: System LSI, Samsung Electronics, Kiheung, South Korea
    Author URL: https://ieeexplore.ieee.org/author/37088680183
    ID: 37088680183
    Order: 3
    Author Affiliations:
    • System LSI, Samsung Electronics, Kiheung, South Korea
  • Author Name: Kyung Il Kim
    Affiliation: System LSI, Samsung Electronics, Kiheung, South Korea
    Author URL: https://ieeexplore.ieee.org/author/37088694628
    ID: 37088694628
    Order: 4
    Author Affiliations:
    • System LSI, Samsung Electronics, Kiheung, South Korea
  • Author Name: Kwang Hyuk Bae
    Affiliation: System LSI, Samsung Electronics, Kiheung, South Korea
    Author URL: https://ieeexplore.ieee.org/author/37852031200
    ID: 37852031200
    Order: 5
    Author Affiliations:
    • System LSI, Samsung Electronics, Kiheung, South Korea
  • Author Name: Soo Bang Kim
    Affiliation: System LSI, Samsung Electronics, Kiheung, South Korea
    Author URL: https://ieeexplore.ieee.org/author/37069761800
    ID: 37069761800
    Order: 6
    Author Affiliations:
    • System LSI, Samsung Electronics, Kiheung, South Korea
  • Author Name: Sung Kwan Kim
    Affiliation: System LSI, Samsung Electronics, Kiheung, South Korea
    Author URL: https://ieeexplore.ieee.org/author/37088695294
    ID: 37088695294
    Order: 7
    Author Affiliations:
    • System LSI, Samsung Electronics, Kiheung, South Korea
  • Author Name: Moo Sup Lim
    Affiliation: System LSI, Samsung Electronics, Kiheung, South Korea
    Author URL: https://ieeexplore.ieee.org/author/38188695200
    ID: 38188695200
    Order: 8
    Author Affiliations:
    • System LSI, Samsung Electronics, Kiheung, South Korea
  • Author Name: Jung Chak Ahn
    Affiliation: System LSI, Samsung Electronics, Kiheung, South Korea
    Author URL: https://ieeexplore.ieee.org/author/38042315400
    ID: 38042315400
    Order: 9
    Author Affiliations:
    • System LSI, Samsung Electronics, Kiheung, South Korea
  • Author Name: Tae Chan Kim
    Affiliation: System LSI, Samsung Electronics, Kiheung, South Korea
    Author URL: https://ieeexplore.ieee.org/author/37406598200
    ID: 37406598200
    Order: 10
    Author Affiliations:
    • System LSI, Samsung Electronics, Kiheung, South Korea
  • Author Name: Goto Hiroshige
    Affiliation: System LSI, Samsung Electronics, Kiheung, South Korea
    Author URL: https://ieeexplore.ieee.org/author/38489094200
    ID: 38489094200
    Order: 11
    Author Affiliations:
    • System LSI, Samsung Electronics, Kiheung, South Korea
  • Author Name: Seoung Hyun Kim
    Affiliation: Semiconductor R&D Center, Samsung Electronics, Hwasung, South Korea
    Author URL: https://ieeexplore.ieee.org/author/37088695300
    ID: 37088695300
    Order: 12
    Author Affiliations:
    • Semiconductor R&D Center, Samsung Electronics, Hwasung, South Korea
  • Author Name: Dong Ki Min
    Affiliation: Semiconductor R&D Center, Samsung Electronics, Hwasung, South Korea
    Author URL: https://ieeexplore.ieee.org/author/37298007400
    ID: 37298007400
    Order: 13
    Author Affiliations:
    • Semiconductor R&D Center, Samsung Electronics, Hwasung, South Korea
  • Author Name: Yong Jei Lee
    Affiliation: Semiconductor R&D Center, Samsung Electronics, Hwasung, South Korea
    Author URL: https://ieeexplore.ieee.org/author/38190512700
    ID: 38190512700
    Order: 14
    Author Affiliations:
    • Semiconductor R&D Center, Samsung Electronics, Hwasung, South Korea

Image Sensor

• sensor_type: CMOS
• resolution: 320x240 (QVGA)
• dynamic_range: not specified
• pixel_size: 14 μm
• dark_current: not specified

Optical Data

• focal_length: f/1.2
• aperture: f/1.2
• field_of_view: not specified
• distortion: not specified

Performance Metrics

• frame_rate: 60fps

Applications & Benefits

• cell_imaging: Real-time three-dimensional imaging applications in various fields including machine vision, robotics, biometrics, security, automobile navigation, gaming, medical imaging, and surveillance.
• benefits: Offers compactness and robustness for a TOF sensor SOC (System On a Chip). High depth precision and linearity with the ability to operate under background light illumination.

Supporting Organizations

• supported_by: Samsung Electronics

Manuscript Details

• publication_date: 17-20 June 2012

Relevancy Score

• score: 10
• missing_fields:
  • dynamic_range
  • dark_current
  • sensitivity
  • signal_to_noise_ratio
  • shutter_speed
  • power_consumption
  • noise

Processed JSON Filename

request_2fd59b4d-f3c1-4c4a-a763-8e4b963f01a7-backsideillumination_14mpixel_qvga_timeofflight_cmos_imager.json