Asap110lf A Test Platform For Spads And Dsipms In A 110 Nm Cmos Image Sensor Process

• doi: 10.1109/NSS/MIC/RTSD57108.2024.10657209
• title: ASAP110LF, a test platform for SPADs and dSiPMs in a 110 nm CMOS image sensor process
• publisher: IEEE
• isbn: 979-8-3503-8816-9
• issn: 1082-3654
• rank: 1363
• access_type: LOCKED
• content_type: Conferences
• abstract: A test chip, including arrays of SPADs and digital SiPMs, has been designed and fabricated in a 110 nm CMOS image sensor (CIS) process. Characterization of the main device features, including dark count rate (DCR), afterpulsing, cross-talk, photon detection probability, breakdown voltage dispersion and jitter, has been carried out, also taking advantage of purposely integrated structures. Comparison with other CMOS SPAD platforms emphasizes the strengths and advantages of the technology under test as a trade-off among integration density, timing accuracy and noise performance.
• article_number: 10657209
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10657209
• html_url: https://ieeexplore.ieee.org/document/10657209/
• abstract_url: https://ieeexplore.ieee.org/document/10657209/
• publication_title: 2024 IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD)
• conference_location: Tampa, FL, USA
• conference_dates: 26 Oct.-2 Nov. 2024
• publication_number: 10654796
• is_number: 10654808
• publication_year: 2024
• publication_date: 26 Oct.-2 Nov. 2024
• start_page: 1
• end_page: 1
• citing_paper_count: 0
• citing_patent_count: 0
• download_count: 54
• insert_date: 20240925
• index_terms:
  • ieee_terms:
    • Temperature sensors
    • Microwave integrated circuits
    • Semiconductor detectors
    • Noise
    • CMOS image sensors
    • Jitter
    • Timing
• isbn_formats:
  • format: Print on Demand(PoD) ISBN, value: 979-8-3503-8816-9, isbnType: New-2005
  • format: Electronic ISBN, value: 979-8-3503-8815-2, isbnType: New-2005
• authors:
  • Author Name: L. Ratti
    Affiliation: Dept. of Electrical, Computer and Biomedical Engineering, University of Pavia, Pavia, Italy
    Author URL: https://ieeexplore.ieee.org/author/441554318173169
    ID: 441554318173169
    Order: 1
    Author Affiliations:
    • Dept. of Electrical, Computer and Biomedical Engineering, University of Pavia, Pavia, Italy
    • INFN - Istituto Nazionale di Fisica Nucleare, Sezione di Pavia, Pavia, Italy
  • Author Name: P. Brogi
    Affiliation: DFSTA, University of Siena, Siena, Italy
    Author URL: https://ieeexplore.ieee.org/author/38232992200
    ID: 38232992200
    Order: 2
    Author Affiliations:
    • DFSTA, University of Siena, Siena, Italy
    • INFN - Istituto Nazionale di Fisica Nucleare, Sezione di Pisa, Pisa, Italy
  • Author Name: G.-F. Dalla Betta
    Affiliation: Dept. Industrial Engineering, University of Trento, Trento, Italy
    Author URL: https://ieeexplore.ieee.org/author/949663337107797
    ID: 949663337107797
    Order: 3
    Author Affiliations:
    • Dept. Industrial Engineering, University of Trento, Trento, Italy
    • INFN - Istituto Nazionale di Fisica Nucleare, TIFPA, Trento, Italy
  • Author Name: S. Giroletti
    Affiliation: Dept. of Electrical, Computer and Biomedical Engineering, University of Pavia, Pavia, Italy
    Author URL: https://ieeexplore.ieee.org/author/37089450453
    ID: 37089450453
    Order: 4
    Author Affiliations:
    • Dept. of Electrical, Computer and Biomedical Engineering, University of Pavia, Pavia, Italy
    • INFN - Istituto Nazionale di Fisica Nucleare, Sezione di Pavia, Pavia, Italy
  • Author Name: P.S. Marrocchesi
    Affiliation: DFSTA, University of Siena, Siena, Italy
    Author URL: https://ieeexplore.ieee.org/author/37377359400
    ID: 37377359400
    Order: 5
    Author Affiliations:
    • DFSTA, University of Siena, Siena, Italy
    • INFN - Istituto Nazionale di Fisica Nucleare, Sezione di Pisa, Pisa, Italy
  • Author Name: L. Pancheri
    Affiliation: Dept. Industrial Engineering, University of Trento, Trento, Italy
    Author URL: https://ieeexplore.ieee.org/author/481267062145626
    ID: 481267062145626
    Order: 6
    Author Affiliations:
    • Dept. Industrial Engineering, University of Trento, Trento, Italy
    • INFN - Istituto Nazionale di Fisica Nucleare, TIFPA, Trento, Italy
  • Author Name: F. Shojaei
    Affiliation: Dept. of Electrical, Computer and Biomedical Engineering, University of Pavia, Pavia, Italy
    Author URL: https://ieeexplore.ieee.org/author/470516282656131
    ID: 470516282656131
    Order: 7
    Author Affiliations:
    • Dept. of Electrical, Computer and Biomedical Engineering, University of Pavia, Pavia, Italy
    • INFN - Istituto Nazionale di Fisica Nucleare, Sezione di Pavia, Pavia, Italy
  • Author Name: G. Torilla
    Affiliation: Dept. of Electrical, Computer and Biomedical Engineering, University of Pavia, Pavia, Italy
    Author URL: https://ieeexplore.ieee.org/author/37088442902
    ID: 37088442902
    Order: 8
    Author Affiliations:
    • Dept. of Electrical, Computer and Biomedical Engineering, University of Pavia, Pavia, Italy
    • INFN - Istituto Nazionale di Fisica Nucleare, Sezione di Pavia, Pavia, Italy
  • Author Name: C. Vacchi
    Affiliation: Dept. of Electrical, Computer and Biomedical Engineering, University of Pavia, Pavia, Italy
    Author URL: https://ieeexplore.ieee.org/author/321556370985725
    ID: 321556370985725
    Order: 9
    Author Affiliations:
    • Dept. of Electrical, Computer and Biomedical Engineering, University of Pavia, Pavia, Italy
    • INFN - Istituto Nazionale di Fisica Nucleare, Sezione di Pavia, Pavia, Italy

Image Sensor

• sensor_type: CMOS
• resolution: not specified
• dynamic_range: not specified
• pixel_size: not specified
• dark_current: not specified

Optical Data

• focal_length: not specified
• aperture: not specified
• field_of_view: not specified
• distortion: not specified

Performance Metrics

Applications & Benefits

• cell_imaging: not specified
• benefits: not specified.

Supporting Organizations

• supported_by: INFN - Istituto Nazionale di Fisica Nucleare, University of Pavia, University of Siena, University of Trento.

Manuscript Details

• publication_date: 26 Oct.-2 Nov. 2024

Relevancy Score

• score: 9
• missing_fields:
  • resolution
  • dynamic_range
  • pixel_size
  • dark_current
  • frame_rate
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed
  • power_consumption
  • noise
  • focal_length
  • aperture
  • field_of_view
  • distortion

Processed JSON Filename

request_17dc7403-9de1-4513-9e4c-660e46b27215-asap110lf_a_test_platform_for_spads_and_dsipms_in_a_110_nm_cmos_image_sensor_process.json