Aps Fixed Pattern Noise Modelling And Compensation

• doi: 10.1109/DCIS.2016.7845363
• title: APS fixed pattern noise modelling and compensation
• publisher: IEEE
• isbn: 978-1-5090-4566-2
• issn:
• rank: 1362
• access_type: LOCKED
• content_type: Conferences
• abstract: In this paper we describe different procedures to compensate the fixed pattern noise (FPN). These procedures have been developed and tested for a camera designed by us, which is based on a CMOS active pixel sensor (APS). In this kind of sensors, the FPN mainly depends on the noise coming from the column selection electronics. In this sense, we suggest and assess three different methods for FPN compensation: using a simple model taking into account this dependency, using an external test signal routed through the image chain and finally using a region of the sensor which is not illuminated. The first two procedures are of special interest for camera systems lacking a shutter or a not illuminated region in the sensor. The last one is more similar to the typical approach, but requires using a larger sensor only to have some covered light sensitive area.
• article_number: 7845363
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7845363
• html_url: https://ieeexplore.ieee.org/document/7845363/
• abstract_url: https://ieeexplore.ieee.org/document/7845363/
• publication_title: 2016 Conference on Design of Circuits and Integrated Systems (DCIS)
• conference_location: Granada, Spain
• conference_dates: 23-25 Nov. 2016
• publication_number: 7827413
• is_number: 7845255
• publication_year: 2016
• publication_date: 23-25 Nov. 2016
• start_page: 1
• end_page: 5
• citing_paper_count: 1
• citing_patent_count: 0
• download_count: 255
• insert_date: 20170209
• index_terms:
  • ieee_terms:
    • Sensors
    • Cameras
    • Standards
    • Correlation
    • Calibration
    • Image sensors
    • Instruments
  • author_terms:
    • aerospace electronics
    • pattern analysis
    • image analysis
    • image enhancement
  • dynamic_index_terms:
    • Fixed Pattern Noise
    • Active Pixel Sensor
    • Camera System
    • Kinds Of Sensors
    • Large Sensor
    • Random Noise
    • Channel Noise
    • Noise Sources
    • Analog-to-digital Converter
    • Analog-to-digital
    • Digital-to-analog Converter
    • Commutative
    • Noncommutative
    • Reference Image
    • Image Sensor
    • Camera Sensor
    • Test Pattern
    • Test Card
    • Pixel Position
    • Voltage Divider
    • Output Buffer
• isbn_formats:
  • format: Print on Demand(PoD) ISBN, value: 978-1-5090-4566-2, isbnType: New-2005
  • format: Electronic ISBN, value: 978-1-5090-4565-5, isbnType: New-2005
• authors:
  • Author Name: D. Roma
    Affiliation: Department of Engineering: Electronics, University of Barcelona, UB, Barcelona, Spain
    Author URL: https://ieeexplore.ieee.org/author/37085549381
    ID: 37085549381
    Order: 1
    Author Affiliations:
    • Department of Engineering: Electronics, University of Barcelona, UB, Barcelona, Spain
  • Author Name: J. Bosch
    Affiliation: Department of Engineering: Electronics, University of Barcelona, UB, Barcelona, Spain
    Author URL: https://ieeexplore.ieee.org/author/37304476100
    ID: 37304476100
    Order: 2
    Author Affiliations:
    • Department of Engineering: Electronics, University of Barcelona, UB, Barcelona, Spain
  • Author Name: M. Carmona
    Affiliation: Department of Engineering: Electronics, University of Barcelona, UB, Barcelona, Spain
    Author URL: https://ieeexplore.ieee.org/author/37540904200
    ID: 37540904200
    Order: 3
    Author Affiliations:
    • Department of Engineering: Electronics, University of Barcelona, UB, Barcelona, Spain
  • Author Name: A. Casas
    Affiliation: Department of Engineering: Electronics, University of Barcelona, UB, Barcelona, Spain
    Author URL: https://ieeexplore.ieee.org/author/37085554831
    ID: 37085554831
    Order: 4
    Author Affiliations:
    • Department of Engineering: Electronics, University of Barcelona, UB, Barcelona, Spain
  • Author Name: A. Herms
    Affiliation: Department of Engineering: Electronics, University of Barcelona, UB, Barcelona, Spain
    Author URL: https://ieeexplore.ieee.org/author/37330635500
    ID: 37330635500
    Order: 5
    Author Affiliations:
    • Department of Engineering: Electronics, University of Barcelona, UB, Barcelona, Spain
  • Author Name: J. M. Gómez
    Affiliation: Department of Engineering: Electronics, University of Barcelona, UB, Barcelona, Spain
    Author URL: https://ieeexplore.ieee.org/author/37348004900
    ID: 37348004900
    Order: 6
    Author Affiliations:
    • Department of Engineering: Electronics, University of Barcelona, UB, Barcelona, Spain
  • Author Name: M. López
    Affiliation: Department of Engineering: Electronics, University of Barcelona, UB, Barcelona, Spain
    Author URL: https://ieeexplore.ieee.org/author/37689756000
    ID: 37689756000
    Order: 7
    Author Affiliations:
    • Department of Engineering: Electronics, University of Barcelona, UB, Barcelona, Spain
  • Author Name: J. Sabater
    Affiliation: Department of Engineering: Electronics, University of Barcelona, UB, Barcelona, Spain
    Author URL: https://ieeexplore.ieee.org/author/37063249000
    ID: 37063249000
    Order: 8
    Author Affiliations:
    • Department of Engineering: Electronics, University of Barcelona, UB, Barcelona, Spain
  • Author Name: J. Baumgartner
    Affiliation: Department of Engineering: Electronics, University of Barcelona, UB, Barcelona, Spain
    Author URL: https://ieeexplore.ieee.org/author/37085554943
    ID: 37085554943
    Order: 9
    Author Affiliations:
    • Department of Engineering: Electronics, University of Barcelona, UB, Barcelona, Spain
  • Author Name: T. Maue
    Affiliation: Department of Engineering: Electronics, University of Barcelona, UB, Barcelona, Spain
    Author URL: https://ieeexplore.ieee.org/author/37085554597
    ID: 37085554597
    Order: 10
    Author Affiliations:
    • Department of Engineering: Electronics, University of Barcelona, UB, Barcelona, Spain
  • Author Name: E. Nakai
    Affiliation: Department of Engineering: Electronics, University of Barcelona, UB, Barcelona, Spain
    Author URL: https://ieeexplore.ieee.org/author/37085546031
    ID: 37085546031
    Order: 11
    Author Affiliations:
    • Department of Engineering: Electronics, University of Barcelona, UB, Barcelona, Spain
  • Author Name: W. Schmidt
    Affiliation: Department of Engineering: Electronics, University of Barcelona, UB, Barcelona, Spain
    Author URL: https://ieeexplore.ieee.org/author/37085554894
    ID: 37085554894
    Order: 12
    Author Affiliations:
    • Department of Engineering: Electronics, University of Barcelona, UB, Barcelona, Spain
  • Author Name: R. Volkmer
    Affiliation: Department of Engineering: Electronics, University of Barcelona, UB, Barcelona, Spain
    Author URL: https://ieeexplore.ieee.org/author/37085550494
    ID: 37085550494
    Order: 13
    Author Affiliations:
    • Department of Engineering: Electronics, University of Barcelona, UB, Barcelona, Spain

Image Sensor

• sensor_type: CMOS
• resolution: 1Mpixel
• dynamic_range: Not specified
• pixel_size: 15 µm x 15 µm
• dark_current: Not specified

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

• shutter_speed: Not applicable (no shutter)
• noise: Includes fixed pattern noise and dark current.

Applications & Benefits

• cell_imaging: The research addresses fixed pattern noise in CMOS sensors which is crucial for applications in various imaging systems including cell imaging.
• benefits: Improved image quality and stability through reduced fixed pattern noise.

Supporting Organizations

• supported_by: Spanish MINECO, Generalitat de Catalunya.

Manuscript Details

• publication_date: 23-25 Nov. 2016

Relevancy Score

• score: 9
• missing_fields:
  • dynamic_range
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • signal_to_noise_ratio
  • sensitivity
  • power_consumption

Processed JSON Filename

request_a09c0268-d148-4d4e-a020-371cb75034e6-aps_fixed_pattern_noise_modelling_and_compensation.json