Analysis And Calibration Of Process Variations For An Array Of Temperature Sensors

• doi: 10.1109/ICSENS.2017.8233959
• title: Analysis and calibration of process variations for an array of temperature sensors
• publisher: IEEE
• isbn: 978-1-5090-1013-4
• issn:
• rank: 1624
• access_type: LOCKED
• content_type: Conferences
• abstract: This paper presents an analysis and calibration of process variations for an array of temperature sensors, which are incorporated into a CMOS image sensor chip. Making use of the experimental results of more than 500 temperature sensors implemented on the same chip, the proposed calibration method has removed their process variations from 14.3 % to 2.5 % (3 sigma).
• article_number: 8233959
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8233959
• html_url: https://ieeexplore.ieee.org/document/8233959/
• abstract_url: https://ieeexplore.ieee.org/document/8233959/
• publication_title: 2017 IEEE SENSORS
• conference_location: Glasgow, UK
• conference_dates: 29 Oct.-1 Nov. 2017
• publication_number: 8169642
• is_number: 8233862
• publication_year: 2017
• publication_date: 29 Oct.-1 Nov. 2017
• start_page: 1
• end_page: 3
• citing_paper_count: 5
• citing_patent_count: 0
• download_count: 854
• insert_date: 20171225
• index_terms:
  • ieee_terms:
    • Temperature sensors
    • Temperature measurement
    • Calibration
    • Temperature
    • Curve fitting
    • Electronics packaging
    • Dark current
  • author_terms:
    • BJT based temperature sensor
    • CMOS image sensor
    • sensor array
    • calibration
  • dynamic_index_terms:
    • Temperature Sensor
    • Image Sensor
    • Camera Sensor
    • Calibration Method
    • Temperature Measurements
    • Thermometry
    • Global Fit
    • Current Ratio
    • Dark Current
    • Saturation Current
    • Dark Images
    • Bipolar Transistor
    • Bipolar Junction Transistor
    • Collector Current
    • Column Array
    • PIN Photodiode
• isbn_formats:
  • format: Print on Demand(PoD) ISBN, value: 978-1-5090-1013-4, isbnType: New-2005
  • format: Electronic ISBN, value: 978-1-5090-1012-7, isbnType: New-2005
• authors:
  • Author Name: S. Xie
    Affiliation: Electronic Instrumentation Laboratory, TU Delft, Delft, The Netherlands
    Author URL: https://ieeexplore.ieee.org/author/37086323943
    ID: 37086323943
    Order: 1
    Author Affiliations:
    • Electronic Instrumentation Laboratory, TU Delft, Delft, The Netherlands
  • Author Name: A. Abarca
    Affiliation: Electronic Instrumentation Laboratory, TU Delft, Delft, The Netherlands
    Author URL: https://ieeexplore.ieee.org/author/37086323400
    ID: 37086323400
    Order: 2
    Author Affiliations:
    • Electronic Instrumentation Laboratory, TU Delft, Delft, The Netherlands
  • Author Name: J. Markenhof
    Affiliation: Electronic Instrumentation Laboratory, TU Delft, Delft, The Netherlands
    Author URL: https://ieeexplore.ieee.org/author/37086323251
    ID: 37086323251
    Order: 3
    Author Affiliations:
    • Electronic Instrumentation Laboratory, TU Delft, Delft, The Netherlands
  • Author Name: X. Ge
    Affiliation: Technische Universiteit Delft, Delft, Zuid-Holland, NL
    Author URL: https://ieeexplore.ieee.org/author/37085685005
    ID: 37085685005
    Order: 4
    Author Affiliations:
    • Technische Universiteit Delft, Delft, Zuid-Holland, NL
  • Author Name: A. Theuwissen
    Affiliation: Harvest Imaging, Bree, Belgium
    Author URL: https://ieeexplore.ieee.org/author/37282956500
    ID: 37282956500
    Order: 5
    Author Affiliations:
    • Harvest Imaging, Bree, Belgium
    • Electronic Instrumentation Laboratory, TU Delft, Delft, The Netherlands

Image Sensor

• sensor_type: CMOS
• resolution: Not specified
• dynamic_range: Not specified
• pixel_size: Not specified
• dark_current: Related to the signal response when a photo detector is not exposed to light; needs prediction for different temperatures in the range -40 °C to 90 °C due to temperature sensor data that associates dark current with temperature changes, which doubles with every 5 °C rise in temperature, but specific dark current values are not provided in the text.

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

• noise: ±14.3 °C without calibration, reduced to ±2.5 °C after calibration (3 sigma). Individual 3 sigma errors during calibration were ±1.8 °C.

Applications & Benefits

• cell_imaging: Temperature sensors are used for dark current prediction in image sensors to improve CIS performance without a physical shutter.
• benefits: The calibration method reduces process variations among the temperature sensors, making it suitable for mass production.

Supporting Organizations

• supported_by: TowerJazz and Dutch government through the CATRENE initiative.

Manuscript Details

• publication_date: 29 Oct.-1 Nov. 2017

Relevancy Score

• score: 10
• missing_fields:
  • resolution
  • dynamic_range
  • pixel_size
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed
  • power_consumption

Processed JSON Filename

request_a3dd62a4-e983-411d-8fe9-ffbadb036cc3-analysis_and_calibration_of_process_variations_for_an_array_of_temperature_sensors.json