An Insensor Puf Featuring Optical Reconfigurability And Near100 Hardware Reuse Ratio For Trustworthy Sensing

• doi: 10.1109/VLSITechnologyandCir46783.2024.10631380
• title: An In-Sensor PUF Featuring Optical Reconfigurability and Near-100% Hardware Reuse Ratio for Trustworthy Sensing
• publisher: IEEE
• isbn: 979-8-3503-6147-6
• issn: 0743-1562
• rank: 1508
• access_type: LOCKED
• content_type: Conferences
• abstract: Mainstream CMOS image sensors are in dire need of having built-in security primitive to facilitate on-chip trustworthy sensing for the attestation of the visual content integrity against photo-realistic spoofing attacks made feasible by the emerging generative artificial intelligence (AI) tools. This paper presents an optically-reconfigurable in-sensor strong physically unclonable function (PUF) leveraging both intrinsic dark signal non-uniformity (DSNU) and photo response non-uniformity (PRNU) of photo sensing pixels as entropy sources. The fabricated $128\times 128$ in-sensor PUF chip features 99.735% hardware reuse ratio, $\sim 1\times 10^{36}\text{bit}/\mathrm{F}^{2}$ area efficiency, $\approx 2.77\times 10^{42}$ challenge-response pairs (CRP) and high resistance against several well-known machine-learning attacks.
• article_number: 10631380
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10631380
• html_url: https://ieeexplore.ieee.org/document/10631380/
• abstract_url: https://ieeexplore.ieee.org/document/10631380/
• publication_title: 2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)
• conference_location: Honolulu, HI, USA
• conference_dates: 16-20 June 2024
• publication_number: 10631290
• is_number: 10631310
• publication_year: 2024
• publication_date: 16-20 June 2024
• start_page: 1
• end_page: 2
• citing_paper_count: 0
• citing_patent_count: 0
• download_count: 298
• insert_date: 20240826
• index_terms:
  • ieee_terms:
    • Resistance
    • Visualization
    • Optical device fabrication
    • Very large scale integration
    • Optical imaging
    • Physical unclonable function
    • Hardware
  • dynamic_index_terms:
    • Physical Unclonable Functions
    • Image Sensor
    • Camera Sensor
    • Artificial Intelligence Tools
    • Spoofing Attacks
    • Entropy Source
    • Internet Of Things
    • Analog-to-digital Converter
    • Analog-to-digital
    • Digital-to-analog Converter
    • Bit Error Rate
    • Bit Error Ratio
    • Uniform Light
    • Mutual Independence
• isbn_formats:
  • format: Print on Demand(PoD) ISBN, value: 979-8-3503-6147-6, isbnType: New-2005
  • format: Electronic ISBN, value: 979-8-3503-6146-9, isbnType: New-2005
• authors:
  • Author Name: Haibiao Zuo
    Affiliation: State Key Laboratory of RF Heterogeneous Integration, Shenzhen University, Shenzhen, China
    Author URL: https://ieeexplore.ieee.org/author/37089495530
    ID: 37089495530
    Order: 1
    Author Affiliations:
    • State Key Laboratory of RF Heterogeneous Integration, Shenzhen University, Shenzhen, China
  • Author Name: Xiaoliang Huang
    Affiliation: State Key Laboratory of RF Heterogeneous Integration, Shenzhen University, Shenzhen, China
    Author URL: https://ieeexplore.ieee.org/author/37090089543
    ID: 37090089543
    Order: 2
    Author Affiliations:
    • State Key Laboratory of RF Heterogeneous Integration, Shenzhen University, Shenzhen, China
  • Author Name: Shiqiao Zhang
    Affiliation: State Key Laboratory of RF Heterogeneous Integration, Shenzhen University, Shenzhen, China
    Author URL: https://ieeexplore.ieee.org/author/37089978347
    ID: 37089978347
    Order: 3
    Author Affiliations:
    • State Key Laboratory of RF Heterogeneous Integration, Shenzhen University, Shenzhen, China
  • Author Name: Chip-Hong Chang
    Affiliation: School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore
    Author URL: https://ieeexplore.ieee.org/author/37090087724
    ID: 37090087724
    Order: 4
    Author Affiliations:
    • School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore
  • Author Name: Xiaojin Zhao
    Affiliation: State Key Laboratory of RF Heterogeneous Integration, Shenzhen University, Shenzhen, China
    Author URL: https://ieeexplore.ieee.org/author/38550947700
    ID: 38550947700
    Order: 5
    Author Affiliations:
    • State Key Laboratory of RF Heterogeneous Integration, Shenzhen University, Shenzhen, China

Image Sensor

• sensor_type: CMOS
• resolution: 128x128
• dynamic_range: 58 dB
• pixel_size: 7.6 µm
• dark_current: 34 Ke-

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

• frame_rate: 60 fps
• noise: Time delay: 1.8x10^3 electrons.

Applications & Benefits

• cell_imaging: Used for photography and as PUF for device-specific random response generator.
• benefits: Provides a provenance proof against spoofing attacks and enables device identification.

Supporting Organizations

• supported_by: National Key R&D Program of China, National Natural Science Foundation of China, Ministry of Education Singapore, Shenzhen Science and Technology Program

Manuscript Details

• publication_date: 16-20 June 2024

Relevancy Score

• score: 10
• missing_fields:
  • fill factor
  • quantum efficiency
  • readout speed
  • noise sources
  • analog-to-digital conversion techniques
  • microlenses
  • on-chip colour filters
  • global or rolling shutters
  • backside illumination

Processed JSON Filename

request_09668536-78be-4707-8b24-17f162d90ce5-an_insensor_puf_featuring_optical_reconfigurability_and_near100_hardware_reuse_ratio_for_trustworthy_sensing.json