An Image Destriping Method Combining Feature Extraction And Nonlinear Fitting

• doi: 10.1109/CCISP52774.2021.9639372
• title: An image destriping method combining feature extraction and nonlinear fitting
• publisher: IEEE
• isbn: 978-1-6654-3280-1
• issn:
• rank: 1574
• access_type: LOCKED
• content_type: Conferences
• abstract: With the development of semiconductor technology, the performance of many new image sensors, such as infrared focal planes and CMOS image sensors, have been improved. Also, it is an alternative choice of CCD, vacuum tube or other equipment that promotes this kind of sensors to become the mainstream of the market. However, this kind of image sensors has a weakness that is the stripe noise, due to the inconsistent readout circuit response. This noise influences the quality of image directly, as a result, the poor image quality in-benefits for recognition and classification. Thus, how to remove the stripe noise arises the interests for many researchers. Most of them only focus on one certain type of stripe features, instead of combining different features together, leading to the poor performance of denoising. This paper proposes a method of removing stripes that combines feature extraction and function fitting. Firstly, extract the statistics and spatial position of the stripes, and then perform two steps of rough processing and fine processing on the image. The PSNR, SSM value show that the algorithm meets the design expectations and has a certain degree of robustness.
• article_number: 9639372
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9639372
• html_url: https://ieeexplore.ieee.org/document/9639372/
• abstract_url: https://ieeexplore.ieee.org/document/9639372/
• publication_title: 2021 6th International Conference on Communication, Image and Signal Processing (CCISP)
• conference_location: Chengdu, China
• conference_dates: 19-21 Nov. 2021
• publication_number: 9639077
• is_number: 9639079
• publication_year: 2021
• publication_date: 19-21 Nov. 2021
• start_page: 114
• end_page: 118
• citing_paper_count: 1
• citing_patent_count: 0
• download_count: 92
• insert_date: 20211217
• index_terms:
  • ieee_terms:
    • Image recognition
    • Fitting
    • Noise reduction
    • Signal processing algorithms
    • Filtering algorithms
    • Signal processing
    • Feature extraction
  • author_terms:
    • stripe noise
    • Image Filter
    • SG filter
    • Midway filter
  • dynamic_index_terms:
    • Nonlinear Fitting
    • Combination Of Feature Extraction
    • Image Quality
    • Denoising
    • Noise Reduction
    • Fitness Function
    • Image Sensor
    • Camera Sensor
    • Peak Signal-to-noise Ratio
    • Peak Signal To Noise Ratio
    • PSNR
    • Vacuum Tubes
    • Thermal Devices
    • Kinds Of Sensors
    • Degree Of Robustness
    • Readout Circuit
    • Structural Similarity
    • SSIM
    • Wavelet Transform
    • Wavelet Coefficients
    • Effective Algorithm
    • Value Of Image
    • Photoelectric Conversion
• isbn_formats:
  • format: Print on Demand(PoD) ISBN, value: 978-1-6654-3280-1, isbnType: New-2005
  • format: Electronic ISBN, value: 978-1-6654-3279-5, isbnType: New-2005
• authors:
  • Author Name: Sichong Huang
    Affiliation: Beijing Microelectronics Tech. Institution (BMTI), Beijing, China
    Author URL: https://ieeexplore.ieee.org/author/37089197774
    ID: 37089197774
    Order: 1
    Author Affiliations:
    • Beijing Microelectronics Tech. Institution (BMTI), Beijing, China
  • Author Name: Tiejun Lu
    Affiliation: Beijing Microelectronics Tech. Institution (BMTI), Beijing, China
    Author URL: https://ieeexplore.ieee.org/author/37086576404
    ID: 37086576404
    Order: 2
    Author Affiliations:
    • Beijing Microelectronics Tech. Institution (BMTI), Beijing, China
  • Author Name: Zhenlin Lu
    Affiliation: Beijing Microelectronics Tech. Institution (BMTI), Beijing, China
    Author URL: https://ieeexplore.ieee.org/author/37086810019
    ID: 37086810019
    Order: 3
    Author Affiliations:
    • Beijing Microelectronics Tech. Institution (BMTI), Beijing, China
  • Author Name: Ruoling Yang
    Affiliation: Beijing Microelectronics Tech. Institution (BMTI), Beijing, China
    Author URL: https://ieeexplore.ieee.org/author/37089195274
    ID: 37089195274
    Order: 4
    Author Affiliations:
    • Beijing Microelectronics Tech. Institution (BMTI), Beijing, China
  • Author Name: Guanchen Li
    Affiliation: Beijing Microelectronics Tech. Institution (BMTI), Beijing, China
    Author URL: https://ieeexplore.ieee.org/author/37089504136
    ID: 37089504136
    Order: 5
    Author Affiliations:
    • Beijing Microelectronics Tech. Institution (BMTI), Beijing, China

Image Sensor

• sensor_type: CMOS
• resolution: not specified
• dynamic_range: not specified
• pixel_size: not specified
• dark_current: not specified

Optical Data

• focal_length: not specified
• aperture: not specified
• field_of_view: not specified
• distortion: not specified

Performance Metrics

Applications & Benefits

• cell_imaging: not specified
• benefits: Digital imaging in various applications such as smartphones, medical devices, and automotive systems.

Supporting Organizations

• supported_by: Beijing Microelectronics Tech. Institution (BMTI)

Manuscript Details

• publication_date: 19-21 Nov. 2021

Relevancy Score

• score: 9
• missing_fields:
  • resolution
  • dynamic_range
  • pixel_size
  • dark_current
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • sensitivity
  • shutter_speed
  • power_consumption
  • noise
  • cell_imaging
  • publication_date

Processed JSON Filename

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