An Eventdetection High Dynamic Range Cmos Image Sensor

• doi: 10.1109/ICSENS.2013.6688546
• title: An event-detection high dynamic range CMOS image sensor
• publisher: IEEE
• isbn: 978-1-4673-4642-9
• issn: 1930-0395
• rank: 1571
• access_type: LOCKED
• content_type: Conferences
• abstract: A novel CMOS image sensor is proposed to overcome the analog design limitations in Active Pixel Sensors - APS and large area overcome in Digital Pixel Sensors - DPS for use in bio-medical applications. The design includes a pixel level event generation mechanism by using a binary search technique. A ramp voltage generated by a combined block of 10-bit counter and DAC Digital to Analog Converter is compared with the pixel integrated voltage at each clock cycle at the same time allowing a fixed exposure time interval. The proposed design arrives to a total pixel array area of 1505.62μm × 4566μm for a pixel array size of 160(Zf) × 120(V). The photo-active area in each pixel is considered as the N-well area in a p002B;/n-well/p-sub type photo-transistor corresponding to a size of 11.24μm × 10.76μm. The overall pixel array reaches a fill factor of %34.
• article_number: 6688546
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6688546
• html_url: https://ieeexplore.ieee.org/document/6688546/
• abstract_url: https://ieeexplore.ieee.org/document/6688546/
• publication_title: SENSORS, 2013 IEEE
• conference_location: Baltimore, MD, USA
• conference_dates: 3-6 Nov. 2013
• publication_number: 6679330
• is_number: 6688115
• publication_year: 2013
• publication_date: 3-6 Nov. 2013
• start_page: 1
• end_page: 4
• citing_paper_count: 1
• citing_patent_count: 0
• download_count: 338
• insert_date: 20131219
• index_terms:
  • ieee_terms:
    • Radiation detectors
    • Clocks
    • Arrays
    • Random access memory
    • Dynamic range
    • CMOS image sensors
  • dynamic_index_terms:
    • Dynamic Range
    • Image Sensor
    • Camera Sensor
    • High Dynamic Range
    • Dynamic Sensor
    • Analog-to-digital Converter
    • Analog-to-digital
    • Digital-to-analog Converter
    • Pixel Area
    • Parallel Design
    • Design Of Analogues
    • Binary Search
    • Clock Cycles
    • Pixel Array
    • Voltage Ramp
    • Sensor Pixel
    • Photodiode
    • Pulse Width
    • Pulsewidth Modulation
    • Output Signal
    • Multiple Events
    • Limiting Factor
    • Cadence
    • State Machine
    • Finite-state
    • Finite State Machine
    • Pulsed Mode
    • Counter Value
    • Bus Lines
    • Layout Design
    • Multiple Pixels
    • Output Pixel
    • Serialized
    • Encoder Block
• isbn_formats:
  • format: Electronic ISBN, value: 978-1-4673-4642-9, isbnType: New-2005
• authors:
  • Author Name: Gözen Köklü
    Affiliation: Microelectronic Systems Laboratory (LSM), Swiss Federal Institute of Technology (EPFL)
    Author URL: https://ieeexplore.ieee.org/author/38072984400
    ID: 38072984400
    Order: 1
    Author Affiliations:
    • Microelectronic Systems Laboratory (LSM), Swiss Federal Institute of Technology (EPFL)
  • Author Name: Dechao Sun
    Affiliation: Integrated Systems Laboratory (LSI), Swiss Federal Institute of Technology (EPFL)
    Author URL: https://ieeexplore.ieee.org/author/37086766707
    ID: 37086766707
    Order: 2
    Author Affiliations:
    • Integrated Systems Laboratory (LSI), Swiss Federal Institute of Technology (EPFL)
  • Author Name: Yusuf Leblebici
    Affiliation: Microelectronic Systems Laboratory (LSM), Swiss Federal Institute of Technology (EPFL)
    Author URL: https://ieeexplore.ieee.org/author/37276561900
    ID: 37276561900
    Order: 3
    Author Affiliations:
    • Microelectronic Systems Laboratory (LSM), Swiss Federal Institute of Technology (EPFL)
  • Author Name: Giovanni De Micheli
    Affiliation: Integrated Systems Laboratory (LSI), Swiss Federal Institute of Technology (EPFL)
    Author URL: https://ieeexplore.ieee.org/author/37274174300
    ID: 37274174300
    Order: 4
    Author Affiliations:
    • Integrated Systems Laboratory (LSI), Swiss Federal Institute of Technology (EPFL)
  • Author Name: Sandro Carrara
    Affiliation: Integrated Systems Laboratory (LSI), Swiss Federal Institute of Technology (EPFL)
    Author URL: https://ieeexplore.ieee.org/author/37299969000
    ID: 37299969000
    Order: 5
    Author Affiliations:
    • Integrated Systems Laboratory (LSI), Swiss Federal Institute of Technology (EPFL)

Image Sensor

• sensor_type: CMOS
• resolution: 160(H)x120(V)
• dynamic_range: 100 dB
• pixel_size: 11.24 µm x 10.76 µm
• dark_current: Not specified

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

• frame_rate: 10000 fps
• sensitivity: Minimum detectable voltage of 0.2 mV

Applications & Benefits

• cell_imaging: Used in bio-medical applications with advantages for low-light conditions and long exposure times.
• benefits: Wide dynamic range, less analog design limitations, better fill factor compared to existing designs.

Supporting Organizations

• supported_by: NutriCHIP project, Swiss Nano-Tera.ch initiative, Swiss National Science Foundation, NanoSys project.

Manuscript Details

• publication_date: 3-6 Nov. 2013

Relevancy Score

• score: 10
• missing_fields:
  • quantum_efficiency
  • readout_speed
  • noise_sources
  • analog_to_digital_conversion
  • microlenses
  • on_chip_colour_filters
  • global_shutter
  • rolling_shutter
  • backside_illumination

Processed JSON Filename

request_6dfd2596-b89d-4c5c-9315-822ce83cdbfa-an_eventdetection_high_dynamic_range_cmos_image_sensor.json