An Analytical Model Of Dynamic Charge Transfer Process For Cmos Image Sensors

• doi: 10.1109/JSEN.2025.3555631
• title: An analytical Model of Dynamic Charge Transfer Process for CMOS Image Sensors
• publisher: IEEE
• isbn:
• issn: 2379-9153
• rank: 1548
• access_type: LOCKED
• content_type: Early Access Articles
• abstract: An analytical model is proposed to accurately describe the dynamic charge transfer process between the pinned photodiode (PPD) and floating diffusion (FD) node in CMOS image sensors. Two charge motion mechanisms, including self-induced drift and thermionic emission, are discussed in the proposed model. The transient charge transfer behavior is analyzed in different exposure conditions. The parameters such as PPD capacitance, PPD potential, and potential barrier are involved in describing the charge transfer process. The model has been verified by TCAD simulation and the test devices were fabricated with a 0.11 μm CMOS image sensor process. The proposed charge transfer model provides convenience for optimizing the charge transfer efficiency of CMOS image sensors.
• article_number: 10948885
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10948885
• html_url: https://ieeexplore.ieee.org/document/10948885/
• abstract_url: https://ieeexplore.ieee.org/document/10948885/
• publication_title: IEEE Sensors Journal
• conference_location:
• conference_dates:
• publication_number: 7361
• is_number: 4427201
• publication_year: 2025
• publication_date:
• start_page: 1
• end_page: 1
• citing_paper_count: 0
• citing_patent_count: 0
• download_count: 0
• insert_date: 20250403
• index_terms:
  • ieee_terms:
    • Charge transfer
    • Electrons
    • Electric potential
    • Junctions
    • Analytical models
    • Thermionic emission
    • Capacitance
    • Intelligent sensors
    • Capacitors
    • CMOS image sensors
  • author_terms:
    • CMOS image sensors (CISs)
    • pinned photodiode (PPD)
    • thermionic emission
    • self-induced drift
  • dynamic_index_terms:
    • Transfer Process
    • Image Sensor
    • Camera Sensor
    • Charge Transfer Process
    • Exposure Conditions
    • Exposure Status
    • Quantum Efficiency
    • Effects Of Drift
    • Drift Events
    • Transient Behavior
    • Efficient Charge Transfer
    • Thermionic Emission
    • Richardson Constant
    • TCAD Simulation
    • PIN Photodiode
    • High Voltage
    • Higher Tendency
    • Electron Transfer
    • Equilibrium State
    • Thermodynamic Equilibrium
    • Equilibrium Conditions
    • Data Mining
    • Doping Concentration
    • Blue Box
    • Artificial Intelligence Technology
    • Depletion Region
    • Space Charge Region
    • Depletion Zone
    • Depletion Layer
    • Electron Transfer Process
    • Artificial Intelligence Training
    • Junction Capacitance
    • Orange Box
    • Test Chip
    • Similar Technologies
    • Similar Engineering
    • Citation Information
    • Junction Region
    • Electrons In Region
    • Junction Potential
• authors:
  • Author Name: Jing Gao
    Affiliation: School of Microelectronics, Tianjin University and Tianjin Key Laboratory of Imaging and Sensing Microelectronic Technology, Tianjin, China
    Author URL: https://ieeexplore.ieee.org/author/38239776100
    ID: 38239776100
    Order: 1
    Author Affiliations:
    • School of Microelectronics, Tianjin University and Tianjin Key Laboratory of Imaging and Sensing Microelectronic Technology, Tianjin, China
  • Author Name: Chen Chen
    Affiliation: School of Microelectronics, Tianjin University and Tianjin Key Laboratory of Imaging and Sensing Microelectronic Technology, Tianjin, China
    Author URL: https://ieeexplore.ieee.org/author/713937990691950
    ID: 713937990691950
    Order: 2
    Author Affiliations:
    • School of Microelectronics, Tianjin University and Tianjin Key Laboratory of Imaging and Sensing Microelectronic Technology, Tianjin, China
  • Author Name: Jinghua Ao
    Affiliation: School of Microelectronics, Tianjin University and Tianjin Key Laboratory of Imaging and Sensing Microelectronic Technology, Tianjin, China
    Author URL: https://ieeexplore.ieee.org/author/651665854116172
    ID: 651665854116172
    Order: 3
    Author Affiliations:
    • School of Microelectronics, Tianjin University and Tianjin Key Laboratory of Imaging and Sensing Microelectronic Technology, Tianjin, China
  • Author Name: Tao Luo
    Affiliation: College of Intelligence and Computing, Tianjin University, Tianjin, China
    Author URL: https://ieeexplore.ieee.org/author/37088403706
    ID: 37088403706
    Order: 4
    Author Affiliations:
    • College of Intelligence and Computing, Tianjin University, Tianjin, China
  • Author Name: Hong Yin
    Affiliation: International Iberian Nanotechnology Laboratory (INL), Braga, Portugal
    Author URL: https://ieeexplore.ieee.org/author/228483495178565
    ID: 228483495178565
    Order: 5
    Author Affiliations:
    • International Iberian Nanotechnology Laboratory (INL), Braga, Portugal

Image Sensor

• sensor_type: CMOS
• resolution: not specified in the text
• dynamic_range: not specified in the text
• pixel_size: not specified in the text
• dark_current: not specified in the text

Optical Data

• focal_length: not specified in the text
• aperture: not specified in the text
• field_of_view: not specified in the text
• distortion: not specified in the text

Performance Metrics

• frame_rate: not specified in the text
• signal_to_noise_ratio: not specified in the text
• sensitivity: not specified in the text
• shutter_speed: not specified in the text
• power_consumption: not specified in the text
• noise: not specified in the text

Applications & Benefits

• cell_imaging: not specified in the text
• benefits: not specified in the text

Supporting Organizations

• supported_by: National Key R&D Program of China (2022YFB3205101) and NSAF (U2230116)

Manuscript Details

• publication_date: not specified in the text

Relevancy Score

• score: 10
• missing_fields:
  • resolution
  • dynamic_range
  • pixel_size
  • dark_current
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed
  • power_consumption
  • noise
  • cell_imaging
  • benefits
  • publication_date

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