An Advanced Cmos Imager Employing Modified Ar And Acs Methods

• doi: 10.1109/ICSENS.2008.4716705
• title: An advanced CMOS imager employing modified AR and ACS methods
• publisher: IEEE
• isbn: 978-1-4244-2581-5
• issn: 1930-0395
• partnum: 08CH38040
• rank: 1535
• access_type: LOCKED
• content_type: Conferences
• abstract: In this work we present measurements from two generations of fully operational 128times128 CMOS image sensor arrays. In these imagers, we have modified two existing design techniques, the active reset (AR) technique and the active column sensor (ACS) readout technique, and combined them together to achieve low-noise reset and improved spatial gain fixed pattern noise (FPN). In addition, we have implemented three different types of pixels, employing nwell/psub photodiodes to examine the influence of the shallow trench isolation (STI) on dark currents of the photodiodes. While the first fabricated imager served as a basis for different pixels and techniques examination, the second sensor was designed based on the conclusions drawn from the measurements of the first imager. Measurements from both sensors are presented, showing that the proposed architecture achieves column-level FPN of 0.05%, pixel level FPN of 0.16% and SNR of 15 dB at illumination level as low as 4 nW/mm2, making it suitable for applications, where low light detection is required. Other imager attributes are also presented.
• article_number: 4716705
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=4716705
• html_url: https://ieeexplore.ieee.org/document/4716705/
• abstract_url: https://ieeexplore.ieee.org/document/4716705/
• publication_title: SENSORS, 2008 IEEE
• conference_location: Lecce, Italy
• conference_dates: 26-29 Oct. 2008
• publication_number: 4703548
• is_number: 4716361
• publication_year: 2008
• publication_date: 26-29 Oct. 2008
• start_page: 1386
• end_page: 1389
• citing_paper_count: 1
• citing_patent_count: 0
• download_count: 124
• insert_date: 20081216
• index_terms:
  • ieee_terms:
    • CMOS image sensors
    • Pixel
    • Sensor arrays
    • Image sensors
    • Photodiodes
    • Dark current
    • Optical imaging
    • CMOS technology
    • Sensor phenomena and characterization
    • Lighting
  • dynamic_index_terms:
    • Photodiode
    • Image Sensor
    • Camera Sensor
    • Sensor Array
    • Active Sensors
    • Pixel Level
    • Dark Current
    • Basis Of Examination
    • Illumination Levels
    • Types Of Pixels
    • Printed Circuit Board
    • Differential Amplifier
    • Differential Pair
    • Unity Gain
    • Temporal Noise
    • Current Mirror
• isbn_formats:
  • format: CD, value: 978-1-4244-2581-5, isbnType: New-2005
  • format: Print ISBN, value: 978-1-4244-2580-8, isbnType: New-2005
• authors:
  • Author Name: Marianna Beiderman
    Affiliation: University of Calgary, Calgary, AB, CA
    Author URL: https://ieeexplore.ieee.org/author/38273698500
    ID: 38273698500
    Order: 1
    Author Affiliations:
    • University of Calgary, Calgary, AB, CA
  • Author Name: Terence Tam
    Affiliation: University of Calgary, Calgary, AB, CA
    Author URL: https://ieeexplore.ieee.org/author/38272785000
    ID: 38272785000
    Order: 2
    Author Affiliations:
    • University of Calgary, Calgary, AB, CA
  • Author Name: Alexander Fish
    Affiliation: Electrical & Computer Engineering, University of Calgary, Calgary, Canada
    Author URL: https://ieeexplore.ieee.org/author/37268457100
    ID: 37268457100
    Order: 3
    Author Affiliations:
    • Electrical & Computer Engineering, University of Calgary, Calgary, Canada
  • Author Name: Graham A. Gullien
    Affiliation: Electrical & Computer Engineering, University of Calgary, Calgary, Canada
    Author URL: https://ieeexplore.ieee.org/author/38274768200
    ID: 38274768200
    Order: 4
    Author Affiliations:
    • Electrical & Computer Engineering, University of Calgary, Calgary, Canada
  • Author Name: Orly Yadid-Pecht
    Affiliation: Electrical & Computer Engineering, University of Calgary, Calgary, Canada
    Author URL: https://ieeexplore.ieee.org/author/38298354100
    ID: 38298354100
    Order: 5
    Author Affiliations:
    • Electrical & Computer Engineering, University of Calgary, Calgary, Canada
    • The VLSI Systems Center, Ben-Gurion University of the Negev, Beersheba, Israel

Image Sensor

• sensor_type: CMOS
• resolution: 128x128
• dynamic_range: Not explicitly mentioned
• pixel_size: 7μm x 7μm
• dark_current: 36 nA/cm² (worst case, first imager); 29 nA/cm² (second imager)

Optical Data

• focal_length: Not mentioned
• aperture: Not mentioned
• field_of_view: Not mentioned
• distortion: Not mentioned

Performance Metrics

• frame_rate: 30fps
• signal_to_noise_ratio: 15dB
• sensitivity: Not mentioned
• shutter_speed: Not mentioned
• power_consumption: Not mentioned
• noise: 9.9e- (input referred)

Applications & Benefits

• cell_imaging: Suitable for low light detection applications
• benefits: Achieves low noise performance, improved spatial gain fixed pattern noise (FPN), and dark current reduction.

Supporting Organizations

• supported_by: CMC Microsystems

Manuscript Details

• publication_date: 26-29 Oct. 2008

Relevancy Score

• score: 9
• missing_fields:
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • sensitivity
  • shutter_speed
  • power_consumption

Processed JSON Filename

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