Adaptive Detection And Concealment Algorithm Of Defective Pixel

• doi: 10.1109/SIPS.2007.4387626
• title: Adaptive Detection and Concealment Algorithm of Defective Pixel
• publisher: IEEE
• isbn: 978-1-4244-1222-8
• issn: 2162-3570
• partnum: 07TH8958
• rank: 1387
• access_type: LOCKED
• content_type: Conferences
• abstract: This paper proposes a defective pixel detection algorithm for CCD/CMOS image sensors and its hardware architecture. In previous algorithms, the characteristics of images have not been considered and normal pixels can be treated as defective pixels with high possibility. In order to make up for those disadvantages, the proposed algorithm detects defective pixels by considering the characteristics of the image and verifies them using several frames while checking scene-changes. Whenever a scene-change is occurred, potentially defective pixels are detected and verified. The proposed algorithm was implemented with Verilog HDL. Total logic gate count was 5.1k using 0.25um CMOS standard cell library.
• article_number: 4387626
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=4387626
• html_url: https://ieeexplore.ieee.org/document/4387626/
• abstract_url: https://ieeexplore.ieee.org/document/4387626/
• publication_title: 2007 IEEE Workshop on Signal Processing Systems
• conference_location: Shanghai, China
• conference_dates: 17-19 Oct. 2007
• publication_number: 4387497
• is_number: 4387498
• publication_year: 2007
• publication_date: 17-19 Oct. 2007
• start_page: 651
• end_page: 656
• citing_paper_count: 12
• citing_patent_count: 1
• download_count: 579
• insert_date: 20071121
• index_terms:
  • ieee_terms:
    • Pixel
    • Image edge detection
    • Image sensors
    • Sensor arrays
    • Hardware design languages
    • CMOS logic circuits
    • Detection algorithms
    • Charge coupled devices
    • CMOS image sensors
    • Logic gates
  • author_terms:
    • Defective pixel
    • dead pixel
    • detection
    • concealment
    • image sensor
  • dynamic_index_terms:
    • Defective Pixels
    • Image Features
    • Imaging Characteristics
    • Image Sensor
    • Camera Sensor
    • Standard Library
    • Hardware Architecture
    • Detection Methods
    • Horizontal Plane
    • Horizontal Direction
    • Horizontal Distance
    • Vertical Direction
    • Unit Vector
    • Unit Normal Vector
    • Direction Vector
    • Detection Process
    • Directed Graph
    • Directed Edge
    • Current Image
    • Flat Areas
    • Neighboring Pixels
    • Neighborhood Pixels
    • Current Frame
    • Verification Process
    • Edge Area
    • Previous Frame
    • Total Processing Time
    • Scene Changes
    • Current Pixel
    • Detection Buffer
    • Regeneration Buffer
    • Framebuffer
    • Display Memory
    • Location In Frame
    • Location In Each Frame
    • Types Of Pixels
• isbn_formats:
  • format: CD, value: 978-1-4244-1222-8, isbnType: New-2005
  • format: Print ISBN, value: 978-1-4244-1221-1, isbnType: New-2005
• authors:
  • Author Name: Jeehoon An
    Affiliation: School of electrical and electronic engineering, Yonsei University, Seoul, Republic of Korea
    Author URL: https://ieeexplore.ieee.org/author/37951665600
    ID: 37951665600
    Order: 1
    Author Affiliations:
    • School of electrical and electronic engineering, Yonsei University, Seoul, Republic of Korea
  • Author Name: Wonjae Lee
    Affiliation: School of electrical and electronic engineering, Yonsei University, Seoul, Republic of Korea
    Author URL: https://ieeexplore.ieee.org/author/38183855800
    ID: 38183855800
    Order: 2
    Author Affiliations:
    • School of electrical and electronic engineering, Yonsei University, Seoul, Republic of Korea
  • Author Name: Jaeseok Kim
    Affiliation: School of electrical and electronic engineering, Yonsei University, Seoul, Republic of Korea
    Author URL: https://ieeexplore.ieee.org/author/37281193800
    ID: 37281193800
    Order: 3
    Author Affiliations:
    • School of electrical and electronic engineering, Yonsei University, Seoul, Republic of Korea

Image Sensor

• sensor_type: CMOS
• resolution: Not specified
• dynamic_range: Not specified
• pixel_size: Not specified
• dark_current: Not specified

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

Applications & Benefits

• cell_imaging: Not specified
• benefits: Enabled digital imaging in various applications such as smartphones, medical devices, and automotive systems.

Supporting Organizations

• supported_by: MIC (Ministry of Information and Communication), Korea; IITA (Institute of Information Technology Assessment); Yonsei University Institute of TMS Information Technology, Brain Korea 21 program.

Manuscript Details

• publication_date: 17-19 Oct. 2007

Relevancy Score

• score: 10
• missing_fields:
  • resolution
  • dynamic_range
  • pixel_size
  • dark_current
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed
  • power_consumption
  • noise
  • cell_imaging
  • benefits

Processed JSON Filename

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