A Wide Dynamic Range Checkeredcolor Cmos Image Sensor With Ircut Rgb And Visibletonearir Pixels

• doi: 10.1109/ICSENS.2009.5398511
• title: A wide dynamic range checkered-color CMOS image sensor with IR-Cut RGB and visible-to-near-IR pixels
• publisher: IEEE
• isbn: 978-1-4244-5335-1
• issn: 1930-0395
• partnum: 09CH38151
• rank: 1344
• access_type: LOCKED
• content_type: Conferences
• abstract: A single-chip wide dynamic range (DR) CMOS image sensor is demonstrated with good color reproducibility imaging for the visible wave band, as well as a high sensitivity for the wide waveband coverage through visible to near infrared (near-IR) wavebands. We succeeded in developing a checkered White-RGB (WRGB) CMOS image sensor based on the lateral overflow integration capacitor (LOFIC) architecture with optimized capacitance value for each color pixel according to its sensitivity. Using the RGB pixels with an infrared cut (IR-Cut) filter, good color reproducibility for visible lights up to a high saturation light intensity, as well as a high sensitivity performance for visible to Near-IR wavebands by using the W pixels without IR-Cut filter are obtained. The image sensor is a 1/3.3-inch optical format, 1280H × 480V pixels, 4.2-¿m effective pixel pitch with pixels placed along with 45° direction WRGB LOFIC CMOS image sensor. The wide DR property is 102-dB in one exposure.
• article_number: 5398511
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5398511
• html_url: https://ieeexplore.ieee.org/document/5398511/
• abstract_url: https://ieeexplore.ieee.org/document/5398511/
• publication_title: SENSORS, 2009 IEEE
• conference_location: Christchurch, New Zealand
• conference_dates: 25-28 Oct. 2009
• publication_number: 5379507
• is_number: 5398121
• publication_year: 2009
• publication_date: 25-28 Oct. 2009
• start_page: 1648
• end_page: 1651
• citing_paper_count: 3
• citing_patent_count: 1
• download_count: 1115
• insert_date: 20100122
• index_terms:
  • ieee_terms:
    • Dynamic range
    • CMOS image sensors
    • Pixel
    • Optical filters
    • Reproducibility of results
    • Optical imaging
    • Infrared image sensors
    • Capacitors
    • Capacitance
    • Image sensors
  • dynamic_index_terms:
    • Image Sensor
    • Camera Sensor
    • Visible Light
    • Visible Region
    • Visible Spectrum
    • Good Reproducibility
    • Good Image
    • Wave Band
    • RGB Pixel
    • Color Images
    • Highest Sensitivity
    • Checkers
    • Checkerboard Pattern
    • Color Filter
    • Microlenses
    • Micro Lens
• isbn_formats:
  • format: CD, value: 978-1-4244-5335-1, isbnType: New-2005
  • format: Print ISBN, value: 978-1-4244-4548-6, isbnType: New-2005
• authors:
  • Author Name: Shun Kawada
    Affiliation: Graduate School of Engineering, University of Tohoku, Sendai, Japan
    Author URL: https://ieeexplore.ieee.org/author/37395404600
    ID: 37395404600
    Order: 1
    Author Affiliations:
    • Graduate School of Engineering, University of Tohoku, Sendai, Japan
  • Author Name: Shin Sakai
    Affiliation: Graduate School of Engineering, University of Tohoku, Sendai, Japan
    Author URL: https://ieeexplore.ieee.org/author/37411486800
    ID: 37411486800
    Order: 2
    Author Affiliations:
    • Graduate School of Engineering, University of Tohoku, Sendai, Japan
  • Author Name: Nana Akahane
    Affiliation: Graduate School of Engineering, University of Tohoku, Sendai, Japan
    Author URL: https://ieeexplore.ieee.org/author/37296244800
    ID: 37296244800
    Order: 3
    Author Affiliations:
    • Graduate School of Engineering, University of Tohoku, Sendai, Japan
  • Author Name: Rihito Kuroda
    Affiliation: Graduate School of Engineering, University of Tohoku, Sendai, Japan
    Author URL: https://ieeexplore.ieee.org/author/37294742300
    ID: 37294742300
    Order: 4
    Author Affiliations:
    • Graduate School of Engineering, University of Tohoku, Sendai, Japan
  • Author Name: Shigetoshi Sugawa
    Affiliation: Graduate School of Engineering, University of Tohoku, Sendai, Japan
    Author URL: https://ieeexplore.ieee.org/author/37284703100
    ID: 37284703100
    Order: 5
    Author Affiliations:
    • Graduate School of Engineering, University of Tohoku, Sendai, Japan

Image Sensor

• sensor_type: CMOS
• resolution: 1280H × 480V
• dynamic_range: 102-dB
• pixel_size: 3.0-μmH × 6.0-μmV
• dark_current: 2.43-e- /s

Optical Data

• focal_length:
• aperture:
• field_of_view:
• distortion:

Performance Metrics

• frame_rate:
• signal_to_noise_ratio:
• sensitivity:
• shutter_speed:
• power_consumption:
• noise:

Applications & Benefits

• cell_imaging: Imaging of bio- and chemical-luminescence in ultraviolet and IR wavebands
• benefits: Good color reproducibility in visible light and high sensitivity for a wide waveband coverage from visible to Near-IR wavebands.

Supporting Organizations

• supported_by: Tohoku University

Manuscript Details

• publication_date: 25-28 Oct. 2009

Relevancy Score

• score: 10
• missing_fields:
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed
  • power_consumption

Processed JSON Filename

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