A Wide Dr And Linear Response Cmos Image Sensor With Three Photocurrent Integrations In Photodiodes Lateral Overflow Capacitors And Column Capacitors

• doi: 10.1109/ESSCIRC.2007.4430312
• title: A Wide DR and linear response CMOS image sensor with three photocurrent integrations in photodiodes, lateral overflow capacitors and column capacitors
• publisher: IEEE
• isbn: 978-1-4244-1125-2
• issn: 1930-8833
• partnum: 07EX1747
• rank: 987
• access_type: LOCKED
• content_type: Conferences
• abstract: A 1/3-inch, 800H times 600v pixels, 5.6 times 5.6 mum2 color CMOS image sensor with three photocurrent integrations in pixel photodiodes, pixel lateral overflow capacitors and column capacitors fabricated in a 0.18 mum 2P3M CMOS process has been reported. It achieves high S/N ratio and fully linear response and over 180 dB dynamic range performances in the incident light range from about 1.4times10-2 Ix to about 2.4times107 Ix.
• article_number: 4430312
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=4430312
• html_url: https://ieeexplore.ieee.org/document/4430312/
• abstract_url: https://ieeexplore.ieee.org/document/4430312/
• publication_title: ESSCIRC 2007 - 33rd European Solid-State Circuits Conference
• conference_location: Munich
• conference_dates: 11-13 Sept. 2007
• publication_number: 4430236
• is_number: 4430237
• publication_year: 2007
• publication_date: 11-13 Sept. 2007
• start_page: 336
• end_page: 339
• citing_paper_count: 1
• citing_patent_count: 0
• download_count: 228
• insert_date: 20080114
• index_terms:
  • ieee_terms:
    • Capacitors
    • CMOS image sensors
    • Photoconductivity
    • Photodiodes
    • Switches
    • Switching circuits
    • Computational fluid dynamics
    • Lab-on-a-chip
    • Pixel
    • Turning
  • dynamic_index_terms:
    • Photodiode
    • Linear Response
    • Image Sensor
    • Camera Sensor
    • Linear Sensor
    • Lateral Column
    • Wide Linear Response
    • Dynamic Range
    • Pixel Column
    • Operation Time
    • Random Noise
    • Channel Noise
    • Current Source
    • Current Regulations
    • Shot Noise
    • Poisson Noise
    • Integral Operator
    • Switching Point
    • Photoelectric Conversion
    • Mode Of Integration
    • Integration Period
    • Dark Noise
    • Logarithmic Method
    • Logging Methods
• isbn_formats:
  • format: Print ISBN, value: 978-1-4244-1125-2, isbnType: New-2005
• authors:
  • Author Name: Noriko Ide
    Affiliation: Graduate School of Engineering, University of Tohoku, Sendai, Japan
    Author URL: https://ieeexplore.ieee.org/author/37087368247
    ID: 37087368247
    Order: 1
    Author Affiliations:
    • Graduate School of Engineering, University of Tohoku, Sendai, Japan
  • Author Name: Woonghee Lee
    Affiliation: Graduate School of Engineering, University of Tohoku, Sendai, Japan
    Author URL: https://ieeexplore.ieee.org/author/37087488044
    ID: 37087488044
    Order: 2
    Author Affiliations:
    • Graduate School of Engineering, University of Tohoku, Sendai, Japan
  • Author Name: Nana Akahane
    Affiliation: Graduate School of Engineering, University of Tohoku, Sendai, Japan
    Author URL: https://ieeexplore.ieee.org/author/37087368098
    ID: 37087368098
    Order: 3
    Author Affiliations:
    • Graduate School of Engineering, University of Tohoku, Sendai, Japan
  • Author Name: Shigetoshi Sugawa
    Affiliation: Graduate School of Engineering, University of Tohoku, Sendai, Japan
    Author URL: https://ieeexplore.ieee.org/author/37087368710
    ID: 37087368710
    Order: 4
    Author Affiliations:
    • Graduate School of Engineering, University of Tohoku, Sendai, Japan

Image Sensor

• sensor_type: CMOS
• resolution: 800H × 600V
• dynamic_range: over 180 dB
• pixel_size: 5.6 × 5.6 µm2
• dark_current: not specified

Optical Data

• focal_length: not specified
• aperture: not specified
• field_of_view: not specified
• distortion: not specified

Performance Metrics

• signal_to_noise_ratio: high
• shutter_speed: 1/60s in first PD and LOC integration, 47.9 µs in second PD and LOC integration, 172 µs in column capacitor integration
• noise: 0.35 mVrms (5 e−) random noise, 0.35 mVrms (5 e−) FPN without image lag.

Applications & Benefits

• cell_imaging: not specified
• benefits: High quality digital still cameras, automotive, security, medical, and factory automation applications.

Supporting Organizations

• supported_by: Texas Instruments Japan.

Manuscript Details

• publication_date: 11-13 Sept. 2007

Relevancy Score

• score: 10
• missing_fields:
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • sensitivity
  • power_consumption
  • cell_imaging

Processed JSON Filename

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