A Variable Topology Partitioned Pixel Amplifier For Low And High Light Level Detection In A Cmos Imager

• doi: 10.1109/ICSENS.2010.5690140
• title: A variable topology partitioned pixel amplifier for low and high light level detection in a CMOS imager
• publisher: IEEE
• isbn: 978-1-4244-8168-2
• issn: 1930-0395
• partnum: 10CH38272
• rank: 1336
• access_type: LOCKED
• content_type: Conferences
• abstract: In this work the concept of using a single partitioned pixel amplifier with variable topology for both low light level operation and Wide Dynamic Range (WDR) for CMOS imagers is presented. Low light level imaging is based on the Active Reset (AR) technique combined with the Active Column Sensor (ACS) readout technique for low noise operation. WDR for high light level detection is achieved by utilizing multiple resets via real-time feedback where each pixel in the field of view is independent and can automatically set an exposure time according to its illumination. Due to the commonalities in the low and high light level readout techniques, and the fact that they occur in staggered instances of time, we propose the use of a single column level partitioned pixel amplifier which can be configured in various modes of operation to satisfy the conditions for the suggested techniques. We also propose a Conditional Active Reset (CAR) scheme in which an AR is employed for every reset in the multiple-reset WDR algorithm, thereby reducing the overall noise involved in the technique. The advantages of the proposed column level partitioned pixel amplifier are simplicity in the analog readout path, reduced chip size and less power consumption. The Variable Topology Amplifier was designed and simulated in a mixed signal 0.18 um CMOS technology. Its design is discussed and simulation results are presented.
• article_number: 5690140
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5690140
• html_url: https://ieeexplore.ieee.org/document/5690140/
• abstract_url: https://ieeexplore.ieee.org/document/5690140/
• publication_title: SENSORS, 2010 IEEE
• conference_location: Waikoloa, HI, USA
• conference_dates: 1-4 Nov. 2010
• publication_number: 5678851
• is_number: 5689839
• publication_year: 2010
• publication_date: 1-4 Nov. 2010
• start_page: 512
• end_page: 516
• citing_paper_count: 2
• citing_patent_count: 1
• download_count: 305
• insert_date: 20110120
• index_terms:
  • ieee_terms:
    • Pixel
    • Threshold voltage
    • CMOS integrated circuits
    • Noise
    • Topology
    • Transistors
    • Layout
  • dynamic_index_terms:
    • High Light
    • High Light Intensity
    • Low Light
    • Light Levels
    • Low Light Levels
    • Detection Of Low Levels
    • Power Consumption
    • Operation Mode
    • Low Noise
    • Mixed Signals
    • Single Column
    • Light Intensity
    • Integration Time
    • Photodiode
    • Botulinum
    • Botulinum Toxin
    • Botulinum Toxin Type A
    • Botulinum Neurotoxins
    • Botulism
    • Processing Elements
    • Threshold Voltage
    • Low Power Consumption
    • Comparable Yields
    • Comparator Output
    • Comparison Of Yield
    • Comparison Of Outputs
    • Pixel Array
    • High Illumination
    • Integration Period
    • Current Mirror
    • Reset Voltage
• isbn_formats:
  • format: Online ISBN, value: 978-1-4244-8168-2, isbnType: New-2005
  • format: Print ISBN, value: 978-1-4244-8170-5, isbnType: New-2005
  • format: Electronic ISBN, value: 978-1-4244-8169-9, isbnType: New-2005
• authors:
  • Author Name: Yonathan Dattner
    Affiliation: Electrical and Computer Engineering, University of Calgary, Calgary, AB, Canada
    Author URL: https://ieeexplore.ieee.org/author/38318355200
    ID: 38318355200
    Order: 1
    Author Affiliations:
    • Electrical and Computer Engineering, University of Calgary, Calgary, AB, Canada
  • Author Name: Orly Yadid-Pecht
    Affiliation: Electrical and Computer Engineering, University of Calgary, Calgary, AB, Canada
    Author URL: https://ieeexplore.ieee.org/author/38298354100
    ID: 38298354100
    Order: 2
    Author Affiliations:
    • Electrical and Computer Engineering, University of Calgary, Calgary, AB, Canada

Image Sensor

• sensor_type: CMOS
• resolution: 128x128 pixels
• dynamic_range: not specified
• pixel_size: 7 um
• dark_current: not specified

Optical Data

• focal_length: not specified
• aperture: not specified
• field_of_view: not specified
• distortion: not specified

Performance Metrics

• noise: reset noise is a main contributor to overall noise, but specific values not provided.

Applications & Benefits

• cell_imaging: used for fluorescence detection, e.g., botulinum neurotoxins detection.
• benefits: Low light and high light level detection in the same environment, with noise reduction techniques implemented.

Supporting Organizations

• supported_by: CMC Microsystems for design tools and fabrication services, MOSIS for fabrication opportunity.

Manuscript Details

• publication_date: 1-4 Nov. 2010

Relevancy Score

• score: 9
• missing_fields:
  • dynamic_range
  • dark_current
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed
  • power_consumption

Processed JSON Filename

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