A Universal Adc For Sensor Applications

• doi: 10.1109/3DIC48104.2019.9058782
• title: A Universal ADC for Sensor Applications
• publisher: IEEE
• isbn: 978-1-7281-4871-7
• issn:
• rank: 976
• access_type: LOCKED
• content_type: Conferences
• abstract: This paper proposes and discusses a universal ADC for sensor applications that can covers almost all sensor applications with one ADC. The combination of SAR ADC and incremental ASADC can cover high speed with low resolution and low noise with low speed applications with a unified ADC. Two prototype ADCs have been developed for general purpose sensing systems and for CMOS image sensors. The former ADC realized open-loop integrators using dynamic amplifiers. High SNR of 84 dB has been achieved and high FoMs over the 170 dB can be kept in wide signal frequency from 62.5 to 625 kHz and the power dissipation is scalable with sampling rate. The SAR+ΔΣADC for CMOS image sensor can reduce the noise down to 66 μV and realized small occupied area of 20 μm × 770 μm.
• article_number: 9058782
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9058782
• html_url: https://ieeexplore.ieee.org/document/9058782/
• abstract_url: https://ieeexplore.ieee.org/document/9058782/
• publication_title: 2019 International 3D Systems Integration Conference (3DIC)
• conference_location: Sendai, Japan
• conference_dates: 8-10 Oct. 2019
• publication_number: 9043388
• is_number: 9058772
• publication_year: 2019
• publication_date: 8-10 Oct. 2019
• start_page: 1
• end_page: 4
• citing_paper_count: 0
• citing_patent_count: 0
• download_count: 337
• insert_date: 20200409
• index_terms:
  • ieee_terms:
    • CMOS image sensors
    • Energy resolution
    • Optical switches
    • Capacitors
    • Voltage measurement
    • Signal resolution
  • dynamic_index_terms:
    • Sensor Applications
    • Low Resolution
    • Low Noise
    • Input Signal
    • Analog-to-digital Converter
    • Analog-to-digital
    • Digital-to-analog Converter
    • Digital Filter
    • Frequency Conversion
    • Quantization Noise
    • Voltage Noise
    • Trigger Pulse
• isbn_formats:
  • format: Print on Demand(PoD) ISBN, value: 978-1-7281-4871-7, isbnType: New-2005
  • format: Electronic ISBN, value: 978-1-7281-4870-0, isbnType: New-2005
• authors:
  • Author Name: Akira Matsuzawa
    Affiliation: Tech Idea Co., Ltd., 1-21-5-1, Shukugawara, Tamaku, Kawasaki, Japan
    Author URL: https://ieeexplore.ieee.org/author/37328684600
    ID: 37328684600
    Order: 1
    Author Affiliations:
    • Tech Idea Co., Ltd., 1-21-5-1, Shukugawara, Tamaku, Kawasaki, Japan

Image Sensor

• sensor_type: CMOS
• resolution: Not specified
• dynamic_range: 84 dB
• pixel_size: Not specified
• dark_current: Not specified

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

• signal_to_noise_ratio: 84 dB
• power_consumption: 257.8 μW
• noise: 66 μV

Applications & Benefits

• cell_imaging: The sensor is applicable in cell imaging, particularly in CMOS image sensors, providing lower noise and higher sensitivity.
• benefits: The ADC can cover high speed with low resolution and low noise with low speed applications, increasing design productivity.

Supporting Organizations

• supported_by: Tech Idea Co., Ltd.

Manuscript Details

• publication_date: 8-10 Oct. 2019

Relevancy Score

• score: 9
• missing_fields:
  • fill factor
  • quantum efficiency
  • readout speed
  • noise sources
  • analog-to-digital conversion techniques
  • design considerations
  • microlenses
  • on-chip colour filters
  • global or rolling shutters
  • backside illumination

Processed JSON Filename

request_a597d44e-06b3-4121-9f67-04258995efd5-a_universal_adc_for_sensor_applications.json