A Timeresolved Cmos Image Sensor With High Conversiongain Pixels And
Pipelined Adcs
- doi: 10.1109/MWSCAS.2017.8052845
-
title: A time-resolved CMOS image sensor with high
conversion-gain pixels and pipelined ADCs
- publisher: IEEE
- isbn: 978-1-5090-6390-1
- issn: 1558-3899
- rank: 1331
- access_type: LOCKED
- content_type: Conferences
-
abstract: This paper presents a CMOS image sensor with
high conversion-gain pixels and column-shared pipelined ADCs for
Fluorescence-lifetime imaging microscopy (FLIM). Pixel conversion gain
of 121 uV/e-is achieved by creating a distal floating diffusion from
transfer gate and reset transistor gate without any process
modification. 32-channel 10-bit on-chip column-shared pipelined ADCs
with sampling rate up to 5MS/s are designed using area-efficient ring
amplifiers for the sensor readout. The ring amplifiers are designed
based on actively-biased technique which reduces the area further by
40%. This image sensor chip is fabricated in a standard 180nm CMOS image
sensor (CIS) process.
- article_number: 8052845
-
pdf_url:
https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8052845
-
html_url:
https://ieeexplore.ieee.org/document/8052845/
-
abstract_url:
https://ieeexplore.ieee.org/document/8052845/
-
publication_title: 2017 IEEE 60th International Midwest
Symposium on Circuits and Systems (MWSCAS)
- conference_location: Boston, MA, USA
- conference_dates: 6-9 Aug. 2017
- publication_number: 8039346
- is_number: 8052834
- publication_year: 2017
- publication_date: 6-9 Aug. 2017
- start_page: 1
- end_page: 4
- citing_paper_count: 0
- citing_patent_count: 0
- download_count: 828
- insert_date: 20171002
-
index_terms:
-
ieee_terms:
- CMOS image sensors
- Logic gates
- Fluorescence
- Transistors
- Capacitance
-
author_terms:
- CMOS image sensor
- fluorescence-lifetime imaging microscopy (FLIM)
- high conversion gain
- pipelined ADC
- ring amplifier
-
dynamic_index_terms:
- Image Sensor
- Camera Sensor
- Time-resolved Imaging
- Fluorescence Lifetime Imaging Microscopy
- FLIM
- Fluorescence Lifetime Imaging
- Impedance
- Resistivity
- Photoelectron
- Photoelectric
- Reduction In Area
- Stable Process
- Parasitic Capacitance
- Pixel Pitch
- Single-photon Avalanche Diode
-
isbn_formats:
-
format: Print on Demand(PoD) ISBN,
value: 978-1-5090-6390-1,
isbnType: New-2005
-
format: USB ISBN,
value: 978-1-5090-6388-8,
isbnType: New-2005
-
format: Electronic ISBN,
value: 978-1-5090-6389-5,
isbnType: New-2005
-
authors:
-
Author Name: Song Chen
Affiliation: Thayer School of Engineering Dartmouth
College, Hanover, USA
Author URL:
https://ieeexplore.ieee.org/author/37086130621
ID: 37086130621
Order: 1
Author Affiliations:
-
Thayer School of Engineering Dartmouth College, Hanover, USA
-
Author Name: Eric R. Fossum
Affiliation: Thayer School of Engineering Dartmouth
College, Hanover, USA
Author URL:
https://ieeexplore.ieee.org/author/37326789400
ID: 37326789400
Order: 2
Author Affiliations:
-
Thayer School of Engineering Dartmouth College, Hanover, USA
Image Sensor
- sensor_type: CMOS
- resolution: 256(H)x128(V)
- dynamic_range: Not specified
- pixel_size: 5 um
- dark_current: Not specified
Optical Data
- focal_length: Not specified
- aperture: Not specified
- field_of_view: Not specified
- distortion: Not specified
Performance Metrics
- frame_rate: 5MS/s
- power_consumption: 228 mW
- noise: 2.52 e- rms (median)
Applications & Benefits
-
cell_imaging: Fluorescence-lifetime imaging microscopy
(FLIM) applications in life science research.
-
benefits: High sensitivity for detecting weak
fluorescence signals; accurate time resolution for resolving lifetimes
on the order of nanoseconds.
Supporting Organizations
-
supported_by: Thayer School of Engineering at
Dartmouth, Ph.D. Innovation Fellowship, discussion with X.Cao and others
at X-FAB, Center for Nanoscale Systems, Harvard University.
Manuscript Details
- publication_date: 6-9 Aug. 2017
Relevancy Score
- score: 9
-
missing_fields:
- dynamic_range
- fill_factor
- quantum_efficiency
- dark_current
- signal_to_noise_ratio
- sensitivity
- focal_length
- aperture
- field_of_view
- distortion
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