A Test Structure For Characterization Of Cmos Aps

• doi: 10.1109/ICM.2003.238501
• title: A test structure for characterization of CMOS APS
• publisher: IEEE
• isbn: 977-05-2010-1
• issn:
• partnum: 03EX686
• rank: 1320
• access_type: LOCKED
• content_type: Conferences
• abstract: A test structure to characterize CMOS APS image sensor is presented. Individual photodiodes and pixels as well as an image sensor array of 64/spl times/64 active pixels with selectable linear or logarithmic operation modes are designed. A test chip includes these features in addition to on-chip timing and control digital circuits as well as correlated double sampling have been built on a 0.6 /spl mu/m CMOS process. The test methodology and preliminary simulation results are presented.
• article_number: 1287746
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1287746
• html_url: https://ieeexplore.ieee.org/document/1287746/
• abstract_url: https://ieeexplore.ieee.org/document/1287746/
• publication_title: Proceedings of the 12th IEEE International Conference on Fuzzy Systems (Cat. No.03CH37442)
• conference_location: Cairo, Egypt
• conference_dates: 11-11 Dec. 2003
• publication_number: 9047
• is_number: 28700
• publication_year: 2003
• publication_date: 11-11 Dec. 2003
• start_page: 151
• end_page: 154
• citing_paper_count: 2
• citing_patent_count: 0
• download_count: 72
• insert_date: 20040419
• index_terms:
  • ieee_terms:
    • Circuit testing
    • CMOS image sensors
    • Image sensors
    • Pixel
    • Sensor arrays
    • Photodiodes
    • Timing
    • Digital control
    • Digital circuits
    • Image sampling
  • dynamic_index_terms:
    • Image Sensor
    • Camera Sensor
    • CMOS Process
    • Test Chip
    • Dynamic Range
    • Integration Time
    • Output Signal
    • Current Source
    • Current Regulations
    • Photodetector
    • Quantum Efficiency
    • Photocurrent
    • Spectral Response
    • Single Pixel
    • Dark Current
    • Uniform Illumination
• isbn_formats:
  • format: Print ISBN, value: 977-05-2010-1, isbnType: Historical
• authors:
  • Author Name: T.A. Elkhatib
    Affiliation: Faculty of Engineering, Cairo University, Egypt
    Author URL: https://ieeexplore.ieee.org/author/37584953900
    ID: 37584953900
    Order: 1
    Author Affiliations:
    • Faculty of Engineering, Cairo University, Egypt
  • Author Name: S. Moussa
    Affiliation: Faculty of Engineering, Ain Shams University, Egypt
    Author URL: https://ieeexplore.ieee.org/author/37284149000
    ID: 37284149000
    Order: 2
    Author Affiliations:
    • Faculty of Engineering, Ain Shams University, Egypt
  • Author Name: H.F. Ragaie
    Affiliation: Faculty of Engineering, Ain Shams University, Egypt
    Author URL: https://ieeexplore.ieee.org/author/37284146900
    ID: 37284146900
    Order: 3
    Author Affiliations:
    • Faculty of Engineering, Ain Shams University, Egypt
  • Author Name: H. Haddara
    Affiliation: MEMSCAP, Egypt
    Author URL: https://ieeexplore.ieee.org/author/37284146300
    ID: 37284146300
    Order: 4
    Author Affiliations:
    • MEMSCAP, Egypt

Image Sensor

• sensor_type: CMOS APS
• resolution: 64x64 pixels
• dynamic_range: 120 dB
• pixel_size: 20µm x 20µm
• dark_current: 13 fA

Optical Data

• focal_length:
• aperture:
• field_of_view:
• distortion:

Performance Metrics

• frame_rate:
• signal_to_noise_ratio:
• sensitivity:
• shutter_speed:
• power_consumption:
• noise:

Applications & Benefits

• cell_imaging: Applications in smartphones, medical devices, and automotive systems.
• benefits: Reduced cost and power dissipation due to integration on a single chip.

Supporting Organizations

• supported_by: Cairo University, Ain Shams University, MEMSCAP, Egypt.

Manuscript Details

• publication_date: 11-11 Dec. 2003

Relevancy Score

• score: 9
• missing_fields:
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed
  • power_consumption
  • noise

Processed JSON Filename

request_2285e15a-d7e3-454d-8342-d8df6bb6c08a-a_test_structure_for_characterization_of_cmos_aps.json