A Successiveapproximation Adc For Cmos Image Sensors
- doi: 10.1109/ICMCS.2011.5945569
-
title: A successive-approximation ADC for CMOS image
sensors
- publisher: IEEE
- isbn: 978-1-61284-731-3
- issn:
- partnum: 11TH9195
- rank: 1309
- access_type: LOCKED
- content_type: Conferences
-
abstract: The CMOS image sensors are achieving a
growing presence in today's mobile applications as the industry
acknowledges the advances of the CMOS-based technology and its scaling
possibilities. The roadmap recently unveiled for CMOS Image Sensor is
announcing ever smaller pixels, after 1.4μm pixel pitch, demos with a
pitch of 1.1μm were presented, and it also announces the future
generation of pixels with 0.9μm pixel size. This steady decrease in
pixel size has had a profound impact on sensors analog readout
electronics, and, in particular, on their ADC architecture. For mobile
applications, the ADCs are mostly placed in each column of image arrays,
as the width of each converter need to fit in the image array pitch. The
design becomes a true challenge as the available area for layout is very
critical. To overcome this limitation, a compromise between column level
and chip level ADCs can be used. A solution using a converter per 32
columns of the pixel array is proposed. The converter is a Successive
Approximation (SA) ADC of apparent resolution 12 bits and is obtained
from a 9 bits converter. This work presents a conversion architecture,
particularly well adapted to image sensors where the noise level varies
along with the amplitude of the useful signal. The proposed design
presents the benefit of increasing the number of bits of the ADC without
excessively increasing its complexity or its processing time. The
converter is designed in CMOS 65nm technology, and will be implemented
in a 5Megapixel sensor, at a sampling rate of 8.33MS/s. The simulations
show good linearity and verify the concept of the new architecture.
- article_number: 5945569
-
pdf_url:
https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5945569
-
html_url:
https://ieeexplore.ieee.org/document/5945569/
-
abstract_url:
https://ieeexplore.ieee.org/document/5945569/
-
publication_title: 2011 International Conference on
Multimedia Computing and Systems
- conference_location: Ouarzazate, Morocco
- conference_dates: 7-9 April 2011
- publication_number: 5931355
- is_number: 5945564
- publication_year: 2011
- publication_date: 7-9 April 2011
- start_page: 1
- end_page: 6
- citing_paper_count: 5
- citing_patent_count: 1
- download_count: 1879
- insert_date: 20110711
-
index_terms:
-
ieee_terms:
- Noise
- Pixel
- Sensors
- CMOS image sensors
- Capacitors
- Image resolution
- Approximation methods
-
author_terms:
- A/D conversion
- CMOS Image Sensors
- column-level ADC
- Successive Approximations ADC
- Differential Charge Redistribution DAC
- Fringe capacitor
-
dynamic_index_terms:
- Image Sensor
- Camera Sensor
- Signal Amplitude
- Array Images
- Array Tomography
- Successive Approximation
- Pixel Pitch
- Digital Camera
- Image Quality
- Time Constraints
- Power Consumption
- Input Signal
- Analog Signal
- Parallel Signaling
- Shot Noise
- Poisson Noise
- Output Stage
- Least Significant Bit
- Low Bit
- Most Significant Bit
- High Bit
- Highest Bit
- Mobile Camera
- Mobile Phone Camera
- Cell Phone Camera
- Capacitor Size
-
isbn_formats:
-
format: CD,
value: 978-1-61284-731-3,
isbnType: New-2005
-
format: Print ISBN,
value: 978-1-61284-730-6,
isbnType: New-2005
-
format: Electronic ISBN,
value: 978-1-61284-732-0,
isbnType: New-2005
-
authors:
-
Author Name: Malika Alami Marktani
Affiliation: IMAGING Division, STMicroelectronics,
Rabat, Morocco
Author URL:
https://ieeexplore.ieee.org/author/37713787700
ID: 37713787700
Order: 1
Author Affiliations:
- IMAGING Division, STMicroelectronics, Rabat, Morocco
-
Faculty of sciences and technology, Sidi Mohamed Ben Abdellah
University, Fes, Morocco
-
Author Name: Stephane Vivien
Affiliation: IMAGING Division, STMicroelectronics,
Grenoble, France
Author URL:
https://ieeexplore.ieee.org/author/37713788500
ID: 37713788500
Order: 2
Author Affiliations:
- IMAGING Division, STMicroelectronics, Grenoble, France
-
Author Name: Laurent Simony
Affiliation: IMAGING Division, STMicroelectronics,
Grenoble, France
Author URL:
https://ieeexplore.ieee.org/author/37713788400
ID: 37713788400
Order: 3
Author Affiliations:
- IMAGING Division, STMicroelectronics, Grenoble, France
-
Author Name: Ali Ahaitouf
Affiliation: Faculty of sciences and technology,
Sidi Mohamed Ben Abdellah University, Fes, Morocco
Author URL:
https://ieeexplore.ieee.org/author/37719246800
ID: 37719246800
Order: 4
Author Affiliations:
-
Faculty of sciences and technology, Sidi Mohamed Ben Abdellah
University, Fes, Morocco
-
Author Name: Abdelaziz Ahaitouf
Affiliation: Polydisciplinary Faculty, LIMAO
Laboratory, Taza, Morocco
Author URL:
https://ieeexplore.ieee.org/author/37719246900
ID: 37719246900
Order: 5
Author Affiliations:
- Polydisciplinary Faculty, LIMAO Laboratory, Taza, Morocco
Image Sensor
- sensor_type: CMOS
- resolution: 5 Megapixels (2624x1968)
- dynamic_range: Not specified
-
pixel_size: 1.4µm (and future developments down to
0.9µm)
- dark_current: Not specified
Optical Data
- focal_length: Not specified
- aperture: Not specified
- field_of_view: Not specified
- distortion: Not specified
Performance Metrics
- frame_rate: 30 frames/s
- power_consumption: 1.3548 mW
-
noise: Read noise and shot noise, specifics not
provided
Applications & Benefits
-
cell_imaging: Mobile applications such as digital still
cameras and smartphone cameras.
-
benefits: Improvement in noise performance and image
quality, compact design suitable for mobile applications.
Supporting Organizations
- supported_by: STMicroelectronics, CNRST Rabat
Manuscript Details
- publication_date: 7-9 April 2011
Relevancy Score
- score: 10
-
missing_fields:
- fill factor
- quantum efficiency
- readout speed
- temporal noise
- fixed-pattern noise
- microlenses
- on-chip colour filters
- global or rolling shutters
- backside illumination
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