A Study Of Stray Minority Carrier Diffusion In Cmos Image Sensors
- doi: 10.1109/LED.2008.917628
-
title: A Study of Stray Minority Carrier Diffusion in
CMOS Image Sensors
- publisher: IEEE
- isbn:
- issn: 1558-0563
- rank: 939
- access_type: LOCKED
- content_type: Journals
-
abstract: Noise minimization is an important issue for
a single-chip CMOS image sensor. Stray minority carriers diffusing from
the circuit region to the sensor array through the substrate are one
possible source of noise. To study this effect, an nMOS transistor was
deliberately placed close to the sensor array as a source of stray
minority carriers. The influence on the image quality was then examined
by varying the switching frequency applied to the transistor. The
results provide useful information for CMOS imager designs to eliminate
the effect of stray minority carrier diffusion.
- article_number: 4456050
-
pdf_url:
https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=4456050
-
html_url:
https://ieeexplore.ieee.org/document/4456050/
-
abstract_url:
https://ieeexplore.ieee.org/document/4456050/
- publication_title: IEEE Electron Device Letters
- conference_location:
- conference_dates:
- publication_number: 55
- is_number: 4475262
- publication_year: 2008
- publication_date: April 2008
- start_page: 341
- end_page: 343
- citing_paper_count: 2
- citing_patent_count: 0
- download_count: 384
- insert_date: 20080321
-
index_terms:
-
ieee_terms:
- CMOS image sensors
- Sensor arrays
- Image sensors
- MOSFETs
- CMOS technology
- CMOS digital integrated circuits
- Circuit testing
- Circuit noise
- Integrated circuit technology
- Pixel
-
author_terms:
- Penetration depth
- single-chip CMOS image sensors
- stray minority carrier diffusion
- Penetration depth
- single-chip CMOS image sensors
- stray minority carrier diffusion
-
dynamic_index_terms:
- Image Sensor
- Camera Sensor
- Minority Carrier
- Minority Carrier Diffusion
- Image Quality
- Switching Frequency
- Sensor Array
- Substrate Concentration
- Analog-to-digital Converter
- Analog-to-digital
- Digital-to-analog Converter
- Binary Image
- Diffusion Mechanism
- Dispersal Mechanisms
- Carrier Lifetime
- Inversion Layer
- Excess Carriers
- P-type Substrate
-
authors:
-
Author Name: Dong-Long Lin
Affiliation: Department of Electrical Engineering,
National Cheng Kung University, Tainan, Taiwan
Author URL:
https://ieeexplore.ieee.org/author/37531499400
ID: 37531499400
Order: 1
Author Affiliations:
-
Department of Electrical Engineering, National Cheng Kung
University, Tainan, Taiwan
-
Author Name: Ching-Chun Wang
Affiliation: Department of Electrical Engineering,
National Cheng Kung University, Tainan, Taiwan
Author URL:
https://ieeexplore.ieee.org/author/37440784200
ID: 37440784200
Order: 2
Author Affiliations:
-
Department of Electrical Engineering, National Cheng Kung
University, Tainan, Taiwan
-
Author Name: Chia-Ling Wei
Affiliation: Department of Electrical Engineering,
National Cheng Kung University, Tainan, Taiwan
Author URL:
https://ieeexplore.ieee.org/author/37419349600
ID: 37419349600
Order: 3
Author Affiliations:
-
Department of Electrical Engineering, National Cheng Kung
University, Tainan, Taiwan
Image Sensor
- sensor_type: CMOS
- resolution: 640x480
- dynamic_range: Not provided
- pixel_size: 3.3x3.3 µm
- dark_current: Not provided
Optical Data
- focal_length: Not provided
- aperture: Not provided
- field_of_view: Not provided
- distortion: Not provided
Performance Metrics
- frame_rate: Not provided
- signal_to_noise_ratio: Not provided
- sensitivity: Not provided
- shutter_speed: Not provided
- power_consumption: Not provided
- noise: Not provided
Applications & Benefits
-
cell_imaging: High-end imaging applications,
particularly for digital pixel design, are highlighted.
-
benefits: Minimizing stray minority carrier diffusion
to enhance image quality.
Supporting Organizations
- supported_by: Not provided
Manuscript Details
- publication_date: April 2008
Relevancy Score
- score: 10
-
missing_fields:
- dynamic_range
- dark_current
- focal_length
- aperture
- field_of_view
- distortion
- frame_rate
- signal_to_noise_ratio
- sensitivity
- shutter_speed
- power_consumption
- noise
Processed JSON Filename
request_67b3645e-218b-45bc-956b-2fd9fcd647ba-a_study_of_stray_minority_carrier_diffusion_in_cmos_image_sensors.json