A Spadbased Qvga Image Sensor For Singlephoton Counting And Quanta Imaging

• doi: 10.1109/TED.2015.2464682
• title: A SPAD-Based QVGA Image Sensor for Single-Photon Counting and Quanta Imaging
• publisher: IEEE
• isbn:
• issn: 1557-9646
• rank: 910
• access_type: LOCKED
• content_type: Journals
• abstract: A CMOS single-photon avalanche diode (SPAD)-based quarter video graphics array image sensor with 8-μm pixel pitch and 26.8% fill factor (FF) is presented. The combination of analog pixel electronics and scalable shared-well SPAD devices facilitates high-resolution, high-FF SPAD imaging arrays exhibiting photon shot-noise-limited statistics. The SPAD has 47 counts/s dark count rate at 1.5 V excess bias (EB), 39.5% photon detection probability (PDP) at 480 nm, and a minimum of 1.1 ns dead time at 1 V EB. Analog single-photon counting imaging is demonstrated with maximum 14.2-mV/SPAD event sensitivity and 0.06e- minimum equivalent read noise. Binary quanta image sensor (QIS) 16-kframes/s real-time oversampling is shown, verifying single-photon QIS theory with 4.6× overexposure latitude and 0.168e- read noise.
• article_number: 7247713
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7247713
• html_url: https://ieeexplore.ieee.org/document/7247713/
• abstract_url: https://ieeexplore.ieee.org/document/7247713/
• publication_title: IEEE Transactions on Electron Devices
• conference_location:
• conference_dates:
• publication_number: 16
• is_number: 7365508
• publication_year: 2016
• publication_date: Jan. 2016
• start_page: 189
• end_page: 196
• citing_paper_count: 107
• citing_patent_count: 0
• download_count: 4417
• insert_date: 20150909
• index_terms:
  • ieee_terms:
    • Image sensors
    • Arrays
    • Radiation detectors
    • Noise
    • Photonics
  • author_terms:
    • Charge transfer amplifier (CTA) counter
    • CMOS single-photon avalanche diode (SPAD)
    • quanta image sensor (QIS)
    • single-photon counting (SPC)
    • switched current source (SCS) counter.
    • Charge transfer amplifier (CTA) counter
    • CMOS single-photon avalanche diode (SPAD)
    • quanta image sensor (QIS)
    • single-photon counting (SPC)
    • switched current source (SCS) counter
  • dynamic_index_terms:
    • Image Sensor
    • Camera Sensor
    • Binary Image
    • Dead Time
    • Array Images
    • Array Tomography
    • Pixel Pitch
    • Single-photon Avalanche Diode
    • Dark Count Rate
    • Exposure Time
    • Image Pixels
    • Frame Rate
    • High Noise
    • Inverter
    • Boolean Operators
    • Binary Operation
    • Picosecond
    • Photon Counting
    • Bitplane
    • Shot Noise
    • Poisson Noise
    • Voltage Step
    • Fluorescence Lifetime Imaging Microscopy
    • FLIM
    • Fluorescence Lifetime Imaging
    • Time-to-digital Converter
    • Dynamic Memory
    • High Fill Factor
    • Static Power Consumption
    • Pixel Array
    • Silicon Photomultiplier
    • SiPM
    • Timing Gates
    • High Spatial Resolution Images
    • Maximum Sensitivity
    • Time-of-flight
• authors:
  • Author Name: Neale A. W. Dutton
    Affiliation: Imaging Division, STMicroelectronics, Edinburgh, EH12 7BF, U.K.
    Author URL: https://ieeexplore.ieee.org/author/37085348973
    ID: 37085348973
    Order: 1
    Author Affiliations:
    • Imaging Division, STMicroelectronics, Edinburgh, EH12 7BF, U.K.
  • Author Name: Istvan Gyongy
    Affiliation: CMOS Sensors and Systems Group, The University of Edinburgh, Edinburgh, U.K.
    Author URL: https://ieeexplore.ieee.org/author/37085649005
    ID: 37085649005
    Order: 2
    Author Affiliations:
    • CMOS Sensors and Systems Group, The University of Edinburgh, Edinburgh, U.K.
  • Author Name: Luca Parmesan
    Affiliation: Imaging Division, STMicroelectronics, Edinburgh, EH12 7BF, U.K.
    Author URL: https://ieeexplore.ieee.org/author/37085347023
    ID: 37085347023
    Order: 3
    Author Affiliations:
    • Imaging Division, STMicroelectronics, Edinburgh, EH12 7BF, U.K.
  • Author Name: Salvatore Gnecchi
    Affiliation: Imaging Division, STMicroelectronics, Edinburgh, EH12 7BF, U.K.
    Author URL: https://ieeexplore.ieee.org/author/37085645557
    ID: 37085645557
    Order: 4
    Author Affiliations:
    • Imaging Division, STMicroelectronics, Edinburgh, EH12 7BF, U.K.
  • Author Name: Neil Calder
    Affiliation: CMOS Sensors and Systems Group, The University of Edinburgh, Edinburgh, U.K.
    Author URL: https://ieeexplore.ieee.org/author/38094169100
    ID: 38094169100
    Order: 5
    Author Affiliations:
    • CMOS Sensors and Systems Group, The University of Edinburgh, Edinburgh, U.K.
  • Author Name: Bruce R. Rae
    Affiliation: The University of Edinburgh, Edinburgh, U.K.
    Author URL: https://ieeexplore.ieee.org/author/37295960200
    ID: 37295960200
    Order: 6
    Author Affiliations:
    • The University of Edinburgh, Edinburgh, U.K.
  • Author Name: Sara Pellegrini
    Affiliation: The University of Edinburgh, Edinburgh, U.K.
    Author URL: https://ieeexplore.ieee.org/author/37689186200
    ID: 37689186200
    Order: 7
    Author Affiliations:
    • The University of Edinburgh, Edinburgh, U.K.
  • Author Name: Lindsay A. Grant
    Affiliation: The University of Edinburgh, Edinburgh, U.K.
    Author URL: https://ieeexplore.ieee.org/author/37268638300
    ID: 37268638300
    Order: 8
    Author Affiliations:
    • The University of Edinburgh, Edinburgh, U.K.
  • Author Name: Robert K. Henderson
    Affiliation: CMOS Sensors and Systems Group, The University of Edinburgh, Edinburgh, U.K.
    Author URL: https://ieeexplore.ieee.org/author/37294086900
    ID: 37294086900
    Order: 9
    Author Affiliations:
    • CMOS Sensors and Systems Group, The University of Edinburgh, Edinburgh, U.K.

Image Sensor

• sensor_type: CMOS
• resolution: 320x240
• dynamic_range: Not specified
• pixel_size: 8 µm
• dark_current: 47 counts/s at 1.5 V excess bias (EB)

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

• frame_rate: 16 kframes/s
• signal_to_noise_ratio: 54 dB peak SNR at 10.0H
• sensitivity: 14.2 mV/SPAD event
• noise: 0.06 e− equivalent read noise

Applications & Benefits

• cell_imaging: Fluorescence lifetime imaging microscopy (FLIM), 3-D vision, and various other optical applications
• benefits: Single-photon sensitivity and high-resolution imaging

Supporting Organizations

• supported_by: European Research Council (ERC) through the EU’s Seventh Framework Programme, STMicroelectronics

Manuscript Details

• publication_date: Jan. 2016

Relevancy Score

• score: 10
• missing_fields:
  • dynamic_range
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • power_consumption

Processed JSON Filename

request_3c0bc82a-d384-44de-b72b-185359dd1759-a_spadbased_qvga_image_sensor_for_singlephoton_counting_and_quanta_imaging.json