A Smart Position Sensor With Row Parallel Position Detection For High Speed 3D Measurement

• doi:
• title: A smart position sensor with row parallel position detection for high speed 3-D measurement
• publisher: IEEE
• isbn:
• issn:
• rank: 1303
• access_type: LOCKED
• content_type: Conferences
• abstract: In this paper, we propose a new image scanning method using row parallel binary-trees as data paths to image data. Using the scan method, we can detect position of projected sheet light in parallel in each row. We propose an efficient implementation method of row parallel binary-tree scan and developed a smart position sensor for 3-D measurement using a 0.35µm CMOS 3-metal 2- poly-Si process. The sensor has a 128×128 pixel array, an address decoder, a scan controller on a 4.9mm × 4.9mm die. We have developed a 3-D measurement system using a fabricated sensor, and measured the 3-D feature of moving objects at 12 rangemaps/s. By the results of circuit simulation, the maximum speed of 3-D measurement using row parallel binary-tree scan is 600 rangemaps/s.
• article_number: 1471476
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1471476
• html_url: https://ieeexplore.ieee.org/document/1471476/
• abstract_url: https://ieeexplore.ieee.org/document/1471476/
• publication_title: Proceedings of the 28th European Solid-State Circuits Conference
• conference_location: Florence, Italy
• conference_dates: 24-26 Sept. 2002
• publication_number: 9921
• is_number: 31530
• publication_year: 2002
• publication_date: 24-26 Sept. 2002
• start_page: 101
• end_page: 104
• citing_paper_count: 1
• citing_patent_count: 0
• download_count: 90
• insert_date: 20050801
• index_terms:
  • ieee_terms:
    • Intelligent sensors
    • Position measurement
    • Velocity measurement
    • Image sensors
    • Sensor arrays
    • Data engineering
    • CMOS image sensors
    • CMOS process
    • Decoding
    • Sensor systems
  • dynamic_index_terms:
    • High Speed
    • Sensor Locations
    • Position Sensor
    • Row Parallel
    • Scanning Method
    • Smart Sensors
    • Pixel Array
    • Parallel Light
    • High-resolution
    • Photodetector
    • Grayscale Images
    • Greyscale Images
    • Binary Image
    • Photocurrent
    • Measurement Setup
    • Measurement Apparatus
    • Image Sensor
    • Camera Sensor
    • Raster Scan
    • Output Of Step
    • Conventional Scanning
    • Host Computer
    • OR Gate
    • Sensor Pixel
    • Conventional Column
    • Complete Circuit
• authors:
  • Author Name: T. Nezuka
    Affiliation: Department of Electronic Engineering, University of Tokyo, Tokyo, Japan
    Author URL: https://ieeexplore.ieee.org/author/37294386700
    ID: 37294386700
    Order: 1
    Author Affiliations:
    • Department of Electronic Engineering, University of Tokyo, Tokyo, Japan
  • Author Name: M. Ikeada
    Affiliation: Department of Electronic Engineering, University of Tokyo, Tokyo, Japan
    Author URL: https://ieeexplore.ieee.org/author/37088020954
    ID: 37088020954
    Order: 2
    Author Affiliations:
    • Department of Electronic Engineering, University of Tokyo, Tokyo, Japan
  • Author Name: K. Asada
    Affiliation: Department of Electronic Engineering, University of Tokyo, Tokyo, Japan
    Author URL: https://ieeexplore.ieee.org/author/37273906700
    ID: 37273906700
    Order: 3
    Author Affiliations:
    • Department of Electronic Engineering, University of Tokyo, Tokyo, Japan

Image Sensor

• sensor_type: CMOS
• resolution: 128x128
• dynamic_range: Not specified
• pixel_size: 19.5µm
• dark_current: Not specified

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

• frame_rate: 12 rangemaps/s (maximum theoretical: 593 rangemaps/s with 1024x1024 pixels)
• shutter_speed: Integration time: 200µs
• power_consumption: 344mW (@Vdd=3.3V, 44.4M cycles/s)

Applications & Benefits

• cell_imaging: Not specified
• benefits: High speed and high resolution 3-D measurement using row parallel binary-tree scan method.

Supporting Organizations

• supported_by: University of Tokyo

Manuscript Details

• publication_date: 24-26 Sept. 2002

Relevancy Score

• score: 9
• missing_fields:
  • dynamic_range
  • dark_current
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • signal_to_noise_ratio
  • sensitivity
  • noise
  • cell_imaging

Processed JSON Filename

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