A Singlephotonavalanchediode 3D Imager

• doi: 10.1109/ESSCIR.2005.1541666
• title: A single-photon-avalanche-diode 3D imager
• publisher: IEEE
• isbn: 0-7803-9205-1
• issn: 1930-8833
• partnum: 05EX1088
• rank: 1297
• access_type: LOCKED
• content_type: Conferences
• abstract: This paper describes the design and characterization of a 64-pixel array exploiting the high sensitivity offered by single photon avalanche diodes, fabricated in a conventional high-voltage 0.8/spl mu/m CMOS technology, and aimed at three dimensional measurements using the time-of-flight technique. The detection of the incident light signals is performed using a photodiode biased above its breakdown voltage so that an extremely high sensitivity can be achieved exploiting the intrinsic multiplication effect of the avalanche phenomenon. A single photon avalanche diode and dedicated read-out electronics for the arrival-time estimation of incident light pulses have been implemented in a 38/spl times/180-/spl mu/m/sup 2/ pixel. To increase the distance measurement resolution a multiple pulse measurement is used, extracting the mean value of the light pulse arrival-time directly in each pixel; this innovative approach dramatically reduces the dead-time of the pixel read-out, allowing a high frame rate imaging to be achieved. The sensor array provides a range map from 2m to 5m with a precision better than /spl mu/m 0.75% without any external averaging operation.
• article_number: 1541666
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1541666
• html_url: https://ieeexplore.ieee.org/document/1541666/
• abstract_url: https://ieeexplore.ieee.org/document/1541666/
• publication_title: Proceedings of the 31st European Solid-State Circuits Conference, 2005. ESSCIRC 2005.
• conference_location: Grenoble, France
• conference_dates: 12-16 Sept. 2005
• publication_number: 10265
• is_number: 32889
• publication_year: 2005
• publication_date: 12-16 Sept. 2005
• start_page: 487
• end_page: 490
• citing_paper_count: 14
• citing_patent_count: 4
• download_count: 426
• insert_date: 20051205
• index_terms:
  • ieee_terms:
    • Pulse measurements
    • Sensor arrays
    • Diodes
    • CMOS technology
    • Pixel
    • Photonics
    • CMOS image sensors
    • Photodiodes
    • Distance measurement
    • Image resolution
  • dynamic_index_terms:
    • 3D Images
    • Single-photon Avalanche Diode
    • Distancing Measures
    • Frame Rate
    • Light Pulses
    • Dimensional Measures
    • CMOS Technology
    • Range Maps
    • Avalanche Diode
    • Single Diode
    • Extinction
    • Quenching
    • Bias Voltage
    • Counting Time
    • Avalanche Photodiode
    • Dark Count
    • Current Mirror
    • Dark Count Rate
• isbn_formats:
  • format: Print ISBN, value: 0-7803-9205-1, isbnType: Historical
• authors:
  • Author Name: D. Stoppa
    Affiliation: Centre for Scientific and Technological Research, ITC IRST, Trento, Italy
    Author URL: https://ieeexplore.ieee.org/author/37268553400
    ID: 37268553400
    Order: 1
    Author Affiliations:
    • Centre for Scientific and Technological Research, ITC IRST, Trento, Italy
  • Author Name: L. Pancheri
    Affiliation: Department of Information and Communication Technologies, University of Trento, Trento, Italy
    Author URL: https://ieeexplore.ieee.org/author/37282907500
    ID: 37282907500
    Order: 2
    Author Affiliations:
    • Department of Information and Communication Technologies, University of Trento, Trento, Italy
  • Author Name: M. Scandiuzzo
    Affiliation: Centre for Scientific and Technological Research, ITC IRST, Trento, Italy
    Author URL: https://ieeexplore.ieee.org/author/37299461700
    ID: 37299461700
    Order: 3
    Author Affiliations:
    • Centre for Scientific and Technological Research, ITC IRST, Trento, Italy
  • Author Name: M. Malfatti
    Affiliation: Centre for Scientific and Technological Research, ITC IRST, Trento, Italy
    Author URL: https://ieeexplore.ieee.org/author/37268560400
    ID: 37268560400
    Order: 4
    Author Affiliations:
    • Centre for Scientific and Technological Research, ITC IRST, Trento, Italy
  • Author Name: G. Pedretti
    Affiliation: Centre for Scientific and Technological Research, ITC IRST, Trento, Italy
    Author URL: https://ieeexplore.ieee.org/author/37268559300
    ID: 37268559300
    Order: 5
    Author Affiliations:
    • Centre for Scientific and Technological Research, ITC IRST, Trento, Italy
  • Author Name: L. Gonzo
    Affiliation: Centre for Scientific and Technological Research, ITC IRST, Trento, Italy
    Author URL: https://ieeexplore.ieee.org/author/37268562300
    ID: 37268562300
    Order: 6
    Author Affiliations:
    • Centre for Scientific and Technological Research, ITC IRST, Trento, Italy

Image Sensor

• sensor_type: CMOS
• resolution: 64 pixels array
• dynamic_range: not specified
• pixel_size: 38µm x 180µm
• dark_current: <1 kHz at maximum excess bias voltage (negligible for the considered application)

Optical Data

• focal_length: not specified
• aperture: not specified
• field_of_view: not specified
• distortion: not specified

Performance Metrics

• frame_rate: 30 fps (real-time operation)
• power_consumption: 1mW @ 10 kHz light pulses

Applications & Benefits

• cell_imaging: The system is designed for 3D imaging applications which can include cell imaging in biological research.
• benefits: High sensitivity, low-cost, and high-speed imaging systems for various applications like fluorescence decay analysis and distance measurements.

Supporting Organizations

• supported_by: ITC-irst, University of Trento

Manuscript Details

• publication_date: 12-16 Sept. 2005

Relevancy Score

• score: 9
• missing_fields:
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed
  • noise

Processed JSON Filename

request_6d77c172-f9eb-4105-84be-a2f516e37d62-a_singlephotonavalanchediode_3d_imager.json