A Simple And Robust Selfreset Cmos Image Sensor
- doi: 10.1109/MWSCAS.2010.5548918
-
title: A simple and robust self-reset CMOS image sensor
- publisher: IEEE
- isbn: 978-1-4244-7772-2
- issn: 1548-3746
- partnum: 10CH38261
- rank: 1285
- access_type: LOCKED
- content_type: Conferences
-
abstract: A simple and robust self-reset pixel-level
CMOS image sensor (CIS) has been designed and tested to verify the
improvement of the signal-to-noise ratio (SNR) compare to the
conventional asynchronous self-reset pixel-level CISs. It significantly
reduces noise accumulation from multiple self-resets by replacing a
comparator and redundant regenerative modules with a simple Schmitt
trigger circuit.
- article_number: 5548918
-
pdf_url:
https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5548918
-
html_url:
https://ieeexplore.ieee.org/document/5548918/
-
abstract_url:
https://ieeexplore.ieee.org/document/5548918/
-
publication_title: 2010 53rd IEEE International Midwest
Symposium on Circuits and Systems
- conference_location: Seattle, WA, USA
- conference_dates: 1-4 Aug. 2010
- publication_number: 5542407
- is_number: 5548547
- publication_year: 2010
- publication_date: 1-4 Aug. 2010
- start_page: 680
- end_page: 683
- citing_paper_count: 4
- citing_patent_count: 0
- download_count: 314
- insert_date: 20100816
-
index_terms:
-
ieee_terms:
- CMOS image sensors
- Noise robustness
- Pixel
- Signal to noise ratio
- Computational Intelligence Society
- Signal design
- Circuit testing
- Automatic testing
- Noise reduction
- Circuit noise
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author_terms:
- CMOS image sensor
- CIS
- SNR
- Schmitt trigger
-
dynamic_index_terms:
- Image Sensor
- Camera Sensor
- Robust Sensor
- Light Intensity
- Threshold Voltage
- Voltage Difference
- Voltage Deviation
- Supply Voltage
- Fill Factor
- Low Light Intensity
- Shot Noise
- Poisson Noise
- P-n Junction
- Signal-to-noise Ratio Increases
- Node Voltage
- Signal-to-noise Ratio Improvement
- Voltage Hysteresis
- Reset Voltage
- SPICE Simulations
-
isbn_formats:
-
format: CD,
value: 978-1-4244-7772-2,
isbnType: New-2005
-
format: Print ISBN,
value: 978-1-4244-7771-5,
isbnType: New-2005
-
format: Electronic ISBN,
value: 978-1-4244-7773-9,
isbnType: New-2005
-
authors:
-
Author Name: Dongwon Park
Affiliation: LG Display, Paju, South Korea
Author URL:
https://ieeexplore.ieee.org/author/37275454500
ID: 37275454500
Order: 1
Author Affiliations:
- LG Display, Paju, South Korea
-
Author Name: Youngjoong Joo
Affiliation: Department of Electrical and Computer
Engineering, UTSA, San Antonio, USA
Author URL:
https://ieeexplore.ieee.org/author/37273019200
ID: 37273019200
Order: 2
Author Affiliations:
-
Department of Electrical and Computer Engineering, UTSA, San
Antonio, USA
-
Author Name: Santosh Koppa
Affiliation: Department of Electrical and Computer
Engineering, UTSA, San Antonio, USA
Author URL:
https://ieeexplore.ieee.org/author/37541162100
ID: 37541162100
Order: 3
Author Affiliations:
-
Department of Electrical and Computer Engineering, UTSA, San
Antonio, USA
Image Sensor
- sensor_type: CMOS
- resolution: N/A
- dynamic_range: 46 dB
- pixel_size: 35.7 µm x 35.7 µm
- dark_current: N/A
Optical Data
- focal_length: N/A
- aperture: N/A
- field_of_view: N/A
- distortion: N/A
Performance Metrics
- frame_rate: N/A
-
signal_to_noise_ratio: Increase rate of 20 dB per
decade in low light, saturates after around 1 W/m2 irradiance.
- sensitivity: N/A
- shutter_speed: N/A
-
power_consumption: Low power due to dynamic behavior of
circuits
-
noise: Includes kT/C reset noise and self-reset noise
accumulation.
Applications & Benefits
-
cell_imaging: The sensor enhances imaging capabilities
in various applications including smartphones, medical devices, and
automotive systems.
-
benefits: Increased dynamic range and signal-to-noise
ratio, reduced complexity of the self-reset circuit.
Supporting Organizations
- supported_by: LG Display, UTSA
Manuscript Details
- publication_date: 1-4 Aug. 2010
Relevancy Score
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