A Second Generation 3D Integrated Featureextracting Image Sensor

• doi: 10.1109/ICSENS.2011.6127291
• title: A second generation 3D integrated feature-extracting image sensor
• publisher: IEEE
• isbn: 978-1-4244-9288-6
• issn: 1930-0395
• partnum: 11CH38800
• rank: 1271
• access_type: LOCKED
• content_type: Conferences
• abstract: This paper presents a second generation 3D integrated feature-extracting CMOS image sensor. This 64×96 pixel vision sensor was designed and fabricated using a 0.18 μm 3D FDSOI process. Each pixel implements a photodiode and computation circuits on three individual tiers, which are vertically stacked and connected through the 3D inter-tier vias. The photodiode is sited on the top tier with an optimized photo sensitivity and a high fill factor (~97%). The in-pixel analog memory and a parallel diffuser network allow this image sensor to store the previous frame image and perform a spatially smoothing operation. Hence, the proposed image sensor can deliver an intensity image, either the previous frame or the smoothed image. Using off-chip subtraction, image features including temporal motions and spatial contours can be easily extracted. Moreover, the power consumption for this image sensor is around 0.8mW at 100 fps. The low power consumption and feature extraction capability make this sensor appealing for the sensor network applications.
• article_number: 6127291
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6127291
• html_url: https://ieeexplore.ieee.org/document/6127291/
• abstract_url: https://ieeexplore.ieee.org/document/6127291/
• publication_title: SENSORS, 2011 IEEE
• conference_location: Limerick, Ireland
• conference_dates: 28-31 Oct. 2011
• publication_number: 6114955
• is_number: 6126898
• publication_year: 2011
• publication_date: 28-31 Oct. 2011
• start_page: 1933
• end_page: 1936
• citing_paper_count: 3
• citing_patent_count: 0
• download_count: 396
• insert_date: 20120112
• index_terms:
  • ieee_terms:
    • Image edge detection
    • Complexity theory
    • Photodiodes
    • Three dimensional displays
    • Arrays
    • Semiconductor device measurement
    • Tracking
  • dynamic_index_terms:
    • Image Sensor
    • Camera Sensor
    • 3D Integration
    • Power Consumption
    • Image Intensity
    • Low Power Consumption
    • Fill Factor
    • Previous Frame
    • Top-tier
    • Vision Sensors
    • Smooth Operation
    • High Fill Factor
    • Impedance
    • Resistivity
    • Image Processing
    • Low-pass
    • Low-pass Filter
    • Images Of Samples
    • Raw Images
    • System Architecture
    • Focal Plane
    • Back Focal Plane
    • Motion Detection
    • Motion Sensors
    • Memory Network
    • Motion Features
    • Motion Characteristics
    • Operational Amplifier
    • Op-amp
    • Resistance Network
    • Neighboring Pixels
    • Neighborhood Pixels
    • Illumination Intensity
    • Low Fill Factor
    • Temporal Contrast
• isbn_formats:
  • format: CD, value: 978-1-4244-9288-6, isbnType: New-2005
  • format: Print ISBN, value: 978-1-4244-9290-9, isbnType: New-2005
  • format: Electronic ISBN, value: 978-1-4244-9289-3, isbnType: New-2005
• authors:
  • Author Name: Xiangyu Zhang
    Affiliation: School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore
    Author URL: https://ieeexplore.ieee.org/author/37834458100
    ID: 37834458100
    Order: 1
    Author Affiliations:
    • School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore
  • Author Name: Shoushun Chen
    Affiliation: School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore
    Author URL: https://ieeexplore.ieee.org/author/37535877300
    ID: 37535877300
    Order: 2
    Author Affiliations:
    • School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore
  • Author Name: Eugenio Culurciello
    Affiliation: Electrical Engineering Department, Yale University, USA
    Author URL: https://ieeexplore.ieee.org/author/37268496400
    ID: 37268496400
    Order: 3
    Author Affiliations:
    • Electrical Engineering Department, Yale University, USA

Image Sensor

• sensor_type: CMOS
• resolution: 64x96 pixels
• dynamic_range: Not explicitly stated
• pixel_size: 14x14 µm
• dark_current: ~2.6 fA

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

• frame_rate: 100 fps (max 160 fps)
• signal_to_noise_ratio: Not explicitly stated
• power_consumption: 0.8 mW at 75 fps
• noise: Fixed Pattern Noise 3.5%

Applications & Benefits

• cell_imaging: Not specified
• benefits: Low power consumption and feature extraction capabilities make this sensor appealing for sensor network applications.

Supporting Organizations

• supported_by: Nanyang Technological University, Yale University

Manuscript Details

• publication_date: 28-31 Oct. 2011

Relevancy Score

• score: 10
• missing_fields:
  • quantum_efficiency
  • readout_speed
  • temporal_noise
  • analog_to_digital_conversion
  • microlenses
  • on_chip_colour_filters
  • global_or_rolling_shutters
  • backside_illumination

Processed JSON Filename

request_98295ad1-c80a-4cb9-ac35-7b7922ab94dd-a_second_generation_3d_integrated_featureextracting_image_sensor.json