A Review Of Cmos Photodiode Modeling And The Role Of The Lateral Photoresponse

• doi: 10.1109/TED.2015.2446204
• title: A Review of CMOS Photodiode Modeling and the Role of the Lateral Photoresponse
• publisher: IEEE
• isbn:
• issn: 1557-9646
• rank: 905
• access_type: LOCKED
• content_type: Journals
• abstract: The CMOS photodiode is the primary photosensing device used in solid-state image sensors. A review of significant CMOS photodiode models that can be found in the literature in recent years is presented here. We have focused on photocurrent models in one, two, and three dimensions, paying special attention to lateral current components. Lateral collection, particularly for small devices fabricated in deep submicrometer technologies, has been shown to be of utmost importance. Finally, several models to account for crosstalk effects are also described.
• article_number: 7152895
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7152895
• html_url: https://ieeexplore.ieee.org/document/7152895/
• abstract_url: https://ieeexplore.ieee.org/document/7152895/
• publication_title: IEEE Transactions on Electron Devices
• conference_location:
• conference_dates:
• publication_number: 16
• is_number: 7365508
• publication_year: 2016
• publication_date: Jan. 2016
• start_page: 16
• end_page: 25
• citing_paper_count: 12
• citing_patent_count: 0
• download_count: 1455
• insert_date: 20150708
• index_terms:
  • ieee_terms:
    • Photodiodes
    • Semiconductor device modeling
    • Mathematical model
    • CMOS integrated circuits
    • Analytical models
    • Integrated circuit modeling
    • Photoconductivity
  • author_terms:
    • CMOS photodiode
    • crosstalk
    • lateral current
    • modeling
    • simulation.
    • CMOS photodiode
    • crosstalk
    • lateral current
    • modeling
    • simulation
  • dynamic_index_terms:
    • Image Sensor
    • Camera Sensor
    • Crosstalk Effects
    • Solid-state Sensors
    • Numerical Simulations
    • Numerical Model
    • Active Area
    • 2D Model
    • Diffusion Equation
    • Total Current
    • Depletion Region
    • Space Charge Region
    • Depletion Layer
    • Depletion Zone
    • Electrical Components
    • Optical Components
    • P-n Junction
    • CMOS Technology
    • Circuit Simulation
    • Lateral Diffusion
    • Compact Model
    • CMOS Process
    • Modulation Transfer Function
    • Optical Transfer Function
    • Minority Carrier
    • Device Simulation
    • Semi-analytical Model
    • PIN Photodiode
    • Lateral Structures
    • Steady-state Equation
    • Quantum Efficiency
    • Reference Pixels
    • Standard CMOS
    • Maximum Response
    • Fourier Series
    • Fourier Decomposition
    • Fourier Modes
    • Fourier Expansion
    • Sensor Pixel
• authors:
  • Author Name: Beatriz Blanco-Filgueira
    Affiliation: Centro de Investigación en Tecnologías de la Información, University of Santiago de Compostela, Santiago de Compostela, Spain
    Author URL: https://ieeexplore.ieee.org/author/38276622300
    ID: 38276622300
    Order: 1
    Author Affiliations:
    • Centro de Investigación en Tecnologías de la Información, University of Santiago de Compostela, Santiago de Compostela, Spain
  • Author Name: Paula López Martínez
    Affiliation: Centro de Investigación en Tecnologías de la Información, University of Santiago de Compostela, Santiago de Compostela, Spain
    Author URL: https://ieeexplore.ieee.org/author/37085730616
    ID: 37085730616
    Order: 2
    Author Affiliations:
    • Centro de Investigación en Tecnologías de la Información, University of Santiago de Compostela, Santiago de Compostela, Spain
  • Author Name: Juan Bautista Roldán Aranda
    Affiliation: Department of Electronics and Computer Technology, University of Granada, Granada, Spain
    Author URL: https://ieeexplore.ieee.org/author/37085726146
    ID: 37085726146
    Order: 3
    Author Affiliations:
    • Department of Electronics and Computer Technology, University of Granada, Granada, Spain

Image Sensor

• sensor_type: CMOS
• resolution: Not specified
• dynamic_range: Not specified
• pixel_size: Not specified
• dark_current: Not specified

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

Applications & Benefits

• cell_imaging: Used in solid-state image sensors.
• benefits: Improved sensitivity, reduced dark current, and better quantum efficiency.

Supporting Organizations

• supported_by: Spanish Ministerio de Ciencia e Innovación, Agrupación Estratéxica Centro de Investigación en Tecnologías de la Información, Xunta de Galicia, Consejería Economía, Innovación, Ciencia y Empleo, Junta de Andalucia.

Manuscript Details

• publication_date: Jan. 2016

Relevancy Score

• score: 10
• missing_fields:
  • resolution
  • dynamic_range
  • pixel_size
  • dark_current
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed
  • power_consumption
  • noise

Processed JSON Filename

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