A Quantumdotcoated Image Sensor With A Widespectral Sensitivity From Xrays To Swir Photons

• doi: 10.1109/LSENS.2024.3428608
• title: A Quantum-Dot-Coated Image Sensor With a Wide-Spectral Sensitivity From X-rays to SWIR Photons
• publisher: IEEE
• isbn:
• issn: 2475-1472
• rank: 893
• access_type: LOCKED
• content_type: Journals
• abstract: Silicon-based complementary metal-oxide semiconductor (CMOS) image sensors dominate a range of application areas but are intrinsically limited to the visible spectrum. For invisible light detection, monolithic integration of a thin-film photon absorber on a CMOS readout chip has been a promising solution. CMOS processes are favorable for a high pixel resolution, low power consumption, and complex readout electronics. Lead sulfide (PbS) colloidal quantum dots (QDs) offer low-cost synthesis, widely tunable light absorption, and high material compatibility. To benefit both sets of features, we have designed a thin-film image sensor by directly processing an absorber stack with a 120-$\mu$m PbS-QD layer on our in-house CMOS readout chip. Characterization results prove its potential use in three wavelength ranges (i.e., X-ray, visible, and short-wave infrared) for various applications. To our knowledge, this is the first image sensor using PbS QDs on silicon readout to directly convert X-rays into electrical signals and yet remaining sensitive at a wavelength up to 1.3 $\mu$m.
• article_number: 10599797
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10599797
• html_url: https://ieeexplore.ieee.org/document/10599797/
• abstract_url: https://ieeexplore.ieee.org/document/10599797/
• publication_title: IEEE Sensors Letters
• conference_location:
• conference_dates:
• publication_number: 7782634
• is_number: 10589446
• publication_year: 2024
• publication_date: Aug. 2024
• start_page: 1
• end_page: 4
• citing_paper_count: 0
• citing_patent_count: 0
• download_count: 442
• insert_date: 20240716
• index_terms:
  • ieee_terms:
    • X-ray imaging
    • Sensors
    • Imaging
    • Photonics
    • Electrodes
    • Silicon
    • Optical sensors
    • CMOS process
    • Interconnected systems
    • Medical diagnosis
  • author_terms:
    • Optical sensors
    • CMOS processes
    • colloidal quantum dots (QDs)
    • composite defects
    • dental imaging
    • direct conversion
    • lead sulfide (PbS)
    • medical diagnosis
    • monolithic integration
    • nondestructive testing
    • NDT
    • PbS QDs
    • short-wave infrared (SWIR)
    • silicon readout
    • wide-spectral imaging
    • X-ray
  • dynamic_index_terms:
    • Image Sensor
    • Camera Sensor
    • Shortwave Infrared
    • High-resolution
    • Visible Light
    • Visible Region
    • Visible Spectrum
    • Low Power Consumption
    • Photon Absorption
    • Colloidal Quantum Dots
    • Electrode
    • Plastic Tubes
    • Photocurrent
    • Printed Circuit Board
    • Tube Voltage
    • Development Of Sensors
    • Non-destructive Testing
    • Non-destructive Analysis
    • Non-destructive Evaluation
    • Sensor Characteristics
    • Sensor Features
    • X-ray Detector
    • Visible Images
    • Electronic Collection
    • Pixel Pitch
    • Gray Code
    • Grey Number
    • Low Dark Current
    • Quantum Dots Layer
    • Digital Memory
    • Dental Imaging
    • Metal Screws
• authors:
  • Author Name: Chun-Min Zhang
    Affiliation: Integrated & Wireless Systems Department, Centre Suisse d'Electronique et de Microtechnique (CSEM S.A.), Neuchâtel, Switzerland
    Author URL: https://ieeexplore.ieee.org/author/37085887833
    ID: 37085887833
    Order: 1
    Author Affiliations:
    • Integrated & Wireless Systems Department, Centre Suisse d'Electronique et de Microtechnique (CSEM S.A.), Neuchâtel, Switzerland
  • Author Name: Riccardo Quaglia
    Affiliation: Integrated & Wireless Systems Department, Centre Suisse d'Electronique et de Microtechnique (CSEM S.A.), Neuchâtel, Switzerland
    Author URL: https://ieeexplore.ieee.org/author/563075459499910
    ID: 563075459499910
    Order: 2
    Author Affiliations:
    • Integrated & Wireless Systems Department, Centre Suisse d'Electronique et de Microtechnique (CSEM S.A.), Neuchâtel, Switzerland
  • Author Name: Artem Shulga
    Affiliation: QDI Systems, Groningen, The Netherlands
    Author URL: https://ieeexplore.ieee.org/author/178100015722451
    ID: 178100015722451
    Order: 3
    Author Affiliations:
    • QDI Systems, Groningen, The Netherlands
  • Author Name: Vincent Goossens
    Affiliation: QDI Systems, Groningen, The Netherlands
    Author URL: https://ieeexplore.ieee.org/author/938725997112614
    ID: 938725997112614
    Order: 4
    Author Affiliations:
    • QDI Systems, Groningen, The Netherlands
  • Author Name: Paula Blanca Cruz
    Affiliation: Integrated & Wireless Systems Department, Centre Suisse d'Electronique et de Microtechnique (CSEM S.A.), Neuchâtel, Switzerland
    Author URL: https://ieeexplore.ieee.org/author/328000268305691
    ID: 328000268305691
    Order: 5
    Author Affiliations:
    • Integrated & Wireless Systems Department, Centre Suisse d'Electronique et de Microtechnique (CSEM S.A.), Neuchâtel, Switzerland
  • Author Name: Pierre-François Rüedi
    Affiliation: Integrated & Wireless Systems Department, Centre Suisse d'Electronique et de Microtechnique (CSEM S.A.), Neuchâtel, Switzerland
    Author URL: https://ieeexplore.ieee.org/author/205183705532638
    ID: 205183705532638
    Order: 6
    Author Affiliations:
    • Integrated & Wireless Systems Department, Centre Suisse d'Electronique et de Microtechnique (CSEM S.A.), Neuchâtel, Switzerland

Image Sensor

• sensor_type: CMOS
• resolution: 512x512
• dynamic_range: 120 dB
• pixel_size: 22.5 μm
• dark_current: low dark current

Optical Data

• focal_length: not specified
• aperture: not specified
• field_of_view: not specified
• distortion: not specified

Performance Metrics

• power_consumption: low power consumption

Applications & Benefits

• cell_imaging: applicable for medical diagnosis and imaging applications to identify dental structures, defects in composite materials, and other non-destructive testing scenarios.
• benefits: high pixel resolution, low power consumption, and the ability to operate in a wide spectral range including X-ray, visible, and SWIR light.

Supporting Organizations

• supported_by: Clean Sky 2 Joint Undertaking under the European Union's Horizon 2020 program, Grant 887192

Manuscript Details

• publication_date: Aug. 2024

Relevancy Score

• score: 10
• missing_fields:
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed
  • noise

Processed JSON Filename

request_2bab862d-260f-44ff-af29-237a25ee44ef-a_quantumdotcoated_image_sensor_with_a_widespectral_sensitivity_from_xrays_to_swir_photons.json