A Polarization Analyzing Cmos Image Sensor With Metal Wire Grid In 65Nm Standard Cmos Technology

• doi: 10.1109/IMFEDK.2012.6218616
• title: A polarization analyzing CMOS image sensor with metal wire grid in 65-nm standard CMOS technology
• publisher: IEEE
• isbn: 978-1-4673-0837-3
• issn:
• partnum: 12EX6109
• rank: 1245
• access_type: LOCKED
• content_type: Conferences
• abstract: In this paper, we demonstrate a CMOS image sensor with high extinction ratio on-chip polarizers with 65-nm standard CMOS technology. The polarizer is based on a metal wire grid fabricated with the metal wiring layers. The extinction ratio of 11.0 dB is achieved by a pixel with on-chip polarizer where the line / space widths are 90 nm / 90 nm.
• article_number: 6218616
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6218616
• html_url: https://ieeexplore.ieee.org/document/6218616/
• abstract_url: https://ieeexplore.ieee.org/document/6218616/
• publication_title: 2012 IEEE International Meeting for Future of Electron Devices, Kansai
• conference_location: Suita, Japan
• conference_dates: 9-11 May 2012
• publication_number: 6212670
• is_number: 6218554
• publication_year: 2012
• publication_date: 9-11 May 2012
• start_page: 1
• end_page: 2
• citing_paper_count: 1
• citing_patent_count: 0
• download_count: 294
• insert_date: 20120618
• index_terms:
  • ieee_terms:
    • Extinction ratio
    • CMOS image sensors
    • Metals
    • CMOS integrated circuits
    • Wires
    • System-on-a-chip
  • author_terms:
    • CMOS image sensor
    • Polarization
    • On-chip Polarizer
  • dynamic_index_terms:
    • Image Sensor
    • Camera Sensor
    • Standard Technology
    • Metal Wire
    • 65-nm CMOS
    • 65-nm CMOS Technology
    • Metal Wire Grid
    • Polarizability
    • Extinction Ratio
    • Linearly Polarized
    • Propagation Direction
    • Halogen Lamp
    • Halogen Light
    • Single Pixel
• isbn_formats:
  • format: Print ISBN, value: 978-1-4673-0837-3, isbnType: New-2005
  • format: Electronic ISBN, value: 978-1-4673-0836-6, isbnType: New-2005
• authors:
  • Author Name: Norimitsu Wakama
    Affiliation: Graduate School of Materials Science, Nara Institute of Science and Technology, Ikoma, Nara, Japan
    Author URL: https://ieeexplore.ieee.org/author/38246647000
    ID: 38246647000
    Order: 1
    Author Affiliations:
    • Graduate School of Materials Science, Nara Institute of Science and Technology, Ikoma, Nara, Japan
  • Author Name: Hitoshi Matsuoka
    Affiliation: Graduate School of Materials Science, Nara Institute of Science and Technology, Ikoma, Nara, Japan
    Author URL: https://ieeexplore.ieee.org/author/38246970300
    ID: 38246970300
    Order: 2
    Author Affiliations:
    • Graduate School of Materials Science, Nara Institute of Science and Technology, Ikoma, Nara, Japan
  • Author Name: Keisuke Ando
    Affiliation: Graduate School of Materials Science, Nara Institute of Science and Technology, Ikoma, Nara, Japan
    Author URL: https://ieeexplore.ieee.org/author/38246173100
    ID: 38246173100
    Order: 3
    Author Affiliations:
    • Graduate School of Materials Science, Nara Institute of Science and Technology, Ikoma, Nara, Japan
  • Author Name: Toshihiko Noda
    Affiliation: Core Research for Evolutional Science and Technology CREST, Japan Science and Technology Agency, Kawaguchi, Saitama, Japan
    Author URL: https://ieeexplore.ieee.org/author/37401924800
    ID: 37401924800
    Order: 4
    Author Affiliations:
    • Core Research for Evolutional Science and Technology CREST, Japan Science and Technology Agency, Kawaguchi, Saitama, Japan
    • Graduate School of Materials Science, Nara Institute of Science and Technology, Ikoma, Nara, Japan
  • Author Name: Kiyotaka Sasagawa
    Affiliation: Core Research for Evolutional Science and Technology CREST, Japan Science and Technology Agency, Kawaguchi, Saitama, Japan
    Author URL: https://ieeexplore.ieee.org/author/37287324600
    ID: 37287324600
    Order: 5
    Author Affiliations:
    • Core Research for Evolutional Science and Technology CREST, Japan Science and Technology Agency, Kawaguchi, Saitama, Japan
    • Graduate School of Materials Science, Nara Institute of Science and Technology, Ikoma, Nara, Japan
  • Author Name: Takashi Tokuda
    Affiliation: Core Research for Evolutional Science and Technology CREST, Japan Science and Technology Agency, Kawaguchi, Saitama, Japan
    Author URL: https://ieeexplore.ieee.org/author/37278027500
    ID: 37278027500
    Order: 6
    Author Affiliations:
    • Core Research for Evolutional Science and Technology CREST, Japan Science and Technology Agency, Kawaguchi, Saitama, Japan
    • Graduate School of Materials Science, Nara Institute of Science and Technology, Ikoma, Nara, Japan
  • Author Name: Jun Ohta
    Affiliation: Core Research for Evolutional Science and Technology CREST, Japan Science and Technology Agency, Kawaguchi, Saitama, Japan
    Author URL: https://ieeexplore.ieee.org/author/37278016600
    ID: 37278016600
    Order: 7
    Author Affiliations:
    • Core Research for Evolutional Science and Technology CREST, Japan Science and Technology Agency, Kawaguchi, Saitama, Japan
    • Graduate School of Materials Science, Nara Institute of Science and Technology, Ikoma, Nara, Japan

Image Sensor

• sensor_type: CMOS
• resolution: 100 × 80 pixels
• dynamic_range: Not specified
• pixel_size: 10 μm × 10 μm
• dark_current: Not specified

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

Applications & Benefits

• cell_imaging: Can be embedded into a micro-flow cell system for asymmetric chemical reaction process monitoring
• benefits: Real-time noninvasive monitoring of optical activity of chiral substance

Supporting Organizations

• supported_by: Japan Science and Technology Agency, Core Research for Evolutional Science and Technology (JST-CREST), VLSI Design and Education Center (VDEC), University of Tokyo, Cadence Design Systems, Inc.

Manuscript Details

• publication_date: 9-11 May 2012

Relevancy Score

• score: 8
• missing_fields:
  • dynamic_range
  • dark_current
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed
  • power_consumption
  • noise

Processed JSON Filename

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