A Numerical Analysis Of A Cmos Image Sensor With A Simple Fixedpatternnoisereduction Technology

• doi: 10.1109/16.998580
• title: A numerical analysis of a CMOS image sensor with a simple fixed-pattern-noise-reduction technology
• publisher: IEEE
• isbn:
• issn: 1557-9646
• rank: 1230
• access_type: LOCKED
• content_type: Journals
• abstract: A 1/3-in 640/spl times/480-pixel CMOS image sensor with a simple fixed-pattern noise-reduction technology with a five-transistor pixel circuit and a low input-voltage current-voltage (I-V) converter was previously developed. In this report, we show that the low-input-voltage I-V converter with a current-mirror circuit improves the amplification factor and linearity of the pixel circuit. In a five-transistor pixel circuit, the threshold voltage of the X-Y addressing transistor affects the amplitude and the level of the readout pulse. An analysis of the mechanism of the X-Y addressing transistor shows the basic concept behind the selection of the threshold voltage. An L-shaped readout gate for a pinned photodiode is compared with a straight readout gate, and is proved to be adequate for rapid charge transfer.
• article_number: 998580
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=998580
• html_url: https://ieeexplore.ieee.org/document/998580/
• abstract_url: https://ieeexplore.ieee.org/document/998580/
• publication_title: IEEE Transactions on Electron Devices
• conference_location:
• conference_dates:
• publication_number: 16
• is_number: 21545
• publication_year: 2002
• publication_date: May 2002
• start_page: 746
• end_page: 753
• citing_paper_count: 10
• citing_patent_count: 4
• download_count: 738
• insert_date: 20020807
• index_terms:
  • ieee_terms:
    • Numerical analysis
  • dynamic_index_terms:
    • Image Sensor
    • Camera Sensor
    • Threshold Voltage
    • PIN Photodiode
    • Signal-to-noise
    • Signal-to-noise Ratio
    • Electrostatic Potential
    • Electric Potential
    • Low Voltage
    • Output Signal
    • Transient State
    • Transient Process
    • Transient System
    • Transient Conditions
    • Transient Analysis
    • Input Voltage
    • Pulse Amplitude
    • Dark Current
    • Voltage Mode
    • Circuit Simulation
    • Circuit Current
    • Linear Signal
    • Efficient Charge Transfer
    • Differential Amplifier
    • Device Simulation
    • Complete Transfer
    • Power Supply Voltage
    • Circuit Configuration
    • Signal Gain
    • Good Linearity
    • Drain-source Voltage
    • Source-drain Voltage
    • Current Mirror
• authors:
  • Author Name: K. Yonemoto
    Affiliation: Department of Electronics, Information and Communication Engineering, Waseda University, Tokyo, Japan
    Author URL: https://ieeexplore.ieee.org/author/37372301500
    ID: 37372301500
    Order: 1
    Author Affiliations:
    • Department of Electronics, Information and Communication Engineering, Waseda University, Tokyo, Japan
  • Author Name: H. Sumi
    Affiliation: Micro-System Department, Imaging Device Company, SNC, Sony Corporation, Kanagawa, Japan
    Author URL: https://ieeexplore.ieee.org/author/37275548900
    ID: 37275548900
    Order: 2
    Author Affiliations:
    • Micro-System Department, Imaging Device Company, SNC, Sony Corporation, Kanagawa, Japan

Image Sensor

• sensor_type: CMOS
• resolution: 640x480
• dynamic_range: Not specified
• pixel_size: Not specified
• dark_current: 150 pA/cm²

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

• frame_rate: 30 fps
• sensitivity: 0.52 V/lx·s
• power_consumption: 31 mW
• noise: 0.18 mV

Applications & Benefits

• cell_imaging: Used in mobile applications and digital still cameras.
• benefits: Lower power consumption, smaller chip size due to lack of column CDS circuits, capability for system-on-chip integration.

Supporting Organizations

• supported_by: Sony Corporation

Manuscript Details

• publication_date: May 2002

Relevancy Score

• score: 10
• missing_fields:
  • dynamic_range
  • fill factor
  • quantum efficiency
  • readout speed
  • noise sources
  • analog-to-digital conversion techniques
  • microlenses
  • on-chip colour filters
  • global or rolling shutters
  • backside illumination

Processed JSON Filename

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