A Novel Cmos Image Sensor Using An Output Voltage Feedback With Variable Dynamic Range

• doi: 10.1109/IST.2013.6729729
• title: A novel CMOS image sensor using an output voltage feedback with variable dynamic range
• publisher: IEEE
• isbn: 978-1-4673-5790-6
• issn: 1558-2809
• rank: 1205
• access_type: LOCKED
• content_type: Conferences
• abstract: In this study, we propose a new complementary metal-oxide semiconductor (CMOS) image sensor to extend the dynamic range. The proposed active pixel sensor (APS) uses a gate/body-tied PMOSFET-type (GBT) photodetector and an output voltage feedback structure. Although the size of the proposed APS is slightly larger than a conventional APS, the dynamic range of the proposed pixel is much wider than a conventional APS. And the proposed APS has a varied dynamic range from adjusting the reference voltage. The proposed APS has been designed and fabricated by using 0.35 μm 2-poly 4-metal standard CMOS technology, and its characteristics have been evaluated.
• article_number: 6729729
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6729729
• html_url: https://ieeexplore.ieee.org/document/6729729/
• abstract_url: https://ieeexplore.ieee.org/document/6729729/
• publication_title: 2013 IEEE International Conference on Imaging Systems and Techniques (IST)
• conference_location: Beijing, China
• conference_dates: 22-23 Oct. 2013
• publication_number: 6718310
• is_number: 6729646
• publication_year: 2013
• publication_date: 22-23 Oct. 2013
• start_page: 398
• end_page: 401
• citing_paper_count: 0
• citing_patent_count: 0
• download_count: 461
• insert_date: 20140203
• index_terms:
  • ieee_terms:
    • Dynamic range
    • CMOS image sensors
    • Photodetectors
    • Voltage measurement
    • Sensitivity
  • author_terms:
    • CMOS image sensor
    • dynamic range
    • feedback structure
  • dynamic_index_terms:
    • Dynamic Range
    • Image Sensor
    • Camera Sensor
    • Complementary Metal–oxide–semiconductor Image
    • Complementary Metal Oxide Semiconductor Image
    • Output Voltage Feedback
    • Photodetector
    • Sensor Pixel
    • Integration Time
    • Photocurrent
    • Voltage Variation
    • P-n Junction
    • High Illumination
    • Narrow Dynamic Range
    • PIN Photodiode
• isbn_formats:
  • format: CD, value: 978-1-4673-5790-6, isbnType: New-2005
  • format: Electronic ISBN, value: 978-1-4673-5791-3, isbnType: New-2005
• authors:
  • Author Name: Myunghan Bae
    Affiliation: School of Electronics Engineering, Kyungpook National University, Daegu, Korea
    Author URL: https://ieeexplore.ieee.org/author/37718888800
    ID: 37718888800
    Order: 1
    Author Affiliations:
    • School of Electronics Engineering, Kyungpook National University, Daegu, Korea
  • Author Name: Sung-Hyun Jo
    Affiliation: School of Electronics Engineering, Kyungpook National University, Daegu, Korea
    Author URL: https://ieeexplore.ieee.org/author/37528762600
    ID: 37528762600
    Order: 2
    Author Affiliations:
    • School of Electronics Engineering, Kyungpook National University, Daegu, Korea
  • Author Name: Hee Ho Lee
    Affiliation: School of Electronics Engineering, Kyungpook National University, Daegu, Korea
    Author URL: https://ieeexplore.ieee.org/author/37085802754
    ID: 37085802754
    Order: 3
    Author Affiliations:
    • School of Electronics Engineering, Kyungpook National University, Daegu, Korea
  • Author Name: Minho Lee
    Affiliation: School of Electronics Engineering, Kyungpook National University, Daegu, Korea
    Author URL: https://ieeexplore.ieee.org/author/37336248100
    ID: 37336248100
    Order: 4
    Author Affiliations:
    • School of Electronics Engineering, Kyungpook National University, Daegu, Korea
  • Author Name: Ju-Yeong Kim
    Affiliation: School of Electronics Engineering, Kyungpook National University, Daegu, Korea
    Author URL: https://ieeexplore.ieee.org/author/37086657338
    ID: 37086657338
    Order: 5
    Author Affiliations:
    • School of Electronics Engineering, Kyungpook National University, Daegu, Korea
  • Author Name: Pyung Choi
    Affiliation: School of Electronics Engineering, Kyungpook National University, Daegu, Korea
    Author URL: https://ieeexplore.ieee.org/author/37298696200
    ID: 37298696200
    Order: 6
    Author Affiliations:
    • School of Electronics Engineering, Kyungpook National University, Daegu, Korea
  • Author Name: Jang-Kyoo Shin
    Affiliation: School of Electronics Engineering, Kyungpook National University, Daegu, Korea
    Author URL: https://ieeexplore.ieee.org/author/37288996500
    ID: 37288996500
    Order: 7
    Author Affiliations:
    • School of Electronics Engineering, Kyungpook National University, Daegu, Korea
  • Author Name: Seungmin Kim
    Affiliation: Department of Sensor and Display Engineering, Kyungpook National University, Daegu, Korea
    Author URL: https://ieeexplore.ieee.org/author/37086655523
    ID: 37086655523
    Order: 8
    Author Affiliations:
    • Department of Sensor and Display Engineering, Kyungpook National University, Daegu, Korea
  • Author Name: Jeongyeob Kim
    Affiliation: Department of Sensor and Display Engineering, Kyungpook National University, Daegu, Korea
    Author URL: https://ieeexplore.ieee.org/author/37086657330
    ID: 37086657330
    Order: 9
    Author Affiliations:
    • Department of Sensor and Display Engineering, Kyungpook National University, Daegu, Korea

Image Sensor

• sensor_type: CMOS
• resolution: Not specified
• dynamic_range: wider than conventional APS
• pixel_size: slightly larger than conventional APS
• dark_current: low dark current

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

• sensitivity: high sensitivity at low illumination, low sensitivity at high illumination
• noise: kTC noise, dark current

Applications & Benefits

• cell_imaging: Applications in digital imaging including smartphones, medical devices, and automotive systems.
• benefits: Wide dynamic range, control of dynamic range through reference voltage adjustment.

Supporting Organizations

• supported_by: National Research Foundation of Korea (NRF) and Integrated Circuit Design Education Center (IDEC)

Manuscript Details

• publication_date: 22-23 Oct. 2013

Relevancy Score

• score: 10

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