A Novel 113Inch 50 Megapixel Threewaferstacked Cmos Image Sensor With Dnn Circuit For Edge Processing

• doi: 10.1109/IEDM50854.2024.10873435
• title: A Novel 1/1.3-inch 50 Megapixel Three-wafer-stacked CMOS Image Sensor with DNN Circuit for Edge Processing
• publisher: IEEE
• isbn: 979-8-3503-6543-6
• issn: 0163-1918
• rank: 855
• access_type: LOCKED
• content_type: Conferences
• abstract: This study reports the first ever 3-wafer-stacked CMOS image sensor comprising an artificial intelligence (AI) chip with a deep neural network (DNN)-based circuit. The sensor was fabricated by bonding wafer with a DNN-based circuit to the bottom of a conventional 2-layer-stacked image sensor comprising a pixel array on the top wafer and a sensor logic and an analog-to-digital converter on the middle wafer using the wafer-on-wafer-on-wafer process. This process allowed the sensor to retain excellent imaging characteristics without affecting those of the top and middle wafers. Additionally, considering the heat generation during operation is crucial for designing the circuit of the 3-layer-stacked chip; therefore, the high-power circuit was placed in the bottom chip to ensure heat dissipation. This novel image sensor comprising a DNN can enhance the gate scale and incorporate the high dynamic range (HDR) function. Moreover, the pixel-array area can be expanded to approximately the same size as that of the chip to realize a resolution of 50 MP. Thus, the proposed sensor can perform DNN processing on higher resolution HDR image data than the conventional DNN-equipped 2-layer-stacked image sensor, resulting in remarkably improved image-recognition and high-performance edge processing with a single chip.
• article_number: 10873435
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10873435
• html_url: https://ieeexplore.ieee.org/document/10873435/
• abstract_url: https://ieeexplore.ieee.org/document/10873435/
• publication_title: 2024 IEEE International Electron Devices Meeting (IEDM)
• conference_location: San Francisco, CA, USA
• conference_dates: 7-11 Dec. 2024
• publication_number: 10872985
• is_number: 10872987
• publication_year: 2024
• publication_date: 7-11 Dec. 2024
• start_page: 1
• end_page: 4
• citing_paper_count: 0
• citing_patent_count: 0
• download_count: 216
• insert_date: 20250218
• index_terms:
  • ieee_terms:
    • Heating systems
    • Resistance
    • Image edge detection
    • Simulation
    • Artificial neural networks
    • CMOS image sensors
    • Logic gates
    • Logic
    • Substrates
    • Sensor arrays
  • dynamic_index_terms:
    • Deep Neural Network
    • Image Sensor
    • Camera Sensor
    • Imaging Data
    • Analog-to-digital Converter
    • Analog-to-digital
    • Digital-to-analog Converter
    • High Dynamic Range
    • Single Chip
    • Pixel Array
    • Object Detection
    • Random Access Memory
    • Sensor Characteristics
    • Sensor Features
    • Large Chip
    • Static Random Access Memory
    • Serial Peripheral Interface
• isbn_formats:
  • format: Print on Demand(PoD) ISBN, value: 979-8-3503-6543-6, isbnType: New-2005
  • format: Electronic ISBN, value: 979-8-3503-6542-9, isbnType: New-2005
• authors:
  • Author Name: R. Nakamura
    Affiliation: Sony Semiconductor Solutions Corp., Kanagawa, Japan
    Author URL: https://ieeexplore.ieee.org/author/37087252360
    ID: 37087252360
    Order: 1
    Author Affiliations:
    • Sony Semiconductor Solutions Corp., Kanagawa, Japan
  • Author Name: H. Tsugawa
    Affiliation: Sony Semiconductor Solutions Corp., Kanagawa, Japan
    Author URL: https://ieeexplore.ieee.org/author/37086330235
    ID: 37086330235
    Order: 2
    Author Affiliations:
    • Sony Semiconductor Solutions Corp., Kanagawa, Japan
  • Author Name: H. Yamagishi
    Affiliation: Sony Semiconductor Solutions Corp., Kanagawa, Japan
    Author URL: https://ieeexplore.ieee.org/author/37088738506
    ID: 37088738506
    Order: 3
    Author Affiliations:
    • Sony Semiconductor Solutions Corp., Kanagawa, Japan
  • Author Name: Y. Fujisaki
    Affiliation: Sony Semiconductor Solutions Corp., Kanagawa, Japan
    Author URL: https://ieeexplore.ieee.org/author/37089698861
    ID: 37089698861
    Order: 4
    Author Affiliations:
    • Sony Semiconductor Solutions Corp., Kanagawa, Japan
  • Author Name: Y. Suda
    Affiliation: Sony Semiconductor Solutions Corp., Kanagawa, Japan
    Author URL: https://ieeexplore.ieee.org/author/37650186700
    ID: 37650186700
    Order: 5
    Author Affiliations:
    • Sony Semiconductor Solutions Corp., Kanagawa, Japan
  • Author Name: Y. Tatsumi
    Affiliation: Sony Semiconductor Solutions Corp., Kanagawa, Japan
    Author URL: https://ieeexplore.ieee.org/author/616544067967678
    ID: 616544067967678
    Order: 6
    Author Affiliations:
    • Sony Semiconductor Solutions Corp., Kanagawa, Japan
  • Author Name: K. Shimizu
    Affiliation: Sony Semiconductor Solutions Corp., Kanagawa, Japan
    Author URL: https://ieeexplore.ieee.org/author/37085498309
    ID: 37085498309
    Order: 7
    Author Affiliations:
    • Sony Semiconductor Solutions Corp., Kanagawa, Japan
  • Author Name: Y. Kagawa
    Affiliation: Sony Semiconductor Solutions Corp., Kanagawa, Japan
    Author URL: https://ieeexplore.ieee.org/author/37089988860
    ID: 37089988860
    Order: 8
    Author Affiliations:
    • Sony Semiconductor Solutions Corp., Kanagawa, Japan
  • Author Name: K. Ono
    Affiliation: Sony Semiconductor Solutions Corp., Kanagawa, Japan
    Author URL: https://ieeexplore.ieee.org/author/37088734574
    ID: 37088734574
    Order: 9
    Author Affiliations:
    • Sony Semiconductor Solutions Corp., Kanagawa, Japan
  • Author Name: Y. Horie
    Affiliation: Sony Semiconductor Solutions Corp., Kanagawa, Japan
    Author URL: https://ieeexplore.ieee.org/author/37948924900
    ID: 37948924900
    Order: 10
    Author Affiliations:
    • Sony Semiconductor Solutions Corp., Kanagawa, Japan
  • Author Name: R. Koganei
    Affiliation: Sony Semiconductor Solutions Corp., Kanagawa, Japan
    Author URL: https://ieeexplore.ieee.org/author/449265857960454
    ID: 449265857960454
    Order: 11
    Author Affiliations:
    • Sony Semiconductor Solutions Corp., Kanagawa, Japan
  • Author Name: H. Nakano
    Affiliation: Sony Semiconductor Solutions Corp., Kanagawa, Japan
    Author URL: https://ieeexplore.ieee.org/author/37087905944
    ID: 37087905944
    Order: 12
    Author Affiliations:
    • Sony Semiconductor Solutions Corp., Kanagawa, Japan
  • Author Name: K. Kobayashi
    Affiliation: Sony Semiconductor Solutions Corp., Kanagawa, Japan
    Author URL: https://ieeexplore.ieee.org/author/37089059121
    ID: 37089059121
    Order: 13
    Author Affiliations:
    • Sony Semiconductor Solutions Corp., Kanagawa, Japan
  • Author Name: T. Kamibavashi
    Affiliation: Sony Semiconductor Solutions Corp., Kanagawa, Japan
    Author URL: https://ieeexplore.ieee.org/author/393196380156442
    ID: 393196380156442
    Order: 14
    Author Affiliations:
    • Sony Semiconductor Solutions Corp., Kanagawa, Japan
  • Author Name: N. Araki
    Affiliation: Sony Semiconductor Manufacturing Corp., Nagasaki, Japan
    Author URL: https://ieeexplore.ieee.org/author/37086514589
    ID: 37086514589
    Order: 15
    Author Affiliations:
    • Sony Semiconductor Manufacturing Corp., Nagasaki, Japan
  • Author Name: K. Saito
    Affiliation: Sony Semiconductor Manufacturing Corp., Nagasaki, Japan
    Author URL: https://ieeexplore.ieee.org/author/379424189777963
    ID: 379424189777963
    Order: 16
    Author Affiliations:
    • Sony Semiconductor Manufacturing Corp., Nagasaki, Japan
  • Author Name: R. Suzue
    Affiliation: Sony Semiconductor Manufacturing Corp., Nagasaki, Japan
    Author URL: https://ieeexplore.ieee.org/author/403889582484808
    ID: 403889582484808
    Order: 17
    Author Affiliations:
    • Sony Semiconductor Manufacturing Corp., Nagasaki, Japan
  • Author Name: W. Otsuka
    Affiliation: Sony Semiconductor Solutions Corp., Kanagawa, Japan
    Author URL: https://ieeexplore.ieee.org/author/465207241877432
    ID: 465207241877432
    Order: 18
    Author Affiliations:
    • Sony Semiconductor Solutions Corp., Kanagawa, Japan
  • Author Name: H. Iwamoto
    Affiliation: Sony Semiconductor Solutions Corp., Kanagawa, Japan
    Author URL: https://ieeexplore.ieee.org/author/537692421313994
    ID: 537692421313994
    Order: 19
    Author Affiliations:
    • Sony Semiconductor Solutions Corp., Kanagawa, Japan

Image Sensor

• sensor_type: CMOS
• resolution: 50 MP
• dynamic_range: High dynamic range (HDR)
• pixel_size: 1.12 μm
• dark_current: Not specified

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

• frame_rate: 30 fps

Applications & Benefits

• cell_imaging: Not specified
• benefits: Enhanced object-recognition capability, improved image processing results with HDR.

Supporting Organizations

• supported_by: Sony Semiconductor Solutions Corp., Sony Semiconductor Manufacturing Corp.

Manuscript Details

• publication_date: 7-11 Dec. 2024

Relevancy Score

• score: 9
• missing_fields:
  • fill factor
  • quantum efficiency
  • readout speed
  • noise sources
  • analog-to-digital conversion techniques
  • microlenses
  • on-chip colour filters
  • global or rolling shutters
  • backside illumination

Processed JSON Filename

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