A New Efficient Transient Noise Analysis Technique For Simulation Of Ccd Image Sensors Or Particle Detectors

• doi: 10.1109/CICC.1993.590717
• title: A new efficient transient noise analysis technique for simulation of CCD image sensors or particle detectors
• publisher: IEEE
• isbn: 0-7803-0826-3
• issn:
• partnum: 93CH3214-4
• rank: 1188
• access_type: LOCKED
• content_type: Conferences
• abstract: A novel noise simulation technique for transient analysis is presented. This approach has been implemented in the electrical circuit simulator ELDO and is particularly useful for noise simulation in analog sampling circuits such as CCD (charge coupled device) image sensors or switched-capacitor circuits. Noise sources can be introduced into macromodels, and switched-capacitor filters or even sigma-delta modulators can be simulated without consuming too much CPU (central processing unit) time. Comparison between simulations and experimental results has been made and is shown for a 1.5-/spl mu/ CMOS current mode amplifier designed for high-rate particle detectors.
• article_number: 590717
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=590717
• html_url: https://ieeexplore.ieee.org/document/590717/
• abstract_url: https://ieeexplore.ieee.org/document/590717/
• publication_title: Proceedings of IEEE Custom Integrated Circuits Conference - CICC '93
• conference_location: San Diego, CA, USA
• conference_dates: 9-12 May 1993
• publication_number: 4489
• is_number: 12733
• publication_year: 1993
• publication_date: 9-12 May 1993
• start_page: 14.8.1
• end_page: 14.8.4
• citing_paper_count: 5
• citing_patent_count: 0
• download_count: 325
• insert_date: 20020806
• index_terms:
  • ieee_terms:
    • Transient analysis
    • Analytical models
    • Circuit simulation
    • Circuit noise
    • Central Processing Unit
    • Image sampling
    • Charge coupled devices
    • Charge-coupled image sensors
    • Image sensors
    • Switched capacitor circuits
  • dynamic_index_terms:
    • Transient State
    • Transient Analysis
    • Transient Process
    • Transient Conditions
    • Transient System
    • Particle Detection
    • Transient Noise
    • Noise Sources
    • Root Mean Square Values
    • Rms Value
    • Noise Values
    • Macro Model
    • Simulated Noise
    • Part Of The Circuit
    • Clock Period
• isbn_formats:
  • format: Print ISBN, value: 0-7803-0826-3, isbnType: Historical
• authors:
  • Author Name: P. Bolcato
    Affiliation: LETI, CEA-LETI-Technologies Avancees, Grenoble, France
    Author URL: https://ieeexplore.ieee.org/author/37374999900
    ID: 37374999900
    Order: 1
    Author Affiliations:
    • LETI, CEA-LETI-Technologies Avancees, Grenoble, France
  • Author Name: M.S. Tawfik
    Affiliation: Chemin vieux chene, Anacad Computer Systems, Meylan, France
    Author URL: https://ieeexplore.ieee.org/author/37271801900
    ID: 37271801900
    Order: 2
    Author Affiliations:
    • Chemin vieux chene, Anacad Computer Systems, Meylan, France
  • Author Name: R. Poujois
    Affiliation: LETI, CEA-LETI-Technologies Avancees, Grenoble, France
    Author URL: https://ieeexplore.ieee.org/author/37327838100
    ID: 37327838100
    Order: 3
    Author Affiliations:
    • LETI, CEA-LETI-Technologies Avancees, Grenoble, France
  • Author Name: P. Jarron
    Affiliation: CERN, France
    Author URL: https://ieeexplore.ieee.org/author/37268750800
    ID: 37268750800
    Order: 4
    Author Affiliations:
    • CERN, France

Image Sensor

• sensor_type: CMOS
• resolution: Not specified
• dynamic_range: Not specified
• pixel_size: Not specified
• dark_current: Not specified

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

Applications & Benefits

• cell_imaging: Not specified
• benefits: Not specified

Supporting Organizations

• supported_by: ANACAD Computer Systems, LETI (CEA-Technologies AvancCes), CERN

Manuscript Details

• publication_date: 9-12 May 1993

Relevancy Score

• score: 8
• missing_fields:
  • resolution
  • dynamic_range
  • pixel_size
  • dark_current
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed
  • power_consumption
  • noise
  • cell_imaging
  • benefits

Processed JSON Filename

request_038a1806-11a3-4708-ba7a-9992416cb303-a_new_efficient_transient_noise_analysis_technique_for_simulation_of_ccd_image_sensors_or_particle_detectors.json