A Multibit Incremental Adc Based On Successive Approximation For Low Noise And High Resolution Columnparallel Readout Circuits

• doi: 10.1109/TCSI.2015.2451811
• title: A Multi-Bit Incremental ADC Based on Successive Approximation for Low Noise and High Resolution Column-Parallel Readout Circuits
• publisher: IEEE
• isbn:
• issn: 1558-0806
• rank: 832
• access_type: LOCKED
• content_type: Journals
• abstract: This paper proposes a multi-bit incremental analog-to-digital converter (ADC) based on successive approximation (SA) for column-parallel readout circuits. The proposed ADC suppresses the random noise and enhances the resolution by embedding the conventional SA ADC with an integrator and decimation filter. In addition, the operating speed is increased through the two-step operations of coarse conversion with the proposed ADC and fine conversion with the embedded SA ADC. A residue fitting method is adopted to adjust the residue voltage to the fine conversion range after the coarse conversion. The proposed ADC with 12-bit resolution was fabricated using a 0.13 $\mu{\rm m}$ CMOS image sensor process with a pixel array that has an image format of 648 $\times$ 488 and a pixel size of $5.6\ \mu{\rm m}\times 5.6\ \mu{\rm m}$. The measured results show a random noise of 108 $\mu{\rm V}$, a dynamic range of 60.9 dB, a differential nonlinearity of $+$1.02/$-$0.34 least significant bit (LSB), and an integral nonlinearity of $+$0.64/$-$0.54 LSB.
• article_number: 7210229
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7210229
• html_url: https://ieeexplore.ieee.org/document/7210229/
• abstract_url: https://ieeexplore.ieee.org/document/7210229/
• publication_title: IEEE Transactions on Circuits and Systems I: Regular Papers
• conference_location:
• conference_dates:
• publication_number: 8919
• is_number: 7229369
• publication_year: 2015
• publication_date: Sept. 2015
• start_page: 2156
• end_page: 2166
• citing_paper_count: 13
• citing_patent_count: 0
• download_count: 1582
• insert_date: 20150819
• index_terms:
  • ieee_terms:
    • Capacitors
    • Arrays
    • Noise
    • Clocks
    • Parasitic capacitance
    • Signal resolution
    • Sensors
  • author_terms:
    • Column-parallel readout
    • incremental analog-to-digital converter (ADC)
    • successive approximation
  • dynamic_index_terms:
    • High-resolution
    • Low Resolution
    • Low Noise
    • Successive Approximation
    • Readout Circuit
    • Incremental Analog-to-digital Converter
    • Square Root
    • Random Noise
    • Channel Noise
    • Analog-to-digital Converter
    • Analog-to-digital
    • Digital-to-analog Converter
    • Image Sensor
    • Camera Sensor
    • Parasitic Capacitance
    • Incremental Steps
    • Operation Speed
    • Least Significant Bit
    • Low Bit
    • Clock Cycles
    • Pixel Array
    • Circuit Implementation
    • 12-bit Resolution
    • Control Signal
    • Bottom Plate
    • Bit-width
    • Input Voltage
    • Integrator Output
    • Open Phase
    • Top Plate
    • Bottom Samples
    • Flat Panel
    • Flat Panel Displays
    • Flat Screen
    • Hanyang University
    • Capacitor Size
    • Phase Conversion
• authors:
  • Author Name: Yun-Rae Jo
    Affiliation: Hanyang University, Seongdong-gu, Seoul, KR
    Author URL: https://ieeexplore.ieee.org/author/38244060100
    ID: 38244060100
    Order: 1
    Author Affiliations:
    • Hanyang University, Seongdong-gu, Seoul, KR
  • Author Name: Seong-Kwan Hong
    Affiliation: Hanyang University, Seongdong-gu, Seoul, KR
    Author URL: https://ieeexplore.ieee.org/author/37085359277
    ID: 37085359277
    Order: 2
    Author Affiliations:
    • Hanyang University, Seongdong-gu, Seoul, KR
  • Author Name: Oh-Kyong Kwon
    Affiliation: Hanyang University, Seongdong-gu, Seoul, KR
    Author URL: https://ieeexplore.ieee.org/author/37276791400
    ID: 37276791400
    Order: 3
    Author Affiliations:
    • Hanyang University, Seongdong-gu, Seoul, KR

Image Sensor

• sensor_type: CMOS
• resolution: 648x488
• dynamic_range: 60.9 dB
• pixel_size: N/A
• dark_current: N/A

Optical Data

• focal_length: N/A
• aperture: N/A
• field_of_view: N/A
• distortion: N/A

Performance Metrics

• frame_rate: 150 fps
• signal_to_noise_ratio: 54.7 dB
• sensitivity: N/A
• shutter_speed: N/A
• power_consumption: N/A
• noise: 3.27 LSB at minimum gain setting, 3.53 LSB at maximum gain setting

Applications & Benefits

• cell_imaging: CMOS image sensor used for high-speed imaging applications.
• benefits: Low noise, high resolution, suitable for various 2-D sensors with array structures.

Supporting Organizations

• supported_by: Samsung Electronics Co., Ltd.

Manuscript Details

• publication_date: Sept. 2015

Relevancy Score

• score: 9
• missing_fields:
  • fill factor
  • quantum efficiency
  • readout speed
  • temporal noise
  • fixed-pattern noise
  • analog-to-digital conversion techniques
  • microlenses
  • on-chip colour filters
  • global or rolling shutters
  • backside illumination

Processed JSON Filename

request_2c76112e-7ef2-4710-87a9-02bb34817b28-a_multibit_incremental_adc_based_on_successive_approximation_for_low_noise_and_high_resolution_columnparallel_readout_circuits.json