A Lowripple Charge Pump With Novel Compensator For Transientresponse
Improvement In Cmos Image Sensors
- doi: 10.1109/TCSII.2020.3033000
-
title: A Low-Ripple Charge Pump With Novel Compensator
for Transient-Response Improvement in CMOS Image Sensors
- publisher: IEEE
- isbn:
- issn: 1558-3791
- rank: 815
- access_type: LOCKED
- content_type: Journals
-
abstract: This brief presents a low-ripple,
fully-integrated, linear-regulated charge pump with transient-response
improvement for CMOS image sensors. A compensator is proposed to
accelerate the recovery of the output when an undershoot occurs. The
regulated charge pump is designed with 0.11 μm 1-poly 4-metal CMOS
process and occupies an area of 0.073 mm2. According to the post-layout
simulation, the worst steady-state ripple is 0.95 mVPP and the recovery
time (99.9%) of the regulated output is 155 ns when the undershoot is
114 mV. The application of the compensator leads to a 78% decrease on
the recovery time. When achieving similar recovery time, the area cost
of the proposed topology is reduced by 49% compared to the traditional
method of increasing filter capacitance. The total power dissipation of
the charge pump is 1.476 mW, and the compensator only consumes 28 μW.
- article_number: 9236646
-
pdf_url:
https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9236646
-
html_url:
https://ieeexplore.ieee.org/document/9236646/
-
abstract_url:
https://ieeexplore.ieee.org/document/9236646/
-
publication_title: IEEE Transactions on Circuits and
Systems II: Express Briefs
- conference_location:
- conference_dates:
- publication_number: 8920
- is_number: 9387428
- publication_year: 2021
- publication_date: April 2021
- start_page: 1113
- end_page: 1117
- citing_paper_count: 4
- citing_patent_count: 0
- download_count: 1608
- insert_date: 20201022
-
index_terms:
-
ieee_terms:
- Regulators
- Charge pumps
- Voltage control
- Transient response
- Switches
- Capacitors
- Clocks
-
author_terms:
- CMOS image sensor
- charge pump
- low dropout regulator
- small ripple
- transient response
-
dynamic_index_terms:
- Transient Response
- Charge Pump
- Charge-pump
- Recovery Time
- Simulation Results
- Voltage Drop
- Potential Drop
- IR Drop
- Time Of Discharge
- Supply Voltage
- Traditional Design
- Total Capacitance
- Voltage Ripple
- Charge Redistribution
- Low Dropout
- Monte Carlo Simulation Results
- Monte-Carlo Simulation Results
- Gain Bandwidth
- Gain Bandwidths
- Output Voltage Ripple
-
authors:
-
Author Name: Jing Gao
Affiliation: School of Microelectronics, Tianjin
University, Tianjin, China
Author URL:
https://ieeexplore.ieee.org/author/38239776100
ID: 38239776100
Order: 1
Author Affiliations:
-
School of Microelectronics, Tianjin University, Tianjin, China
-
Tianjin Key Laboratory of Imaging and Sensing Microelectronic
Technology, Tianjin University, Tianjin, China
-
Author Name: Tianyu Gu
Affiliation: School of Microelectronics, Tianjin
University, Tianjin, China
Author URL:
https://ieeexplore.ieee.org/author/37088814518
ID: 37088814518
Order: 2
Author Affiliations:
-
School of Microelectronics, Tianjin University, Tianjin, China
-
Tianjin Key Laboratory of Imaging and Sensing Microelectronic
Technology, Tianjin University, Tianjin, China
-
Author Name: Kaiming Nie
Affiliation: School of Microelectronics, Tianjin
University, Tianjin, China
Author URL:
https://ieeexplore.ieee.org/author/37085670429
ID: 37085670429
Order: 3
Author Affiliations:
-
School of Microelectronics, Tianjin University, Tianjin, China
-
Tianjin Key Laboratory of Imaging and Sensing Microelectronic
Technology, Tianjin University, Tianjin, China
-
Author Name: Zhiyuan Gao
Affiliation: School of Microelectronics, Tianjin
University, Tianjin, China
Author URL:
https://ieeexplore.ieee.org/author/37085495653
ID: 37085495653
Order: 4
Author Affiliations:
-
School of Microelectronics, Tianjin University, Tianjin, China
-
Tianjin Key Laboratory of Imaging and Sensing Microelectronic
Technology, Tianjin University, Tianjin, China
-
Author Name: Jiangtao Xu
Affiliation: School of Microelectronics, Tianjin
University, Tianjin, China
Author URL:
https://ieeexplore.ieee.org/author/37577831800
ID: 37577831800
Order: 5
Author Affiliations:
-
School of Microelectronics, Tianjin University, Tianjin, China
-
Tianjin Key Laboratory of Imaging and Sensing Microelectronic
Technology, Tianjin University, Tianjin, China
Image Sensor
- sensor_type: CMOS
- resolution: Not specified
- dynamic_range: Not specified
- pixel_size: Not specified
- dark_current: Not specified
Optical Data
- focal_length: Not specified
- aperture: Not specified
- field_of_view: Not specified
- distortion: Not specified
Performance Metrics
- power_consumption: 1.476 mW
Applications & Benefits
-
cell_imaging: Applications include CMOS image sensors
for digital imaging in smartphones, medical devices, and automotive
systems.
-
benefits: Enables efficient conversion of light into
electrical signals for high-quality imaging.
Supporting Organizations
-
supported_by: National Key Research and Development
Plan of China
Manuscript Details
- publication_date: April 2021
Relevancy Score
- score: 9
-
missing_fields:
- resolution
- dynamic_range
- pixel_size
- dark_current
- focal_length
- aperture
- field_of_view
- distortion
- frame_rate
- signal_to_noise_ratio
- sensitivity
- shutter_speed
- noise
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