A Lowpower Cmos Image Sensor With Areaefficient 14Bit Twostep Sa Adcs Using Pseudomultiple Sampling Method

• doi: 10.1109/TCSII.2014.2387531
• title: A Low-Power CMOS Image Sensor With Area-Efficient 14-bit Two-Step SA ADCs Using Pseudomultiple Sampling Method
• publisher: IEEE
• isbn:
• issn: 1558-3791
• rank: 801
• access_type: LOCKED
• content_type: Journals
• abstract: This brief presents a low-power CMOS image sensor with 14-bit column-parallel two-step (TS) successive approximation (SA) analog-to-digital converters (ADCs). The proposed TS SA ADC adopts a pseudomultiple sampling method to reduce the power consumption and the area. For implementing the 14-bit ADC, it only uses a capacitor digital-to-analog converter of 6 bits rather than 14 bits. The multiple sampling also suppresses the noise of a pixel and a column-parallel ADC. The image sensor is fabricated by using the 0.13-μm CMOS process. The measurement results show that the temporal noise is 82.7 μVrms, and the power consumption is 55.1 μW for one column ADC with a programmable gain amplifier. With the digital correlated double sampling and the TS calibration method, the proposed ADC achieves the column fixed-pattern noise of 0.98 LSB and a differential nonlinearity of +0.99/-0.90 LSB.
• article_number: 7001248
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7001248
• html_url: https://ieeexplore.ieee.org/document/7001248/
• abstract_url: https://ieeexplore.ieee.org/document/7001248/
• publication_title: IEEE Transactions on Circuits and Systems II: Express Briefs
• conference_location:
• conference_dates:
• publication_number: 8920
• is_number: 7094329
• publication_year: 2015
• publication_date: May 2015
• start_page: 451
• end_page: 455
• citing_paper_count: 27
• citing_patent_count: 0
• download_count: 2459
• insert_date: 20150105
• index_terms:
  • ieee_terms:
    • Noise
    • Capacitors
    • Calibration
    • Power demand
    • CMOS image sensors
    • Arrays
  • author_terms:
    • Column-parallel ADC
    • digital CDS
    • pseudomultiple sampling
    • SA ADC, small area
    • Column-parallel analog-to-digital (A/D) converter (ADC)
    • digital correlated double sampling (CDS)
    • pseudomultiple sampling (PMS)
    • successive approximation (SA) ADC
    • small area
  • dynamic_index_terms:
    • Sampling Method
    • Analog-to-digital Converter
    • Analog-to-digital
    • Digital-to-analog Converter
    • Image Sensor
    • Camera Sensor
    • Low-power Sensors
    • Low Power Images
    • Power Consumption
    • Successive Approximation
    • CMOS Process
    • Temporal Noise
    • Signal-to-noise
    • Signal-to-noise Ratio
    • Multiplexing
    • Input Voltage
    • Linear Calibration
    • Clock Frequency
    • Digital Circuits
    • Digital Circuitry
    • Digital Output
    • Offset Voltage
    • Subtraction Operation
    • Pixel Noise
    • Gain Error
    • Sign Bit
    • Readout Circuit
    • Dual Operation
    • Lowest Noise
• authors:
  • Author Name: Jong-Boo Kim
    Affiliation: Department of Electronic Engineering, College of Engineering, Hanyang University, Seoul, Korea
    Author URL: https://ieeexplore.ieee.org/author/37859688500
    ID: 37859688500
    Order: 1
    Author Affiliations:
    • Department of Electronic Engineering, College of Engineering, Hanyang University, Seoul, Korea
  • Author Name: Seong-Kwan Hong
    Affiliation: Department of Electronic Engineering, College of Engineering, Hanyang University, Seoul, Korea
    Author URL: https://ieeexplore.ieee.org/author/37085359277
    ID: 37085359277
    Order: 2
    Author Affiliations:
    • Department of Electronic Engineering, College of Engineering, Hanyang University, Seoul, Korea
  • Author Name: Oh-Kyong Kwon
    Affiliation: Department of Electronic Engineering, College of Engineering, Hanyang University, Seoul, Korea
    Author URL: https://ieeexplore.ieee.org/author/37276791400
    ID: 37276791400
    Order: 3
    Author Affiliations:
    • Department of Electronic Engineering, College of Engineering, Hanyang University, Seoul, Korea

Image Sensor

• sensor_type: CMOS
• resolution: 648x488
• dynamic_range: N/A
• pixel_size: N/A
• dark_current: N/A

Optical Data

• focal_length: N/A
• aperture: N/A
• field_of_view: N/A
• distortion: N/A

Performance Metrics

• frame_rate: 120 fps
• signal_to_noise_ratio: N/A
• sensitivity: N/A
• shutter_speed: N/A
• power_consumption: 78 mW
• noise: 82.7 μV rms

Applications & Benefits

• cell_imaging: Used in digital imaging for mobile devices, medical devices, automotive systems etc.
• benefits: Low power consumption, high resolution, low noise, area-efficient design.

Supporting Organizations

• supported_by: Image Frontier Center, Samsung Electronics Company, Ltd.

Manuscript Details

• publication_date: May 2015

Relevancy Score

• score: 10
• missing_fields:
  • fill factor
  • quantum efficiency
  • readout speed
  • noise sources

Processed JSON Filename

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