A Lowpower 6514Nm Stacked Cmos Image Sensor

• doi: 10.1109/ISCAS45731.2020.9180435
• title: A Low-Power 65/14nm Stacked CMOS Image Sensor
• publisher: IEEE
• isbn: 978-1-7281-3320-1
• issn: 2158-1525
• rank: 799
• access_type: LOCKED
• content_type: Conferences
• abstract: This paper presents a low-power stacked CMOS image sensor (CIS) in 65/14nm process. With 14nm process, we could achieve 29% less power consumption than the conventional CIS in 65/28nm process. The measured random telegraph noise (RTN) result shows the 65/14nm stacked CIS to guarantee the commercial sensor image quality even though a fin field-effect transistor (FinFET) process is three-dimension channel structure. The pixel array of the implemented chip consists of 12-mega pixels (Mp) with a dual-photodiode (2PD) in 1.4μm pixel pitch, and the sensor output provides 120 frames per second while it consumes 612mW for 12Mp image and 3Mp auto-focus data via a mobile industry processor interface (MIPI) physical layer (DPHY) up to 6.5Gbps/lane. The measured random noise is 2.2e-at 16× analog gain, and figure-of-merit (FoM) of analog-to-digital converters (ADCs) achieves 0.46e-nJ.
• article_number: 9180435
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9180435
• html_url: https://ieeexplore.ieee.org/document/9180435/
• abstract_url: https://ieeexplore.ieee.org/document/9180435/
• publication_title: 2020 IEEE International Symposium on Circuits and Systems (ISCAS)
• conference_location: Seville, Spain
• conference_dates: 12-14 Oct 2020
• publication_number: 9179985
• is_number: 9180369
• publication_year: 2020
• publication_date: 12-14 Oct 2020
• start_page: 1
• end_page: 4
• citing_paper_count: 7
• citing_patent_count: 0
• download_count: 4185
• insert_date: 20200928
• index_terms:
  • ieee_terms:
    • CMOS image sensors
    • Logic circuits
    • Logic gates
    • FinFETs
    • Power demand
    • Semiconductor device measurement
  • author_terms:
    • CMOS image sensor (CIS)
    • Low-power CIS
    • 65/14nm Stacked CIS
  • dynamic_index_terms:
    • Imaging Data
    • Power Consumption
    • Random Noise
    • Analog-to-digital Converter
    • Physical Layer
    • Mobile Interface
    • Learning Algorithms
    • Wireless
    • Internet Of Things
    • Pixel Resolution
    • Phase-locked Loop
    • Planar Devices
    • Switching Transistors
• isbn_formats:
  • format: Print ISBN, value: 978-1-7281-3320-1, isbnType: New-2005
• authors:
  • Author Name: Minho Kwon
    Affiliation: Samsung Electronics, Hwaseong, South Korea
    Author URL: https://ieeexplore.ieee.org/author/37270067800
    ID: 37270067800
    Order: 1
    Author Affiliations:
    • Samsung Electronics, Hwaseong, South Korea
  • Author Name: Seunghyun Lim
    Affiliation: Samsung Electronics, Hwaseong, South Korea
    Author URL: https://ieeexplore.ieee.org/author/37073476100
    ID: 37073476100
    Order: 2
    Author Affiliations:
    • Samsung Electronics, Hwaseong, South Korea
  • Author Name: Hyeokjong Lee
    Affiliation: Samsung Electronics, Hwaseong, South Korea
    Author URL: https://ieeexplore.ieee.org/author/37088933325
    ID: 37088933325
    Order: 3
    Author Affiliations:
    • Samsung Electronics, Hwaseong, South Korea
  • Author Name: Il-Seon Ha
    Affiliation: Samsung Electronics, Hwaseong, South Korea
    Author URL: https://ieeexplore.ieee.org/author/37088726592
    ID: 37088726592
    Order: 4
    Author Affiliations:
    • Samsung Electronics, Hwaseong, South Korea
  • Author Name: Moo-Young Kim
    Affiliation: Samsung Electronics, Hwaseong, South Korea
    Author URL: https://ieeexplore.ieee.org/author/37087883341
    ID: 37087883341
    Order: 5
    Author Affiliations:
    • Samsung Electronics, Hwaseong, South Korea
  • Author Name: Il-Jin Seo
    Affiliation: Samsung Electronics, Hwaseong, South Korea
    Author URL: https://ieeexplore.ieee.org/author/37088935228
    ID: 37088935228
    Order: 6
    Author Affiliations:
    • Samsung Electronics, Hwaseong, South Korea
  • Author Name: Suho Lee
    Affiliation: Samsung Electronics, Hwaseong, South Korea
    Author URL: https://ieeexplore.ieee.org/author/37088931010
    ID: 37088931010
    Order: 7
    Author Affiliations:
    • Samsung Electronics, Hwaseong, South Korea
  • Author Name: Yongsuk Choi
    Affiliation: Samsung Electronics, Hwaseong, South Korea
    Author URL: https://ieeexplore.ieee.org/author/37088934439
    ID: 37088934439
    Order: 8
    Author Affiliations:
    • Samsung Electronics, Hwaseong, South Korea
  • Author Name: Kyunghoon Kim
    Affiliation: Samsung Electronics, Hwaseong, South Korea
    Author URL: https://ieeexplore.ieee.org/author/37880199500
    ID: 37880199500
    Order: 9
    Author Affiliations:
    • Samsung Electronics, Hwaseong, South Korea
  • Author Name: Hansoo Lee
    Affiliation: Samsung Electronics, Hwaseong, South Korea
    Author URL: https://ieeexplore.ieee.org/author/37088680183
    ID: 37088680183
    Order: 10
    Author Affiliations:
    • Samsung Electronics, Hwaseong, South Korea
  • Author Name: Won-Woong Kim
    Affiliation: Samsung Electronics, Hwaseong, South Korea
    Author URL: https://ieeexplore.ieee.org/author/37088734944
    ID: 37088734944
    Order: 11
    Author Affiliations:
    • Samsung Electronics, Hwaseong, South Korea
  • Author Name: Seonghye Park
    Affiliation: Samsung Electronics, Hwaseong, South Korea
    Author URL: https://ieeexplore.ieee.org/author/37406947000
    ID: 37406947000
    Order: 12
    Author Affiliations:
    • Samsung Electronics, Hwaseong, South Korea
  • Author Name: Kyongmin Koh
    Affiliation: Samsung Electronics, Hwaseong, South Korea
    Author URL: https://ieeexplore.ieee.org/author/37087452166
    ID: 37087452166
    Order: 13
    Author Affiliations:
    • Samsung Electronics, Hwaseong, South Korea
  • Author Name: Jesuk Lee
    Affiliation: Samsung Electronics, Hwaseong, South Korea
    Author URL: https://ieeexplore.ieee.org/author/37088733976
    ID: 37088733976
    Order: 14
    Author Affiliations:
    • Samsung Electronics, Hwaseong, South Korea
  • Author Name: Yongin Park
    Affiliation: Samsung Electronics, Hwaseong, South Korea
    Author URL: https://ieeexplore.ieee.org/author/37088737955
    ID: 37088737955
    Order: 15
    Author Affiliations:
    • Samsung Electronics, Hwaseong, South Korea

Image Sensor

• sensor_type: CMOS
• resolution: 4032(H) x 3040(V) 12.2M pixels
• dynamic_range: 65dB
• pixel_size: 1.4µm x 1.4µm (Dual PD)
• dark_current: not specified

Optical Data

• focal_length: not specified
• aperture: not specified
• field_of_view: not specified
• distortion: not specified

Performance Metrics

• frame_rate: 120fps
• power_consumption: 612mW
• noise: 2.22e- at 16x analog gain

Applications & Benefits

• cell_imaging: Used in smartphones, medical devices, automotive systems, and IoT applications
• benefits: Low power consumption and high-quality images with advanced features such as dual-photodiode

Supporting Organizations

• supported_by: Samsung Foundry, Sensor Design Team, Pixel Design and Solution Team of S.LSI

Manuscript Details

• publication_date: 12-14 Oct 2020

Relevancy Score

• score: 10
• missing_fields:
  • fill factor
  • quantum efficiency
  • noise sources
  • readout speed
  • microlenses
  • on-chip colour filters
  • global or rolling shutters
  • backside illumination
  • analogue-to-digital conversion techniques

Processed JSON Filename

request_3a8973bc-bb28-4dd8-a1af-6cd05e9216bb-a_lowpower_6514nm_stacked_cmos_image_sensor.json