A Lownoise And Areaefficient Pwm Delta Sigma Adc Using A Singleslope Quantizer For Cmos Image Sensors

• doi: 10.1109/TED.2015.2430846
• title: A Low-Noise and Area-Efficient PWM- $\Delta \Sigma $ ADC Using a Single-Slope Quantizer for CMOS Image Sensors
• publisher: IEEE
• isbn:
• issn: 1557-9646
• rank: 797
• access_type: LOCKED
• content_type: Journals
• abstract: This paper proposes a multibit pulsewidth modulated (PWM) delta-sigma (ΔΣ) analog-to-digital converter (ADC) using a single-slope (SS) quantizer for a CMOS image sensor (CIS). In the proposed ADC, the multibit ΔΣ modulation is performed by converting the pulsewidth of the PWM signal into multibit data using an SS quantizer. This suppresses the random noise by the multi-sampling operation and reduces the area of the multibit ΔΣ ADC by adding a ramp signal to a single-bit ΔΣ ADC. The proposed ADC with 12-b resolution was fabricated using a 0.13-μm CIS process with a pixel array which has a Bayer patterned color filter and an image format of 580 x 450 with a pixel size of 5 μm x 5 μm. The size of the test chip is 4 mm x 5 mm, including the area of the proposed channel ADC, which occupies only 10 μm x 400 μm per channel. The measured results show a random noise of 65 μV and a dynamic range of 70.4 dB.
• article_number: 7112101
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7112101
• html_url: https://ieeexplore.ieee.org/document/7112101/
• abstract_url: https://ieeexplore.ieee.org/document/7112101/
• publication_title: IEEE Transactions on Electron Devices
• conference_location:
• conference_dates:
• publication_number: 16
• is_number: 7365508
• publication_year: 2016
• publication_date: Jan. 2016
• start_page: 168
• end_page: 173
• citing_paper_count: 19
• citing_patent_count: 0
• download_count: 2582
• insert_date: 20150522
• index_terms:
  • ieee_terms:
    • Noise
    • Gain
    • Electronics packaging
    • Quantization (signal)
    • Arrays
    • Modulation
    • Noise measurement
  • author_terms:
    • CMOS image sensor (CIS)
    • column-parallel readout
    • delta-sigma (Δ Σ) analog-to-digital converter (ADC)
    • single-slope (SS) quantizer.
    • CMOS image sensor (CIS)
    • column-parallel readout
    • delta–sigma ( $\Delta \Sigma $ ) analog-to-digital converter (ADC)
    • single-slope (SS) quantizer
  • dynamic_index_terms:
    • Quantum
    • Pulse Width
    • Pulsewidth Modulation
    • Image Sensor
    • Camera Sensor
    • Dynamic Range
    • Random Noise
    • Channel Noise
    • Analog-to-digital Converter
    • Analog-to-digital
    • Digital-to-analog Converter
    • Pixel Array
    • Test Chip
    • Delta-sigma
    • Sigma-delta
    • Square Root
    • Light Intensity
    • Power Consumption
    • Output Data
    • Yield Data
    • Control Signal
    • Output Signal
    • Sensor Array
    • Low Light Intensity
    • Operation Speed
    • Conversion Time
    • Quantization Noise
    • Readout Circuit
    • Input-referred Noise
    • Increase In Light Intensity
    • Gain Compensation
    • Data Readout
    • Analog Domain
    • Feedback Path
    • Digital Domain
    • Small Pitch
• authors:
  • Author Name: Yun-Rae Jo
    Affiliation: Department of Electronics Engineering, Hanyang University, Seoul, Korea
    Author URL: https://ieeexplore.ieee.org/author/38244060100
    ID: 38244060100
    Order: 1
    Author Affiliations:
    • Department of Electronics Engineering, Hanyang University, Seoul, Korea
  • Author Name: Seong-Kwan Hong
    Affiliation: Department of Electronics Engineering, Hanyang University, Seoul, Korea
    Author URL: https://ieeexplore.ieee.org/author/37085359277
    ID: 37085359277
    Order: 2
    Author Affiliations:
    • Department of Electronics Engineering, Hanyang University, Seoul, Korea
  • Author Name: Oh-Kyong Kwon
    Affiliation: Department of Electronics Engineering, Hanyang University, Seoul, Korea
    Author URL: https://ieeexplore.ieee.org/author/37276791400
    ID: 37276791400
    Order: 3
    Author Affiliations:
    • Department of Electronics Engineering, Hanyang University, Seoul, Korea

Image Sensor

• sensor_type: CMOS
• resolution: 580x450
• dynamic_range: 70.4 dB
• pixel_size: 5μm x 5μm
• dark_current: not specified

Optical Data

• focal_length: not specified
• aperture: not specified
• field_of_view: not specified
• distortion: not specified

Performance Metrics

• frame_rate: 60 fps
• signal_to_noise_ratio: 54.2 dB
• sensitivity: 2.3 V/lx·s
• noise: 65 μV

Applications & Benefits

• cell_imaging: CMOS Image Sensors are used in a variety of imaging applications including smartphones and medical devices.
• benefits: Low noise and area-efficient readout with advancements in analog-to-digital conversion techniques.

Supporting Organizations

• supported_by: Dongbu HiTek Company, Ltd.

Manuscript Details

• publication_date: Jan. 2016

Relevancy Score

• score: 10
• missing_fields:
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • dark_current
  • shutter_speed
  • power_consumption

Processed JSON Filename

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