A Low Noise Currentmode Readout Circuit For Cmos Image Sensing Applications

• doi: 10.1109/ICVD.2004.1260991
• title: A low noise current-mode readout circuit for CMOS image sensing applications
• publisher: IEEE
• isbn: 0-7695-2072-3
• issn:
• rank: 1125
• access_type: LOCKED
• content_type: Conferences
• abstract: A major obstacle in current-mode CMOS image sensors is the transconductance gain mismatch across pixels, which translates to Fixed Pattern Noise (FPN), degrading the image quality. In this paper, we propose a highly linear and compact current-mode readout circuit that eliminates this mismatch by performing the voltage to current conversion within a unity gain feedback loop. It is further proposed that by using the Active Column Sensor (ACS) architecture, only two transistors from the readout circuit are required to be present at the pixel site, while the rest of the circuitry resides common to an entire column. This setup saves a significant amount of real estate. The circuit is designed in TSMC 0.25 /spl mu/m process, and simulation results are presented.
• article_number: 1260991
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1260991
• html_url: https://ieeexplore.ieee.org/document/1260991/
• abstract_url: https://ieeexplore.ieee.org/document/1260991/
• publication_title: 17th International Conference on VLSI Design. Proceedings.
• conference_location: Mumbai, India
• conference_dates: 9-9 Jan. 2004
• publication_number: 8911
• is_number: 28180
• publication_year: 2004
• publication_date: 9-9 Jan. 2004
• start_page: 635
• end_page: 638
• citing_paper_count: 1
• citing_patent_count: 0
• download_count: 375
• insert_date: 20040824
• index_terms:
  • ieee_terms:
    • Circuit noise
    • CMOS image sensors
    • Transconductance
    • Pixel
    • Degradation
    • Image quality
    • Feedback circuits
    • Voltage
    • Image converters
    • Performance gain
  • dynamic_index_terms:
    • Readout Circuit
    • Real Estate
    • Image Sensor
    • Camera Sensor
    • Active Sensors
    • High Linearity
    • Unity Gain
    • Impedance
    • Resistivity
    • Dynamic Range
    • Threshold Voltage
    • Voltage Swing
    • Differential Pair
    • Power Supply Voltage
    • Voltage Feedback
    • Switching Transistors
    • Compensation Capacitor
• isbn_formats:
  • format: Print ISBN, value: 0-7695-2072-3, isbnType: Historical
• authors:
  • Author Name: T. Das
    Affiliation: Department of Electrical Engineering, Rochester Institute of Technology, USA
    Author URL: https://ieeexplore.ieee.org/author/37273890900
    ID: 37273890900
    Order: 1
    Author Affiliations:
    • Department of Electrical Engineering, Rochester Institute of Technology, USA
  • Author Name: P.R. Mukund
    Affiliation: Department of Electrical Engineering, Rochester Institute of Technology, USA
    Author URL: https://ieeexplore.ieee.org/author/37273898100
    ID: 37273898100
    Order: 2
    Author Affiliations:
    • Department of Electrical Engineering, Rochester Institute of Technology, USA

Image Sensor

• sensor_type: CMOS
• resolution: Not specified
• dynamic_range: Not explicitly stated
• pixel_size: Not specified
• dark_current: Not specified

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

• frame_rate: 10 MHz
• power_consumption: 2 µA
• noise: FPN reduced, specific value not provided

Applications & Benefits

• cell_imaging: CMOS image sensors are used in various applications including smartphones, medical devices, and automotive systems.
• benefits: Compact integration of photon detectors, readout circuitry, and image processing enables reduced system size and cost, improved performance with low power consumption.

Supporting Organizations

• supported_by: New York State Office of Science, Technology and Academic Research (NYSTAR), Microelectronic Design Center, Photon Vision Systems, Inc.

Manuscript Details

• publication_date: 9-9 Jan. 2004

Relevancy Score

• score: 9
• missing_fields:
  • pixel size
  • dynamic range
  • quantum efficiency
  • dark current
  • signal-to-noise ratio
  • optical characteristics

Processed JSON Filename

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