A Low Noise And Linearity Improvement Cmos Image Sensor For Surveillance Camera With Skewrelaxation Local Multiply Circuit And Onchip Testable Ramp Generator

• doi: 10.1109/A-SSCC53895.2021.9634710
• title: A Low Noise and Linearity Improvement CMOS Image Sensor for Surveillance Camera with Skew-Relaxation Local Multiply Circuit and On-Chip Testable Ramp Generator
• publisher: IEEE
• isbn: 978-1-6654-4351-7
• issn:
• rank: 774
• access_type: LOCKED
• content_type: Conferences
• abstract: CMOS Image Sensors (CIS) are extensively used in the field of industries, surveillance, human identification, Time-of-Flight (ToF) sensor for ranging [1], capsule endoscope for medical examination [2], and so on. So, the demand for low-noise, high-speed, wide dynamic range and high-resolution CIS is still increasing. Because a dark image is easily affected the noise like random noise and pattern noise compared to a bright image, the low-noise CIS is very important for all applications, especially the application like the surveillance camera which need to operate under low illuminance such as at nighttime or in a dark place. Therefore, it is very important how to achieve low-noise and high-sensitivity under low illuminance. To realize the above needs, in addition to improving the pixel characteristics, both an Analog-to-Digital Converter (ADC) and a ramp generator which is essential for ADC operation need to achieve the noise suppression and the linearity improvement. Regarding above, the noise suppression scheme for single-slope ADCs and ramp generator has been reported [3–6]. This paper presents a new method to improve the circuit noise and linearity characteristics under low illuminance by adopting following three techniques, (1) a differential non-linearity (DNL) reduction scheme by a local multiply circuit (LMC), (2) a noise suppression ramp generator (NSRAMP), (3) a flexible test circuit for NSRAMP.
• article_number: 9634710
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9634710
• html_url: https://ieeexplore.ieee.org/document/9634710/
• abstract_url: https://ieeexplore.ieee.org/document/9634710/
• publication_title: 2021 IEEE Asian Solid-State Circuits Conference (A-SSCC)
• conference_location: Busan, Korea, Republic of
• conference_dates: 7-10 Nov. 2021
• publication_number: 9634699
• is_number: 9634177
• publication_year: 2021
• publication_date: 7-10 Nov. 2021
• start_page: 1
• end_page: 3
• citing_paper_count: 5
• citing_patent_count: 0
• download_count: 751
• insert_date: 20211210
• index_terms:
  • ieee_terms:
    • Industries
    • Endoscopes
    • Surveillance
    • Noise reduction
    • Linearity
    • CMOS image sensors
    • Cameras
  • dynamic_index_terms:
    • Low Noise
    • Surveillance Cameras
    • Ramp Generator
    • Nighttime
    • Random Noise
    • Channel Noise
    • Reduction Strategies
    • Reduction Scheme
    • Analog-to-digital Converter
    • Analog-to-digital
    • Digital-to-analog Converter
    • Future Performance
    • Future Operations
    • Future Function
    • Linear Features
    • Linear Characteristics
    • Noise Suppression
    • Active Noise Control
    • Noise-canceling
    • Noise Cancellation
    • Testing Techniques
    • Noise Characteristics
    • Noise Features
    • Flexible Electronics
    • Flexible Printed Circuit Board
    • Flexible Circuit
    • Dark Place
    • Local Circuits
    • Clock Frequency
    • Human Identification
    • Human IDs
    • Dark Images
    • Low Illumination
    • Test Circuit
• isbn_formats:
  • format: Print on Demand(PoD) ISBN, value: 978-1-6654-4351-7, isbnType: New-2005
  • format: Electronic ISBN, value: 978-1-6654-4350-0, isbnType: New-2005
• authors:
  • Author Name: Wataru Saito
    Affiliation: Renesas Electronics Corporation, Tokyo, Japan
    Author URL: https://ieeexplore.ieee.org/author/37273039000
    ID: 37273039000
    Order: 1
    Author Affiliations:
    • Renesas Electronics Corporation, Tokyo, Japan
  • Author Name: Yoichi Iizuka
    Affiliation: Renesas Electronics Corporation, Tokyo, Japan
    Author URL: https://ieeexplore.ieee.org/author/37089186247
    ID: 37089186247
    Order: 2
    Author Affiliations:
    • Renesas Electronics Corporation, Tokyo, Japan
  • Author Name: Norihito Kato
    Affiliation: Renesas Electronics Corporation, Tokyo, Japan
    Author URL: https://ieeexplore.ieee.org/author/37391260700
    ID: 37391260700
    Order: 3
    Author Affiliations:
    • Renesas Electronics Corporation, Tokyo, Japan
  • Author Name: Ryota Otake
    Affiliation: Renesas Electronics Corporation, Tokyo, Japan
    Author URL: https://ieeexplore.ieee.org/author/37072232800
    ID: 37072232800
    Order: 4
    Author Affiliations:
    • Renesas Electronics Corporation, Tokyo, Japan
  • Author Name: Fukashi Morishita
    Affiliation: Renesas Electronics Corporation, Tokyo, Japan
    Author URL: https://ieeexplore.ieee.org/author/37269135900
    ID: 37269135900
    Order: 5
    Author Affiliations:
    • Renesas Electronics Corporation, Tokyo, Japan

Image Sensor

• sensor_type: CMOS
• resolution: 3840 x 2160
• dynamic_range: Not specified in the text
• pixel_size: 1.85 x 1.85 µm
• dark_current: Not specified in the text

Optical Data

• focal_length: Not specified in the text
• aperture: Not specified in the text
• field_of_view: Not specified in the text
• distortion: Not specified in the text

Performance Metrics

• frame_rate: 60 fps
• signal_to_noise_ratio: Not specified in the text
• sensitivity: Not specified in the text
• shutter_speed: Not specified in the text
• power_consumption: Not specified in the text
• noise: Random noise of 283 µVrms

Applications & Benefits

• cell_imaging: The paper discusses applications for low-light environments, particularly in surveillance cameras.
• benefits: Realizes low noise and high linearity which is crucial for low illuminance situations.

Supporting Organizations

• supported_by: Renesas Electronics Corporation, Tokyo, Japan

Manuscript Details

• publication_date: 7-10 Nov. 2021

Relevancy Score

• score: 10
• missing_fields:
  • dynamic_range
  • dark_current
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed
  • power_consumption
  • focal_length
  • aperture
  • field_of_view
  • distortion

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