A Low Noise 83Mpixel Cmos Image Sensor With Selectable Multiple Sampling Technique By 536 Ghz Global Counter And Dual Latch Skew Canceler

• doi: 10.1109/TCSI.2025.3528426
• title: A Low Noise 8.3-Mpixel CMOS Image Sensor With Selectable Multiple Sampling Technique by 5.36 GHz Global Counter and Dual Latch Skew Canceler
• publisher: IEEE
• isbn:
• issn: 1558-0806
• rank: 769
• access_type: LOCKED
• content_type: Journals
• abstract: This document presents a CMOS image sensor (CIS) with a high-speed single slope ADC(SS-ADC) that has a novel high-speed counter and can reduce temporal noise in a wide range of frequency components by enabling correlated multiple sampling (CMS) and digital correlated double sampling (DCDS) at high frame rates. The test chip was fabricated in 55nm process and has 8.3M pixels. The counter was confirmed to operate at a frequency equivalent to 5.36GHz. It uses a circuit and dedicated counter code that suppresses differential non-linearity (DNL) deterioration due to faster counter speeds. When CMS is performed 4 times at 30 frames per second (fps), the random noise is 187uVrms, which is a 31% improvement in noise compared to when CMS is not performed.
• article_number: 10852513
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10852513
• html_url: https://ieeexplore.ieee.org/document/10852513/
• abstract_url: https://ieeexplore.ieee.org/document/10852513/
• publication_title: IEEE Transactions on Circuits and Systems I: Regular Papers
• conference_location:
• conference_dates:
• publication_number: 8919
• is_number: 10905058
• publication_year: 2025
• publication_date: March 2025
• start_page: 1105
• end_page: 1113
• citing_paper_count: 0
• citing_patent_count: 0
• download_count: 285
• insert_date: 20250124
• index_terms:
  • ieee_terms:
    • Noise
    • Codes
    • Circuits
    • Clocks
    • Reflective binary codes
    • Frequency conversion
    • Delays
    • Voltage
    • Latches
    • Surveillance
  • author_terms:
    • SS-ADC
    • CMOS image sensor
    • noise reduction
    • high speed counter
    • correlated multiple sampling
  • dynamic_index_terms:
    • Low Noise
    • Image Sensor
    • Camera Sensor
    • Global Counter
    • Random Noise
    • Channel Noise
    • Frame Rate
    • High Frame Rate
    • Test Chip
    • High Speed
    • Noise Sources
    • Analog-to-digital Converter
    • Analog-to-digital
    • Digital-to-analog Converter
    • Operating Frequency
    • Transmission Delay
    • Low Light Conditions
    • High Dynamic Range
    • Operation Speed
    • Low-frequency Noise
    • Surveillance Cameras
    • Counting System
    • Signal Delay
    • Leftmost Column
    • Gray Code
    • Grey Number
    • Number Of Conversations
    • Input Clock
    • Voltage Gradient
• authors:
  • Author Name: Yoichi Iizuka
    Affiliation: Renesas Electronics Corporation, Kodaira, Japan
    Author URL: https://ieeexplore.ieee.org/author/37089186247
    ID: 37089186247
    Order: 1
    Author Affiliations:
    • Renesas Electronics Corporation, Kodaira, Japan
  • Author Name: Akihide Maezono
    Affiliation: Renesas Electronics Corporation, Kodaira, Japan
    Author URL: https://ieeexplore.ieee.org/author/455607043106527
    ID: 455607043106527
    Order: 2
    Author Affiliations:
    • Renesas Electronics Corporation, Kodaira, Japan
  • Author Name: Wataru Saito
    Affiliation: Renesas Electronics Corporation, Kodaira, Japan
    Author URL: https://ieeexplore.ieee.org/author/37273039000
    ID: 37273039000
    Order: 3
    Author Affiliations:
    • Renesas Electronics Corporation, Kodaira, Japan
  • Author Name: Kazuhiko Takami
    Affiliation: Renesas Electronics Corporation, Kodaira, Japan
    Author URL: https://ieeexplore.ieee.org/author/551592039340959
    ID: 551592039340959
    Order: 4
    Author Affiliations:
    • Renesas Electronics Corporation, Kodaira, Japan
  • Author Name: Fukashi Morishita
    Affiliation: Renesas Electronics Corporation, Kodaira, Japan
    Author URL: https://ieeexplore.ieee.org/author/37269135900
    ID: 37269135900
    Order: 5
    Author Affiliations:
    • Renesas Electronics Corporation, Kodaira, Japan

Image Sensor

• sensor_type: CMOS
• resolution: 8.3M pixels
• dynamic_range: Not explicitly stated
• pixel_size: Not explicitly stated
• dark_current: Not explicitly stated

Optical Data

• focal_length: Not explicitly stated
• aperture: Not explicitly stated
• field_of_view: Not explicitly stated
• distortion: Not explicitly stated

Performance Metrics

• frame_rate: 30 fps
• signal_to_noise_ratio: Not explicitly stated
• sensitivity: Not explicitly stated
• shutter_speed: Not explicitly stated
• power_consumption: Not explicitly stated
• noise: 187 uVrms after CMS applied

Applications & Benefits

• cell_imaging: Surveillance and other imaging applications requiring low light performance
• benefits: Reduction of random noise by 31% when using correlated multiple sampling (CMS) and digital correlated double sampling (DCDS), capabilities for high-speed operation at frame rates of 30 fps.

Supporting Organizations

• supported_by: Renesas Electronics Corporation

Manuscript Details

• publication_date: March 2025

Relevancy Score

• score: 9
• missing_fields:
  • fill factor
  • quantum efficiency
  • readout speed
  • noise sources
  • analog-to-digital conversion techniques
  • design considerations like microlenses and on-chip color filters

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