A Highresolution Image Acquisition Method With Defectpixel Recovery For Solidstate Image Sensors

• doi: 10.1109/ICIP.2001.958678
• title: A high-resolution image acquisition method with defect-pixel recovery for solid-state image sensors
• publisher: IEEE
• isbn: 0-7803-6725-1
• issn:
• partnum: 01CH37205
• rank: 1100
• access_type: LOCKED
• content_type: Conferences
• abstract: For super-high-resolution image acquisition beyond HDTV, a CMOS image sensor is the most promising. At present, a CMOS image sensor with spatial resolution of 3K/spl times/4K and temporal resolution of 30 fps is being developed. The serious problem in fabricating such a super-high-resolution CMOS image sensor is a tremendously low yield rate, which is caused by occurrence of defect pixels. If defect pixels are recovered by some post-processing, we can improve the yield rate dramatically. From this point of view, we propose a new high-resolution image acquisition method which makes it possible to utilize a CMOS image sensor having many defect pixels. Our method deliberately takes a defocused image using an image sensor having defect pixels, applies a certain image recovery algorithm to it, and thus produces its focused and repaired version. We study the frequency response of our method using one-dimensionally sinusoidally changing chart images, and perform some experimental simulations on real images.
• article_number: 958678
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=958678
• html_url: https://ieeexplore.ieee.org/document/958678/
• abstract_url: https://ieeexplore.ieee.org/document/958678/
• publication_title: Proceedings 2001 International Conference on Image Processing (Cat. No.01CH37205)
• conference_location: Thessaloniki, Greece
• conference_dates: 7-10 Oct. 2001
• publication_number: 7594
• is_number: 20718
• publication_year: 2001
• publication_date: 7-10 Oct. 2001
• start_page: 1053
• end_page: 1056 vol.2
• citing_paper_count: 2
• citing_patent_count: 2
• download_count: 251
• insert_date: 20020807
• index_terms:
  • ieee_terms:
    • Solid state circuits
    • Image sensors
    • Spatial resolution
    • CMOS image sensors
    • Pixel
    • Image resolution
    • HDTV
    • Motion pictures
    • CMOS technology
    • Capacitance
  • dynamic_index_terms:
    • High-resolution
    • Image Sensor
    • Camera Sensor
    • High-resolution Methods
    • Image Acquisition Methods
    • Acquisition Of High-resolution Images
    • High Resolution Image Acquisition
    • Spatial Resolution
    • Frequency Response
    • Super-resolution
    • Super-resolution Imaging
    • Defocus
    • Yield Rate
    • Output Rate
    • Image Recovery
    • Image Pixels
    • Fixed Point
    • Interpolation Method
    • Scene Images
    • Spatial Resolution Images
    • Recovery Method
    • Shot Noise
    • Poisson Noise
    • Black Spots
    • Neighboring Pixels
    • Neighborhood Pixels
    • Adjoint Operator
    • Adjoint Problem
    • Hermitian Conjugate
    • Pixel Intensity Values
    • Imaging Frequency
• isbn_formats:
  • format: Print ISBN, value: 0-7803-6725-1, isbnType: Historical
• authors:
  • Author Name: T. Komatsu
    Affiliation: Department of Electrical Engineering, Kanagawa University, Yokohama, Japan
    Author URL: https://ieeexplore.ieee.org/author/37290101300
    ID: 37290101300
    Order: 1
    Author Affiliations:
    • Department of Electrical Engineering, Kanagawa University, Yokohama, Japan
  • Author Name: T. Saito
    Affiliation: Department of Electrical Engineering, Kanagawa University, Yokohama, Japan
    Author URL: https://ieeexplore.ieee.org/author/37289525400
    ID: 37289525400
    Order: 2
    Author Affiliations:
    • Department of Electrical Engineering, Kanagawa University, Yokohama, Japan

Image Sensor

• sensor_type: CMOS
• resolution: 3K x 4K
• dynamic_range: higher than 46 dB
• pixel_size: estimated at approximately 50 µm
• dark_current: not specified

Optical Data

• focal_length: not specified
• aperture: not specified
• field_of_view: not specified
• distortion: not specified

Performance Metrics

• frame_rate: 30fps
• signal_to_noise_ratio: higher than 46 dB

Applications & Benefits

• cell_imaging: not specified
• benefits: Improves yield rate by recovering defect pixels and enhancing image quality.

Supporting Organizations

• supported_by: not specified

Manuscript Details

• publication_date: 7-10 Oct. 2001

Relevancy Score

• score: 10

Processed JSON Filename

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