A High Dynamic Range Cmos Image Sensor With Inpixel Floatingnode Analog Memory For Pixel Level Integration Time Control

• doi: 10.1109/VLSIC.2006.1705294
• title: A High Dynamic Range CMOS Image Sensor with In-Pixel Floating-Node Analog Memory for Pixel Level Integration Time Control
• publisher: IEEE
• isbn: 1-4244-0006-6
• issn: 2158-5636
• rank: 741
• access_type: LOCKED
• content_type: Conferences
• abstract: In this paper we report a high dynamic range CMOS image sensor (CIS) with in-pixel floating-node analog memory for pixel level integration time control. Each pixel has different integration time based upon the amount of its previous frame illumination. We can implement true CDS technique to reduce reset noise without any additional hardware because we use a floating-node parasitic capacitor as an analog memory. In the fabricated test sensor, we could achieve the extended dynamic range by more than 42dB. To the best of our knowledge, this is the first report on the use of pixel-node parasitic capacitor as an analog memory for the extension of dynamic range
• article_number: 1705294
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1705294
• html_url: https://ieeexplore.ieee.org/document/1705294/
• abstract_url: https://ieeexplore.ieee.org/document/1705294/
• publication_title: 2006 Symposium on VLSI Circuits, 2006. Digest of Technical Papers.
• conference_location: Honolulu, HI, USA
• conference_dates: 15-17 June 2006
• publication_number: 11174
• is_number: 35987
• publication_year: 2006
• publication_date: 15-17 June 2006
• start_page: 25
• end_page: 26
• citing_paper_count: 9
• citing_patent_count: 1
• download_count: 629
• insert_date: 20070220
• index_terms:
  • ieee_terms:
    • Dynamic range
    • CMOS image sensors
    • Analog memory
    • Pixel
    • Capacitors
    • Computational Intelligence Society
    • Lighting
    • Noise reduction
    • Hardware
    • Testing
  • dynamic_index_terms:
    • Dynamic Range
    • Integration Time
    • High Dynamic Range
    • Dynamic Sensor
    • Analog Memory
    • Parasitic Capacitance
    • Additional Hardware
    • Image Reconstruction
    • Iterative Reconstruction
    • Tomographic Reconstruction
    • High-quality Images
    • Sensor Resolution
    • Readout Time
    • Sensor Pixel
    • Huge Memory
• isbn_formats:
  • format: Print ISBN, value: 1-4244-0006-6, isbnType: Historical
• authors:
  • Author Name: S.-W. Han
    Affiliation: Department of Electrical Engineering and Computer Science, Korea Advanced Institute of Science and Technology, Daejeon, South Korea
    Author URL: https://ieeexplore.ieee.org/author/37335525300
    ID: 37335525300
    Order: 1
    Author Affiliations:
    • Department of Electrical Engineering and Computer Science, Korea Advanced Institute of Science and Technology, Daejeon, South Korea
  • Author Name: S.-J. Kim
    Affiliation: Department of Electrical Engineering and Computer Science, Korea Advanced Institute of Science and Technology, Daejeon, South Korea
    Author URL: https://ieeexplore.ieee.org/author/38183923800
    ID: 38183923800
    Order: 2
    Author Affiliations:
    • Department of Electrical Engineering and Computer Science, Korea Advanced Institute of Science and Technology, Daejeon, South Korea
  • Author Name: J.-H. Choi
    Affiliation: Department of Electrical Engineering and Computer Science, University of Minnesota, Minneapolis, MN, USA
    Author URL: https://ieeexplore.ieee.org/author/37066872300
    ID: 37066872300
    Order: 3
    Author Affiliations:
    • Department of Electrical Engineering and Computer Science, University of Minnesota, Minneapolis, MN, USA
    • Department of Electrical Engineering and Computer Science, Korea Advanced Institute of Science and Technology, Daejeon, South Korea
  • Author Name: C.-K. Kim
    Affiliation: Department of Electrical Engineering and Computer Science, Korea Advanced Institute of Science and Technology, South Korea
    Author URL: https://ieeexplore.ieee.org/author/37085429655
    ID: 37085429655
    Order: 4
    Author Affiliations:
    • Department of Electrical Engineering and Computer Science, Korea Advanced Institute of Science and Technology, South Korea
  • Author Name: E. Yoon
    Affiliation: Department of Electrical Engineering and Computer Science, University of Minnesota, Minneapolis, MN, USA
    Author URL: https://ieeexplore.ieee.org/author/37275464600
    ID: 37275464600
    Order: 5
    Author Affiliations:
    • Department of Electrical Engineering and Computer Science, University of Minnesota, Minneapolis, MN, USA

Image Sensor

• sensor_type: CMOS
• resolution: 684×512
• dynamic_range: 42dB extended
• pixel_size: 3µm×3µm
• dark_current: not specified

Optical Data

• focal_length: not specified
• aperture: not specified
• field_of_view: not specified
• distortion: not specified

Performance Metrics

• sensitivity: 0.19V/Lux•sec
• power_consumption: 100mW

Applications & Benefits

• cell_imaging: not specified
• benefits: Achieves low reset noise without significant additional hardware, allowing for high dynamic range images.

Supporting Organizations

• supported_by: Brain Science Research Center at KAIST

Manuscript Details

• publication_date: 15-17 June 2006

Relevancy Score

• score: 10
• missing_fields:
  • fill_factor
  • quantum_efficiency
  • readout_speed
  • noise_sources
  • microlenses
  • on-chip colour filters
  • global or rolling shutters
  • backside illumination

Processed JSON Filename

request_1d6ec246-0766-49b5-a1e6-a1b0e345728d-a_high_dynamic_range_cmos_image_sensor_with_inpixel_floatingnode_analog_memory_for_pixel_level_integration_time_control.json