A Gradientgated Spad Array For Nonlineofsight Imaging

• doi: 10.1109/JSTQE.2023.3283150
• title: A Gradient-Gated SPAD Array for Non-Line-of-Sight Imaging
• publisher: IEEE
• isbn:
• issn: 1558-4542
• rank: 734
• access_type: LOCKED
• content_type: Journals
• abstract: Time-resolved non-line-of-sight (NLOS) imaging based on single-photon avalanche diode (SPAD) detectors have demonstrated impressive results in recent years. To acquire adequate number of indirect photons from a hidden scene in the presence of overwhelming amount of early-arrival photons, a single-gated SPAD is widely employed to mitigate pile-up. However, additional prior knowledge of the hidden range and relay surface profile are required to preset the gating position and implement the reconstruction. With this work, we propose a gradient-gated technique to alleviate these shortcomings (pile-up and prior knowledge) in NLOS imaging with the development of a 6 × 6 SPAD array fabricated in a standard 55-nm Bipolar-CMOS-DMOS (BCD) technology. The SPAD sensor includes a delay-locked loop (DLL) block, a gating generator and a pixel array, which can be flexibly configured to free-running, single-gating and gradient-gating modes. The rise time of the gates is less than 450 ps (from 10% to 90%). In gradient-gating mode, the interval time between adjacent gates can be configured from 300 ps to 2 ns. In single-gating mode, the minimum gate window is measured below 5 ns. We demonstrated the sensor in a confocal NLOS imaging system that reconstructs hidden scenes with both retroreflective and diffuse objects. The presented scheme enables the development of calibration-free NLOS imaging modality for practical applications.
• article_number: 10144311
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10144311
• html_url: https://ieeexplore.ieee.org/document/10144311/
• abstract_url: https://ieeexplore.ieee.org/document/10144311/
• publication_title: IEEE Journal of Selected Topics in Quantum Electronics
• conference_location:
• conference_dates:
• publication_number: 2944
• is_number: 10363134
• publication_year: 2024
• publication_date: Jan.-Feb. 2024
• start_page: 1
• end_page: 10
• citing_paper_count: 3
• citing_patent_count: 0
• download_count: 832
• insert_date: 20230605
• index_terms:
  • ieee_terms:
    • Single-photon avalanche diodes
    • Logic gates
    • Image processing
    • Photonics
    • Nonlinear optics
    • Field programmable gate arrays
    • Detectors
    • CMOS technology
    • Avalanche photodiodes
  • author_terms:
    • BCD
    • CMOS
    • DLL
    • gating
    • gradient-gated
    • LiDAR
    • non-line-of-sight imaging
    • NLOS
    • pile-up
    • single-photon avalanche diode
    • SPAD
  • dynamic_index_terms:
    • Single-photon Avalanche Diode
    • Single-photon Avalanche Diode Array
    • Rise Time
    • Retroreflective
    • Confocal Imaging System
    • Flexible Configuration
    • Illumination
    • Lighting
    • Dynamic Range
    • Acquisition Time
    • Light Detection And Ranging
    • Lidar
    • Reconstruction Algorithm
    • Time-correlated Single-photon Counting
    • TCSPC
    • High Dynamic Range
    • Delay Line
    • Direct Reflection
    • Surface Information
    • Gate Signals
    • Scan Position
    • Timing Diagram
    • Gate Length
    • Photon Arrival Times
    • Optical Gating
    • Hidden Object
    • Time-resolved Imaging
    • Gating Technique
    • Successful Reconstruction
    • Point Scanning
    • Maximum Intensity Projection
    • Near-infrared Spectroscopy
    • Near-infrared Spectra
    • Reconstruction Results
• authors:
  • Author Name: Jiuxuan Zhao
    Affiliation: School of Engineering, Ecole Polytechnique Federale de Lausanne (EPFL), Neuchatel, Switzerland
    Author URL: https://ieeexplore.ieee.org/author/37089361751
    ID: 37089361751
    Order: 1
    Author Affiliations:
    • School of Engineering, Ecole Polytechnique Federale de Lausanne (EPFL), Neuchatel, Switzerland
  • Author Name: Francesco Gramuglia
    Affiliation: EPFL, Neuchatel, Switzerland
    Author URL: https://ieeexplore.ieee.org/author/37086064963
    ID: 37086064963
    Order: 2
    Author Affiliations:
    • EPFL, Neuchatel, Switzerland
    • GlobalFoundries, Singapore
  • Author Name: Pouyan Keshavarzian
    Affiliation: School of Engineering, Ecole Polytechnique Federale de Lausanne (EPFL), Neuchatel, Switzerland
    Author URL: https://ieeexplore.ieee.org/author/37087240832
    ID: 37087240832
    Order: 3
    Author Affiliations:
    • School of Engineering, Ecole Polytechnique Federale de Lausanne (EPFL), Neuchatel, Switzerland
  • Author Name: Eng-Huat Toh
    Affiliation: GlobalFoundries Inc., Singapore
    Author URL: https://ieeexplore.ieee.org/author/37293849900
    ID: 37293849900
    Order: 4
    Author Affiliations:
    • GlobalFoundries Inc., Singapore
  • Author Name: Michelle Tng
    Affiliation: GlobalFoundries Inc., Singapore
    Author URL: https://ieeexplore.ieee.org/author/37088472552
    ID: 37088472552
    Order: 5
    Author Affiliations:
    • GlobalFoundries Inc., Singapore
  • Author Name: Louis Lim
    Affiliation: GlobalFoundries Inc., Singapore
    Author URL: https://ieeexplore.ieee.org/author/37089361068
    ID: 37089361068
    Order: 6
    Author Affiliations:
    • GlobalFoundries Inc., Singapore
  • Author Name: Vinit Dhulla
    Affiliation: GlobalFoundries Inc., Singapore
    Author URL: https://ieeexplore.ieee.org/author/37714054800
    ID: 37714054800
    Order: 7
    Author Affiliations:
    • GlobalFoundries Inc., Singapore
  • Author Name: Elgin Quek
    Affiliation: GlobalFoundries Inc., Singapore
    Author URL: https://ieeexplore.ieee.org/author/37377421400
    ID: 37377421400
    Order: 8
    Author Affiliations:
    • GlobalFoundries Inc., Singapore
  • Author Name: Myung-Jae Lee
    Affiliation: Post-Silicon Semiconductor Institute, Korea Institute of Science and Technology, Seoul, South Korea
    Author URL: https://ieeexplore.ieee.org/author/37598674000
    ID: 37598674000
    Order: 9
    Author Affiliations:
    • Post-Silicon Semiconductor Institute, Korea Institute of Science and Technology, Seoul, South Korea
  • Author Name: Edoardo Charbon
    Affiliation: School of Engineering, Ecole Polytechnique Federale de Lausanne (EPFL), Neuchatel, Switzerland
    Author URL: https://ieeexplore.ieee.org/author/37271353200
    ID: 37271353200
    Order: 10
    Author Affiliations:
    • School of Engineering, Ecole Polytechnique Federale de Lausanne (EPFL), Neuchatel, Switzerland

Image Sensor

• sensor_type: SPAD (Single-Photon Avalanche Diode)
• resolution: 6x6 pixels
• dynamic_range: Not specified
• pixel_size: 21 µm
• dark_current: Not specified

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

Applications & Benefits

• cell_imaging: Potential applications include NLOS (non-line-of-sight) imaging for medical diagnostics and robotics
• benefits: The design allows for practical implementation in dynamic NLOS imaging, eliminating the need for strict calibration.

Supporting Organizations

• supported_by: GlobalFoundries, Swiss National Science Foundation, European Union’s Horizon 2020 Research and Innovation Programme

Manuscript Details

• publication_date: Jan.-Feb. 2024

Relevancy Score

• score: 8
• missing_fields:
  • dynamic_range
  • dark_current
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed
  • power_consumption
  • noise

Processed JSON Filename

request_5cf68576-e508-48f1-b597-9b74d9c6a873-a_gradientgated_spad_array_for_nonlineofsight_imaging.json