A Generic Fast And Low Cost Bist Solution For Cmos Image Sensors

• doi: 10.1109/ETS54262.2022.9810458
• title: A Generic Fast and Low Cost BIST Solution for CMOS Image Sensors
• publisher: IEEE
• isbn: 978-1-6654-6707-0
• issn: 1530-1877
• rank: 728
• access_type: LOCKED
• content_type: Conferences
• abstract: This paper demonstrates the generalization of a novel test solution embedded inside CMOS Image Sensors (CIS) to classify PASS/FAIL sensors during the test production phase. In [1], a Built-In Self-Test (BIST) solution was proposed to reduce the test time of a CIS, which can represent up to 30% of the final product cost. The major part of the test is dedicated to optical (i.e. image processsing) algorithms performed on the output images from the sensor under test with an Automatic Test Equipment (ATE). The BIST solution reuses these optical algorithms by simplifying and embedding them inside the sensor, to avoid a large amount of data storage and to limit the optical test time. First results on 4,800 output images from a package of sensors have shown a 99.95% correlation between results gathered from an ATE and those achieved with the proposed BIST, with a saving of approximately 30% in optical test time and a negligible area footprint. In this paper, to verify the effectiveness of the BIST solution on a wider set of different CIS (i.e., architecture, size and technology), we experimented the solution on a new database of 28,000 output images from a package of different sensors compared to the first package used in [1]. The BIST parameters have been configured to fit with the new type of sensors and results show a 99.64% correlation, which demonstrates the possible systematic implementation of the proposed BIST solution inside all CIS irrespective of their architecture and technology.
• article_number: 9810458
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9810458
• html_url: https://ieeexplore.ieee.org/document/9810458/
• abstract_url: https://ieeexplore.ieee.org/document/9810458/
• publication_title: 2022 IEEE European Test Symposium (ETS)
• conference_location: Barcelona, Spain
• conference_dates: 23-27 May 2022
• publication_number: 9810327
• is_number: 9810358
• publication_year: 2022
• publication_date: 23-27 May 2022
• start_page: 1
• end_page: 2
• citing_paper_count: 1
• citing_patent_count: 0
• download_count: 318
• insert_date: 20220701
• index_terms:
  • ieee_terms:
    • Costs
    • Correlation
    • Systematics
    • Memory
    • Production
    • Built-in self-test
    • CMOS image sensors
  • author_terms:
    • CMOS image sensor
    • BIST
    • optical test
    • settings
  • dynamic_index_terms:
    • Built-in Self-test
    • Built-in Test
    • Output Image
    • Illumination Conditions
    • Image Processing Algorithms
    • Image-processing Algorithm
    • Pixel Array
    • Area Overhead
    • Area Overheads
    • Fault Categories
    • Defect Categories
    • Good Sensor
• isbn_formats:
  • format: Print on Demand(PoD) ISBN, value: 978-1-6654-6707-0, isbnType: New-2005
  • format: USB ISBN, value: 978-1-6654-6705-6, isbnType: New-2005
  • format: Electronic ISBN, value: 978-1-6654-6706-3, isbnType: New-2005
• authors:
  • Author Name: J. Lefevre
    Affiliation: STMicroelectronics Imaging Division, DFT, Grenoble, France
    Author URL: https://ieeexplore.ieee.org/author/37089158523
    ID: 37089158523
    Order: 1
    Author Affiliations:
    • STMicroelectronics Imaging Division, DFT, Grenoble, France
    • LIRMM University of Montpellier / CNRS, Montpellier, France
  • Author Name: P. Debaud
    Affiliation: STMicroelectronics Imaging Division, DFT, Grenoble, France
    Author URL: https://ieeexplore.ieee.org/author/38542956200
    ID: 38542956200
    Order: 2
    Author Affiliations:
    • STMicroelectronics Imaging Division, DFT, Grenoble, France
  • Author Name: P. Girard
    Affiliation: LIRMM University of Montpellier / CNRS, Montpellier, France
    Author URL: https://ieeexplore.ieee.org/author/37273565500
    ID: 37273565500
    Order: 3
    Author Affiliations:
    • LIRMM University of Montpellier / CNRS, Montpellier, France
  • Author Name: A. Virazel
    Affiliation: LIRMM University of Montpellier / CNRS, Montpellier, France
    Author URL: https://ieeexplore.ieee.org/author/37267181100
    ID: 37267181100
    Order: 4
    Author Affiliations:
    • LIRMM University of Montpellier / CNRS, Montpellier, France

Image Sensor

• sensor_type: CMOS
• resolution: Not specified
• dynamic_range: Not specified
• pixel_size: Not specified
• dark_current: Not specified

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

Applications & Benefits

• cell_imaging: Not specified
• benefits: Used in smartphones, autonomous cars, night vision systems.

Supporting Organizations

• supported_by: STMicroelectronics, LIRMM, University of Montpellier, CNRS

Manuscript Details

• publication_date: 23-27 May 2022

Relevancy Score

• score: 9
• missing_fields:
  • resolution
  • dynamic_range
  • pixel_size
  • dark_current
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed
  • power_consumption
  • noise

Processed JSON Filename

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