A Geiger Mode Apd Fabricated In Standard 65Nm Cmos Technology

• doi: 10.1109/IEDM.2013.6724705
• title: A Geiger mode APD fabricated in standard 65nm CMOS technology
• publisher: IEEE
• isbn: 978-1-4799-2306-9
• issn: 0163-1918
• rank: 726
• access_type: LOCKED
• content_type: Conferences
• abstract: We present the first avalanche photodiode (APD) successfully fabricated in standard 65nm CMOS technology. The APD operates both in proportional and Geiger mode at -60C to +60C temperature range. The device comprises an octagonal n+p-well junction surrounded by an n-tub guard-ring; its photon detection probability peaks at 450nm with 200mV excess bias and it is above 1% between 350 and 750nm. The dark count rate is 1.5kHz/μm2 at 200mV excess bias, while afterpulsing is less than 1% for a dead time longer than 5μs and timing jitter is better than 235ps. Applications include low-power, ultra-high-speed quantum number generators, time-of-flight 3D image sensors, LIDAR detectors, and time-resolved spectroscopy.
• article_number: 6724705
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6724705
• html_url: https://ieeexplore.ieee.org/document/6724705/
• abstract_url: https://ieeexplore.ieee.org/document/6724705/
• publication_title: 2013 IEEE International Electron Devices Meeting
• conference_location: Washington, DC, USA
• conference_dates: 9-11 Dec. 2013
• publication_number: 6709840
• is_number: 6724533
• publication_year: 2013
• publication_date: 9-11 Dec. 2013
• start_page: 27.5.1
• end_page: 27.5.4
• citing_paper_count: 24
• citing_patent_count: 0
• download_count: 1243
• insert_date: 20140130
• index_terms:
  • ieee_terms:
    • Temperature measurement
    • Voltage measurement
    • Electric breakdown
    • Standards
    • CMOS integrated circuits
    • CMOS technology
    • Photonics
  • dynamic_index_terms:
    • Standard Technology
    • CMOS Technology
    • Avalanche Photodiode
    • Standard CMOS
    • Geiger Mode
    • Standard 65-nm CMOS
    • Standard 65-nm CMOS Technology
    • Dead Time
    • Time-resolved Spectroscopy
    • Octagonal
    • Dark Count
    • Timing Jitter
    • Dark Count Rate
    • Logarithmic Scale
    • Log-scale
    • Photon Counting
    • Time-correlated Single-photon Counting
    • TCSPC
    • Single-photon Avalanche Diode
• isbn_formats:
  • format: Electronic ISBN, value: 978-1-4799-2306-9, isbnType: New-2005
• authors:
  • Author Name: Edoardo Charbon
    Affiliation: Delft University of Technology, Delft, the Netherlands
    Author URL: https://ieeexplore.ieee.org/author/37271353200
    ID: 37271353200
    Order: 1
    Author Affiliations:
    • Delft University of Technology, Delft, the Netherlands
  • Author Name: Hyung-June Yoon
    Affiliation: EPFL, Lausanne, Switzerland
    Author URL: https://ieeexplore.ieee.org/author/37086725293
    ID: 37086725293
    Order: 2
    Author Affiliations:
    • EPFL, Lausanne, Switzerland
  • Author Name: Yuki Maruyama
    Affiliation: Delft University of Technology, Delft, the Netherlands
    Author URL: https://ieeexplore.ieee.org/author/37672443200
    ID: 37672443200
    Order: 3
    Author Affiliations:
    • Delft University of Technology, Delft, the Netherlands

Image Sensor

• sensor_type: CMOS
• resolution: undefined
• dynamic_range: undefined
• pixel_size: 8x8 µm²
• dark_current: 2-20 pA

Optical Data

• focal_length: undefined
• aperture: undefined
• field_of_view: undefined
• distortion: undefined

Performance Metrics

• frame_rate: undefined
• signal_to_noise_ratio: undefined
• sensitivity: undefined
• shutter_speed: undefined
• power_consumption: undefined
• noise: undefined

Applications & Benefits

• cell_imaging: Applications include time-resolved spectroscopy, LIDAR, and embedded security.
• benefits: Single-photon sensitivity and time-of-arrival detection are critical.

Supporting Organizations

• supported_by: Swiss National Science Foundation, European Commission

Manuscript Details

• publication_date: 9-11 Dec. 2013

Relevancy Score

• score: 8
• missing_fields:
  • resolution
  • dynamic_range
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed
  • power_consumption
  • noise

Processed JSON Filename

request_371ae1b9-9465-48aa-a9b8-09803508663a-a_geiger_mode_apd_fabricated_in_standard_65nm_cmos_technology.json