A Digitallycalibrated 2Stage Cyclic Adc For A 33Mpixel 120Fps Super Highvision Cmos Image Sensor

• doi: 10.1109/ICSENS.2014.6984934
• title: A digitally-calibrated 2-stage cyclic ADC for a 33-Mpixel 120-fps Super High-Vision CMOS image sensor
• publisher: IEEE
• isbn: 978-1-4799-0162-3
• issn: 1930-0395
• rank: 1047
• access_type: LOCKED
• content_type: Conferences
• abstract: The effectiveness of a proposed digital calibration technique for a 2-stage single-ended cyclic ADC suitable for a 33-Mpixel 120-fps Super High-Vision (SHV) CMOS image sensor is demonstrated by implementing an experimental chip. A calibration algorithm improves the nonlinearity of the ADC by correcting errors generated in the ADC due to capacitor mismatch, finite gain error, incomplete settling error, reference voltage error, and offset error. The measured output of the ADC designed and fabricated as an experimental chip was digitally calibrated by using the algorithm. The DNL was improved to +0.20/-0.27 LSB from +0.22/-0.83 LSB and the INL was improved to +5.8/-5.4 LSB from +8.4/-6.0 LSB. In addition to the improvement of the output characteristics, the calibration results confirm that the power consumption and layout area of the ADC can be designed smaller than those determined by the ADC resolution.
• article_number: 6984934
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6984934
• html_url: https://ieeexplore.ieee.org/document/6984934/
• abstract_url: https://ieeexplore.ieee.org/document/6984934/
• publication_title: SENSORS, 2014 IEEE
• conference_location: Valencia, Spain
• conference_dates: 2-5 Nov. 2014
• publication_number: 6971895
• is_number: 6984913
• publication_year: 2014
• publication_date: 2-5 Nov. 2014
• start_page: 66
• end_page: 69
• citing_paper_count: 9
• citing_patent_count: 0
• download_count: 762
• insert_date: 20141215
• index_terms:
  • ieee_terms:
    • Calibration
    • Capacitors
    • CMOS image sensors
    • Capacitance
    • Power demand
    • Algorithm design and analysis
  • author_terms:
    • Digital calibration
    • Cyclic ADC
    • Super Hi-Vision
    • 33-Mpixel
    • 120-fps
    • CMOS image sensor
  • dynamic_index_terms:
    • Image Sensor
    • Camera Sensor
    • Power Consumption
    • Offset Error
    • Numerical Simulations
    • Numerical Model
    • Code Number
    • Coefficient Error
    • Capacity Of Samples
    • Charge Injection
    • Digital Code
    • Digital Algorithm
    • Amplification Phase
    • Amplifier Output
    • Feedback Phase
    • Mismatch Error
    • Output Code
    • 12-bit Resolution
    • Switching Transistors
• isbn_formats:
  • format: Electronic ISBN, value: 978-1-4799-0162-3, isbnType: New-2005
• authors:
  • Author Name: T. Watabe
    Affiliation: Research Institute of'Electronics, Shizuoka University, Hamamatsu, Japan
    Author URL: https://ieeexplore.ieee.org/author/37283667400
    ID: 37283667400
    Order: 1
    Author Affiliations:
    • Research Institute of'Electronics, Shizuoka University, Hamamatsu, Japan
    • NHK Engineering System Inc., Tokyo, Japan
  • Author Name: K. Kitamura
    Affiliation: Research Institute of'Electronics, Shizuoka University, Hamamatsu, Japan
    Author URL: https://ieeexplore.ieee.org/author/38238243500
    ID: 38238243500
    Order: 2
    Author Affiliations:
    • Research Institute of'Electronics, Shizuoka University, Hamamatsu, Japan
    • NHK Science & Technology Research Laboratories, Tokyo, Japan
  • Author Name: T. Hayashida
    Affiliation: NHK Science & Technology Research Laboratories, Tokyo, Japan
    Author URL: https://ieeexplore.ieee.org/author/37085448284
    ID: 37085448284
    Order: 3
    Author Affiliations:
    • NHK Science & Technology Research Laboratories, Tokyo, Japan
  • Author Name: T. Kosugi
    Affiliation: Brookman Technology, Inc., Hamamatsu, Japan
    Author URL: https://ieeexplore.ieee.org/author/38236166000
    ID: 38236166000
    Order: 4
    Author Affiliations:
    • Brookman Technology, Inc., Hamamatsu, Japan
  • Author Name: H. Ohtake
    Affiliation: NHK Science & Technology Research Laboratories, Tokyo, Japan
    Author URL: https://ieeexplore.ieee.org/author/37331518200
    ID: 37331518200
    Order: 5
    Author Affiliations:
    • NHK Science & Technology Research Laboratories, Tokyo, Japan
  • Author Name: H. Shimamoto
    Affiliation: NHK Science & Technology Research Laboratories, Tokyo, Japan
    Author URL: https://ieeexplore.ieee.org/author/38031226700
    ID: 38031226700
    Order: 6
    Author Affiliations:
    • NHK Science & Technology Research Laboratories, Tokyo, Japan
  • Author Name: S. Kawahito
    Affiliation: Brookman Technology, Inc., Hamamatsu, Japan
    Author URL: https://ieeexplore.ieee.org/author/37300195700
    ID: 37300195700
    Order: 7
    Author Affiliations:
    • Brookman Technology, Inc., Hamamatsu, Japan
    • Research Institute of'Electronics, Shizuoka University, Hamamatsu, Japan

Image Sensor

• sensor_type: CMOS
• resolution: 33-Mpixel
• dynamic_range: Not specified
• pixel_size: Not specified
• dark_current: Not specified

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

• frame_rate: 120 fps
• power_consumption: 63 μW for DESIGN_2, 96 μW for DESIGN_1

Applications & Benefits

• cell_imaging: Not specified
• benefits: Improved output characteristics and reduced power consumption.

Supporting Organizations

• supported_by: NHK Engineering System, Inc., NHK Science & Technology Research Laboratories, Research Institute of Electronics, Shizuoka University, Brookman Technology, Inc.

Manuscript Details

• publication_date: 2-5 Nov. 2014

Relevancy Score

• score: 9
• missing_fields:
  • fill factor
  • quantum efficiency
  • readout speed
  • noise sources

Processed JSON Filename

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