A Digital Monolithic Active Pixel Sensor Chip In A Quadruplewell Cis Process For Tracking Applications

• doi: 10.1109/TNS.2013.2280794
• title: A Digital Monolithic Active Pixel Sensor Chip in a Quadruple-Well CIS Process for Tracking Applications
• publisher: IEEE
• isbn:
• issn: 1558-1578
• rank: 691
• access_type: LOCKED
• content_type: Journals
• abstract: A CMOS sensor chip for charged particle detection has been developed and submitted for fabrication in a 0.18 μm Quadruple-Well (N&P-Wells, Deep N&P-Wells) CMOS Image Sensor (CIS) process. Improvement of the radiation hardness, the power dissipation and the readout speed of the mainstream CMOS sensors is expected with the exploration of this process. In order to ensure better charge collection and neutron tolerance, wafers with high-resistivity epitaxial layer have been chosen. In this paper a digital CMOS sensor prototype developed in order to validate the key analog blocks (from sensing element to 1-bit digital conversion) of a binary Monolithic Active Pixel Sensor (MAPS) in this process will be presented. The digital sensor prototype comprises four different sub-arrays of 20 μm pitch 64 × 32 pixels, 128 column-level auto-zeroed discriminators, a sequencer and an output digital multiplexer. Laboratory tests results including the charge-to-voltage conversion factor, the charge collection efficiency, the temporal noise and the fixed-pattern noise are presented in details. Some irradiation results will also be given.
• article_number: 6616655
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6616655
• html_url: https://ieeexplore.ieee.org/document/6616655/
• abstract_url: https://ieeexplore.ieee.org/document/6616655/
• publication_title: IEEE Transactions on Nuclear Science
• conference_location:
• conference_dates:
• publication_number: 23
• is_number: 6626362
• publication_year: 2013
• publication_date: Oct. 2013
• start_page: 3899
• end_page: 3906
• citing_paper_count: 9
• citing_patent_count: 0
• download_count: 421
• insert_date: 20131001
• index_terms:
  • ieee_terms:
    • Noise
    • Latches
    • CMOS integrated circuits
    • MOSFET
    • Switches
    • Power dissipation
    • Capacitors
  • author_terms:
    • Active pixel sensors
    • CMOS image sensors
    • CMOS integrated circuits
    • position sensitive particle detectors
  • dynamic_index_terms:
    • Digital Sensor
    • Digital Chip
    • Active Pixel Sensor
    • CMOS Image Sensor Process
    • Charged Particles
    • Image Sensor
    • Camera Sensor
    • Charge Collection
    • Epitaxial Layer
    • Epilayer
    • Key Block
    • Radiation Tolerance
    • Radiation Hardness
    • Charge Collection Efficiency
    • Temporal Noise
    • Feedback Loop
    • Dynamic Range
    • Circuitry
    • White Noise
    • Deeper Layers
    • Tracking System
    • Tracking Devices
    • Voltage Drop
    • Potential Drop
    • IR Drop
    • Threshold Voltage
    • Gain Stage
    • Large Sensor
    • Rolling Shutter
    • DC Gain
    • Non-ionizing
    • Non-ionizing Radiation
    • Test Vehicle
    • CMOS Process
    • Physical Experiments
• authors:
  • Author Name: Y. Değerli
    Affiliation: IRFU, SEDI, CEA Saclay, France
    Author URL: https://ieeexplore.ieee.org/author/38348452900
    ID: 38348452900
    Order: 1
    Author Affiliations:
    • IRFU, SEDI, CEA Saclay, France
  • Author Name: G. Bertolone
    Affiliation: IPHC, IN2P3, ULP, Strasbourg, France
    Author URL: https://ieeexplore.ieee.org/author/37398343400
    ID: 37398343400
    Order: 2
    Author Affiliations:
    • IPHC, IN2P3, ULP, Strasbourg, France
  • Author Name: G. Claus
    Affiliation: IPHC, IN2P3, ULP, Strasbourg, France
    Author URL: https://ieeexplore.ieee.org/author/37277293000
    ID: 37277293000
    Order: 3
    Author Affiliations:
    • IPHC, IN2P3, ULP, Strasbourg, France
  • Author Name: A. Dorokhov
    Affiliation: IPHC, IN2P3, ULP, Strasbourg, France
    Author URL: https://ieeexplore.ieee.org/author/37268868500
    ID: 37268868500
    Order: 4
    Author Affiliations:
    • IPHC, IN2P3, ULP, Strasbourg, France
  • Author Name: W. Dulinski
    Affiliation: IPHC, IN2P3, ULP, Strasbourg, France
    Author URL: https://ieeexplore.ieee.org/author/37277323400
    ID: 37277323400
    Order: 5
    Author Affiliations:
    • IPHC, IN2P3, ULP, Strasbourg, France
  • Author Name: M. Goffe
    Affiliation: IPHC, IN2P3, ULP, Strasbourg, France
    Author URL: https://ieeexplore.ieee.org/author/37398000700
    ID: 37398000700
    Order: 6
    Author Affiliations:
    • IPHC, IN2P3, ULP, Strasbourg, France
  • Author Name: F. Guilloux
    Affiliation: IRFU, SEDI, CEA Saclay, France
    Author URL: https://ieeexplore.ieee.org/author/37398000600
    ID: 37398000600
    Order: 7
    Author Affiliations:
    • IRFU, SEDI, CEA Saclay, France
  • Author Name: Ch. Hu-Guo
    Affiliation: IPHC, IN2P3, ULP, Strasbourg, France
    Author URL: https://ieeexplore.ieee.org/author/38271523900
    ID: 38271523900
    Order: 8
    Author Affiliations:
    • IPHC, IN2P3, ULP, Strasbourg, France
  • Author Name: K. Jaaskelainen
    Affiliation: IPHC, IN2P3, ULP, Strasbourg, France
    Author URL: https://ieeexplore.ieee.org/author/37390969000
    ID: 37390969000
    Order: 9
    Author Affiliations:
    • IPHC, IN2P3, ULP, Strasbourg, France
  • Author Name: F. Morel
    Affiliation: IPHC, IN2P3, ULP, Strasbourg, France
    Author URL: https://ieeexplore.ieee.org/author/37407726900
    ID: 37407726900
    Order: 10
    Author Affiliations:
    • IPHC, IN2P3, ULP, Strasbourg, France
  • Author Name: F. Orsini
    Affiliation: IRFU, SEDI, CEA Saclay, France
    Author URL: https://ieeexplore.ieee.org/author/37268540800
    ID: 37268540800
    Order: 11
    Author Affiliations:
    • IRFU, SEDI, CEA Saclay, France
  • Author Name: M. Specht
    Affiliation: IPHC, IN2P3, ULP, Strasbourg, France
    Author URL: https://ieeexplore.ieee.org/author/38277703000
    ID: 38277703000
    Order: 12
    Author Affiliations:
    • IPHC, IN2P3, ULP, Strasbourg, France
  • Author Name: M. Winter
    Affiliation: IPHC, IN2P3, ULP, Strasbourg, France
    Author URL: https://ieeexplore.ieee.org/author/37277330700
    ID: 37277330700
    Order: 13
    Author Affiliations:
    • IPHC, IN2P3, ULP, Strasbourg, France

Image Sensor

• sensor_type: CMOS Image Sensor
• resolution: 20 m pitch 64x32 pixels
• dynamic_range: limited in the new process
• pixel_size: 20 µm
• dark_current: not specified in the document

Optical Data

• focal_length: not specified in the document
• aperture: not specified in the document
• field_of_view: not specified in the document
• distortion: not specified in the document

Performance Metrics

• frame_rate: not directly specified, but mentions 200 ns/frame timing
• signal_to_noise_ratio: better than 20
• sensitivity: not specified in the document
• shutter_speed: not specified in the document
• power_consumption: about 100 µW/pixel
• noise: input referred r.m.s. temporal noise 28 e- (@200ns/frame, 20 °C)

Applications & Benefits

• cell_imaging: not specified but suitable for charged particle detection and tracking applications
• benefits: Improved radiation hardness, reduced power dissipation, continuous auto-zeroing for better matching and noise suppression.

Supporting Organizations

• supported_by: CEA Saclay, IRFU/SEDI, IPHC, IN2P3/ULP, Tower-Jazz

Manuscript Details

• publication_date: Oct. 2013

Relevancy Score

• score: 10

Processed JSON Filename

request_02044fe3-41a2-409c-8a16-60e47277be11-a_digital_monolithic_active_pixel_sensor_chip_in_a_quadruplewell_cis_process_for_tracking_applications.json